Abstract: A dielectric ceramic composition comprising a compound expressed by a formula of ABO3, where “A” is Ba alone, or Ba and at least one selected from Ca and Sr, and “B” is Ti alone, or Ti and Zr, and having a perovskite-type crystal structure, and an oxide of a rare-earth element including Sc and Y. The dielectric ceramic composition includes a dielectric particle having a core-shell structure which has a core and a shell, the shell being present around the core and including at least “R” element, and in the shell, a region showing a maximum content rate of “R” element is a boundary region between the core and the shell.

Abstract: A dielectric ceramic composition comprising a compound expressed by a formula of ABO3, where “A” is Ba alone, or Ba and at least one selected from Ca and Sr, and “B” is Ti alone, or Ti and Zr, and having a perovskite-type crystal structure, and an oxide of a rare-earth element including Sc and Y. The dielectric ceramic composition includes a dielectric particle having a core-shell structure which has a core and a shell, the shell being present around the core and including at least “R” element, and in the shell, a region showing a maximum content rate of “R” element is a boundary region between the core and the shell.

Abstract: A multilayer ceramic capacitor having a high dielectric constant, a large capacitance and a high reliability can be obtained by controlling a value of residual stress in it.

Abstract: A method of producing a multilayer ceramic electronic device, having a firing step for firing a pre-firing element body wherein a plurality of dielectric layers and internal electrode layers containing a base metal are alternately arranged, characterized in that the firing step has a temperature raising step for raising a temperature to a firing temperature, and hydrogen is continued to be introduced from a point in time of the temperature raising step. According to the method, it is possible to provide a method of producing a multilayer ceramic electronic device, such as a multilayer ceramic capacitor, wherein shape anisotropy and other structural defaults are hard to occur and electric characteristics are improved while suppressing deterioration thereof even if dielectric layers becomes thinner and stacked more.

Abstract: The electronic device according to the present invention comprises capacitor element body 4 wherein internal electrode layer 12 and ceramic layer 10 is included. Internal electrode layer 12 includes Ni and at least one element from Re, Ru, and Ir. The ceramic layer 10 substantially doesn't include Re, Ru, Os, and Ir.

Abstract: A method of producing a multilayer ceramic capacitor having internal electrode layers and dielectric layers with dielectric particles is disclosed. An average particle diameter of the dielectric particles, when measured parallel with the direction of the internal electrode layers, is larger than a thickness of the dielectric layer. A ratio (R/d) between the average particle diameter (R) and the thickness (d) of the dielectric layer is 1<R/d<3.

Abstract: A method of producing a multilayer ceramic electronic device, having a firing step for firing a pre-firing element body wherein a plurality of dielectric layers and internal electrode layers containing a base metal are alternately arranged, characterized in that the firing step has a temperature raising step for raising a temperature to a firing temperature, and hydrogen is continued to be introduced from a point in time of the temperature raising step. According to the method, it is possible to provide a method of producing a multilayer ceramic electronic device, such as a multilayer ceramic capacitor, wherein shape anisotropy and other structural defaults are hard to occur and electric characteristics are improved while suppressing deterioration thereof even if dielectric layers becomes thinner and stacked more.

Abstract: A method of producing a multilayer ceramic electronic device, having a firing step for firing a pre-firing element body wherein a plurality of dielectric layers and internal electrode layers containing a base metal are alternately arranged, characterized in that the firing step has a temperature raising step for raising a temperature to a firing temperature, and hydrogen is continued to be introduced from a point in time of the temperature raising step. According to the method, it is possible to provide a method of producing a multilayer ceramic electronic device, such as a multilayer ceramic capacitor, wherein shape anisotropy and other structural defaults are hard to occur and electric characteristics are improved while suppressing deterioration thereof even if dielectric layers becomes thinner and stacked more.

Abstract: A multilayer ceramic capacitor having a high dielectric constant, a large capacitance and a high reliability can be obtained by controlling a value of residual stress in it.

Abstract: The invention aims to provide a multilayer ceramic capacitor with high dielectric constant, a high capacitance, and an excellent reliability by eliminating oxygen vacancy in dielectric layers and suppressing oxidation of Ni inner electrodes. The multilayer ceramic capacitor comprises a multilayered dielectric body composed by alternately piling up dielectric layers containing mainly barium titanate and inner electrode layers containing mainly Ni and a first hetero-phase containing Mg—Si—O as constituent elements exists in the capacitor.

Abstract: In order to provide dielectric ceramic composition having low IR defect rate and high relative dielectric constant even when the multilayer ceramic capacitor is made thinner, dielectric ceramic composition including a main component expressed by a composition formula {{Ba(1-x)Cax}O}A{Ti(1-y-z)ZryMgz}BO2 and subcomponents of Mn oxide, Y oxide, V oxide and Si oxide is provided. In the above formula, A, B, x, y and z are as follows: 0.995?A/B?1.020, 0.0001?x?0.07, preferably 0.001?x<0.05, 0.1?y?0.3 and 0.0005?z?0.01, preferably 0.003?z?0.01.

