Patents by Inventor Yukari Mihara

Yukari Mihara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240164998
    Abstract: Provided is a fragrance composition for reducing discomfort due to malodor. The fragrance composition includes at least one selected from the group consisting of fragrance components in the following group A.
    Type: Application
    Filed: November 21, 2023
    Publication date: May 23, 2024
    Applicant: TAKASAGO INTERNATIONAL CORPORATION
    Inventors: Hisashi MIHARA, Takahiro KASHIWAGI, Yukari KUWAHARA
  • Patent number: 5968498
    Abstract: The freshness of meat, vegetables and fruits in a refrigerator or food storage box can be retained for a long period of time by using (1) a freshness retaining gel composition which comprises a freshness retainer component comprising an isothiocyanic acid compound and an aliphatic carboxylic acid or (2) a freshness retaining gel composition which comprises a freshness retainer component comprising an isothiocyanic acid compound, a nonionic surfactant or a fatty acid ester, and a gelling agent.
    Type: Grant
    Filed: January 28, 1998
    Date of Patent: October 19, 1999
    Inventors: Toru Okada, Kenji Kuranari, Yukari Mihara
  • Patent number: 5447598
    Abstract: A process for forming a resist mask pattern includes the steps of forming a resist layer of organic material in a multilevel resist process on a layer to be etched, and selectively etching a planarizing lower layer used in the resist layer by using an etching gas of oxygen under a plasma condition, in which a compound gas of at least one element selected from the group consisting of B, Si, Ti, Al, Mo, W and S is added to the etching gas. For example, the compound gas comprises BCl.sub.3, BH.sub.3, TiCl.sub.4, S.sub.2 Cl.sub.2, SiCl.sub.4 or the like. During the etching, a compound oxide, e.g., B.sub.2 O.sub.3, SiO.sub.2 or the like, is deposited on sidewalls of the lower layer to form a protective layer which prevents undercutting.
    Type: Grant
    Filed: August 19, 1993
    Date of Patent: September 5, 1995
    Assignee: Fujitsu Limited
    Inventors: Satoru Mihara, Kouji Nozaki, Yukari Mihara
  • Patent number: 5068169
    Abstract: Disclosed is a process for the production of a semiconductor device, which comprises forming a film of a resist composed of a substance generating an acid catalyst by being irradiated with radiation and a polymer having an Si-containing group that can be eliminated by the acid catalyst, irradiating the resist film with radiations and patterning the irradiated resist film by oxygen reactive ion etching, ECR etching or reactive ion beam etching. This process is advantageously used for preparing a semiconductor device by the two-layer resist method.
    Type: Grant
    Filed: October 26, 1989
    Date of Patent: November 26, 1991
    Assignee: Fujitsu Limited
    Inventors: Satoshi Takechi, Yuko Nakamura, Yukari Mihara