Patents by Inventor Yuki Ishigure
Yuki Ishigure has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11662706Abstract: A life expectancy prediction system for a target tool includes a processing machine body, a detector to detect a state data, a learned model storage unit to store learned models generated by executing machine learning using training datasets, including an explanatory variable and an objective variable, the explanatory variable being the state data and the objective variable being a number of first remaining machining times, the learned model storage unit being to store the learned models, each for each of the tools and a remaining machining times prediction unit to select, based on the state data, one learned model and predict a number of second remaining machining times, using the one learned model and the state data.Type: GrantFiled: October 20, 2020Date of Patent: May 30, 2023Assignee: JTEKT CORPORATIONInventors: Natsuki Yabune, Toshihiro Yonezu, Koichi Kato, Yuki Ishigure
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Patent number: 11400556Abstract: An abnormality detection apparatus for working tools configured to be used in a machining process performed by a machine tool, the abnormality detection apparatus includes a storage portion which previously stores correlations between features of a plurality of operating portions relation to the machining process performed by the machine tool, and a tool condition of each of a plurality of working tool types, and a tool condition determining portion which determines the tool condition of the working tools based on the correlations.Type: GrantFiled: June 4, 2020Date of Patent: August 2, 2022Assignee: JTEKT CORPORATIONInventors: Shuntaro Takasu, Yuki Ishigure, Hisashi Otani, Toshihiro Yonezu
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Patent number: 11300949Abstract: To provide a data processing device of production equipment that can generate data usable by an operator or an administrator by performing processing for a collected plurality of types of data. A data processing device includes a reference-data acquiring unit configured to acquire, in production equipment, reference data including information concerning time in which a reference for grouping of data operates, a target-data acquiring unit configured to acquire target data concerning a state of the production equipment detected by detectors provided in the production equipment, and a combined-data generating unit configured to generate, for each group of the reference data, combined data for each group obtained by combining, with the reference data, data detected in the same period of time as an operation period of time of the reference data in the target data.Type: GrantFiled: August 7, 2018Date of Patent: April 12, 2022Assignee: JTEKT CORPORATIONInventors: Tomohisa Kato, Akio Uchino, Toshihiko Yotsui, Yuki Ishigure, Asami Hara, Tatiana Kundozerova, Tatsuo Oshiumi
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Publication number: 20210132578Abstract: A life expectancy prediction system for a target tool includes a processing machine body, a detector to detect a state data, a learned model storage unit to store learned models generated by executing machine learning using training datasets, including an explanatory variable and an objective variable, the explanatory variable being the state data and the objective variable being a number of first remaining machining times, the learned model storage unit being to store the learned models, each for each of the tools and a remaining machining times prediction unit to select, based on the state data, one learned model and predict a number of second remaining machining times, using the one learned model and the state data.Type: ApplicationFiled: October 20, 2020Publication date: May 6, 2021Applicant: JTEKT CORPORATIONInventors: Natsuki YABUNE, Toshihiro YONEZU, Koichi KATO, Yuki ISHIGURE
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Publication number: 20200398398Abstract: An abnormality detection apparatus for working tools configured to be used in a machining process performed by a machine tool, the abnormality detection apparatus includes a storage portion which previously stores correlations between features of a plurality of operating portions relation to the machining process performed by the machine tool, and a tool condition of each of a plurality of working tool types, and a tool condition determining portion which determines the tool condition of the working tools based on the correlations.Type: ApplicationFiled: June 4, 2020Publication date: December 24, 2020Applicant: JTEKT CORPORATIONInventors: Shuntaro TAKASU, Yuki ISHIGURE, Hisashi OTANI, Toshihiro YONEZU
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Patent number: 10605701Abstract: An analysis system includes detectors provided in an apparatus, first analysis devices each configured to generate processed data by performing predetermined processing on detection information from each of the detectors, and to evaluate an object to be evaluated based on the detection information from each of the detectors and on an evaluation pattern, and a second analysis device configured to update the evaluation pattern based on the processed data generated by each of the first analysis devices.Type: GrantFiled: August 4, 2017Date of Patent: March 31, 2020Assignee: JTEKT CORPORATIONInventors: Toshiyuki Tsuzuki, Sakon Murayama, Yuki Ishigure
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Patent number: 10474128Abstract: A plurality of production facilities and an analysis apparatus are connected through a fog network. The analysis apparatus performs a data analysis based on detection information of detectors acquired through the fog network and stores determination information relating to an abnormality of each of the plurality of production facilities or an abnormality of a production object as a result of the data analysis. Each of the plurality of production facilities determines an abnormality of the each of the plurality of production facilities or an abnormality of the production object based on the determination information stored in the analysis apparatus.Type: GrantFiled: November 11, 2016Date of Patent: November 12, 2019Assignee: JTEKT CORPORATIONInventors: Toshiyuki Tsuzuki, Katsushi Kitamura, Koji Kito, Sakon Murayama, Yuki Ishigure
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Publication number: 20190049939Abstract: To provide a data processing device of production equipment that can generate data usable by an operator or an administrator by performing processing for a collected plurality of types of data. A data processing device includes a reference-data acquiring unit configured to acquire, in production equipment, reference data including information concerning time in which a reference for grouping of data operates, a target-data acquiring unit configured to acquire target data concerning a state of the production equipment detected by detectors provided in the production equipment, and a combined-data generating unit configured to generate, for each group of the reference data, combined data for each group obtained by combining, with the reference data, data detected in the same period of time as an operation period of time of the reference data in the target data.Type: ApplicationFiled: August 7, 2018Publication date: February 14, 2019Applicant: JTEKT CORPORATIONInventors: Tomohisa KATO, Akio Uchino, Toshihiko Yotsui, Yuki Ishigure, Asami Hara, Tatiana KUNDOZEROVA, Tatsuo Oshiumi
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Publication number: 20180045613Abstract: An analysis system includes detectors provided in an apparatus, first analysis devices each configured to generate processed data by performing predetermined processing on detection information from each of the detectors, and to evaluate an object to be evaluated based on the detection information from each of the detectors and on an evaluation pattern, and a second analysis device configured to update the evaluation pattern based on the processed data generated by each of the first analysis devices.Type: ApplicationFiled: August 4, 2017Publication date: February 15, 2018Applicant: JTEKT CORPORATIONInventors: Toshiyuki TSUZUKI, Sakon MURAYAMA, Yuki ISHIGURE
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Publication number: 20170139398Abstract: A plurality of production facilities and an analysis apparatus are connected through a fog network. The analysis apparatus performs a data analysis based on detection information of detectors acquired through the fog network and stores determination information relating to an abnormality of each of the plurality of production facilities or an abnormality of a production object as a result of the data analysis. Each of the plurality of production facilities determines an abnormality of the each of the plurality of production facilities or an abnormality of the production object based on the determination information stored in the analysis apparatus.Type: ApplicationFiled: November 11, 2016Publication date: May 18, 2017Applicant: JTEKT CORPORATIONInventors: Toshiyuki TSUZUKI, Katsushi Kitamura, Koji Kito, Sakon Murayama, Yuki Ishigure