Abstract: The invention aims to provide a multilayer ceramic capacitor with high dielectric constant, a high capacitance, and an excellent reliability by eliminating oxygen vacancy in dielectric layers and suppressing oxidation of Ni inner electrodes. The multilayer ceramic capacitor comprises a multilayered dielectric body composed by alternately piling up dielectric layers containing mainly barium titanate and inner electrode layers containing mainly Ni and a first hetero-phase containing Mg—Si—O as constituent elements exists in the capacitor.

Abstract: In order to provide dielectric ceramic composition having low IR defect rate and high relative dielectric constant even when the multilayer ceramic capacitor is made thinner, dielectric ceramic composition including a main component expressed by a composition formula {{Ba(1-x)Cax}O}A{Ti(1-y-z)ZryMgz}BO2 and subcomponents of Mn oxide, Y oxide, V oxide and Si oxide is provided. In the above formula, A, B, x , y and z are as follows: 0.995?A/B?1.020, 0.0001?x?0.07, preferably 0.001?x?0.05, 0.1?y?0.3 and 0.0005?z?0.0 1, preferably 0.003?z?0.0 1.

Abstract: A dielectric ceramic composition, comprising a main component including barium titanate, a fourth subcomponent including an oxide of R1 (note that R1 is at least one kind selected from a first element group composed of rare-earth elements having a effective ionic radius of less than 108 pm when having a coordination number of nine), and a fifth subcomponent including an oxide of R2 (note that R2 is at least one kind selected from a second element group composed of rare-earth elements having a effective ionic radius of 108 pm to 113 pm when having a coordination number of nine). According to the composition, a dielectric ceramic composition having excellent reducing resisting property at firing, excellent temperature dependence of capacitance after firing, and improved accelerated lifetime of insulation resistance can be provided.

Abstract: A multilayer ceramic capacitor having internal electrode layers and dielectric layers with dielectric particles is disclosed. An average particle diameter of the dielectric particles, when measured parallel with the direction of the internal electrode layers, is larger than a thickness of the dielectric layer. A ratio (R/d) between the average particle diameter (R) and the thickness (d) of the dielectric layer is 1<R/d<3.

Abstract: A composite substrate in which the surface of the insulating layer is not influenced by the electrode layer and which requires neither a grinding process nor a sol-gel process, is easy to produce and can provide a thin-film EL device having a high display quality when used therein; a thin-film EL device using the substrate; and a production process for the device. The thin-film EL device is produced by forming a luminescent layer, other insulating layer and other electrode layer successively on a composite substrate comprising a substrate; an electrode layer embedded in the substrate in such a manner that the electrode layer and the substrate are in one plane; and an insulating layer formed on the surface of a composite comprising the substrate and the electrode layer.

Abstract: A dielectric ceramic composition, comprising a main component including barium titanate, a fourth subcomponent including an oxide of R1 (note that R1 is at least one kind selected from a first element group composed of rare-earth elements having a effective ionic radius of less than 108 pm when having a coordination number of nine), and a fifth subcomponent including an oxide of R2 (note that R2 is at least one kind selected from a second element group composed of rare-earth elements having a effective ionic radius of 108 pm to 113 pm when having a coordination number of nine). According to the composition, a dielectric ceramic composition having excellent reducing resisting property at firing, excellent temperature dependence of capacitance after firing, and improved accelerated lifetime of insulation resistance can be provided.

Abstract: A method of production of a multilayer ceramic chip capacitor having a capacitor body configured by alternately stacked dielectric layers and internal electrode layers, having using as a powder ingredient of barium titanate for forming the dielectric layers a powder ingredient having a ratio (I(200)/Ib) of a peak intensity (I(200)) of a diffraction line of a (200) plane with respect to an intensity (Ib) at an intermediate point between an angle of a peak point of diffraction line of a (002) plane and an angle of a peak point of diffraction line of a (200) plane in an X-ray diffraction chart of 4 to 16.

Abstract: A method of producing a multilayer ceramic electronic device, having a firing step for firing a pre-firing element body wherein a plurality of dielectric layers and internal electrode layers containing a base metal are alternately arranged, characterized in that the firing step has a temperature raising step for raising a temperature to a firing temperature, and hydrogen is continued to be introduced from a point in time of the temperature raising step. According to the method, it is possible to provide a method of producing a multilayer ceramic electronic device, such as a multilayer ceramic capacitor, wherein shape anisotropy and other structural defaults are hard to occur and electric characteristics are improved while suppressing deterioration thereof even if dielectric layers becomes thinner and stacked more.

Abstract: The invention provides a multilayer ceramic capacitor capable of preventing the occurrence of cracks by inhibiting the multilayer capacitor from expanding in a stacking direction and a width direction. The multilayer ceramic capacitor includes a capacitor element (10) in which dielectric layers (11a and 11b) and internal electrodes (12) are alternately stacked. The capacitor element (10) is obtained by stacking and firing a dielectric paste layer and an internal electrode paste layer. An expansion coefficient x in the stacking direction lies between −0.05i% and 0.05i% inclusive, where i denotes the number of dielectric layers (11a), preferably the expansion coefficient x is 0% or less, or more preferably the expansion coefficient x lies between −10% and 0% inclusive. Preferably, an expansion coefficient y in the width direction lies between −0.05i% and 0% inclusive.