Patents by Inventor Yukihiro Ayaki

Yukihiro Ayaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of erasing repeated patterns and pattern defect inspection device
    Patent number: 6909798
    Abstract: An image of a subject of inspection is picked up, and this image is demarcated into a plurality of areas. Density differences are found between reference pixels and a plurality of comparison pixels in the demarcated areas, and a density difference that is closest to 0 is determined as a specific density difference. The specific density difference is then applied to the reference density in the image of the subject, whereby repeated patterns in the image are erased.
    Type: Grant
    Filed: July 31, 2000
    Date of Patent: June 21, 2005
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Noriaki Yukawa, Hajime Kawano, Yukihiro Ayaki