Patents by Inventor Yukihiro Sakata

Yukihiro Sakata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8347697
    Abstract: A surface texture measuring device includes a threshold value storage module configured to store a threshold input through an operation key, a stylus move distance detector configured to detect a move distance in the trace direction of the stylus, a cumulative move distance storage module configured to cumulatively store the move distance of the stylus detected by the stylus move distance detector; and. a notification module (controller) configured to make a comparison between the threshold value stored in the threshold value storage module and the cumulative move distance stored in the cumulative move distance storage module and notifying a user of replacement of the stylus when the cumulative move distance has exceeded the threshold value.
    Type: Grant
    Filed: February 11, 2011
    Date of Patent: January 8, 2013
    Assignee: Mitutoyo Corporation
    Inventors: Yukihiro Sakata, Hiroomi Honda, Hiroyuki Hidaka
  • Publication number: 20110197665
    Abstract: A surface texture measuring device includes a threshold value storage module configured to store a threshold input through an operation key, a stylus move distance detector configured to detect a move distance in the trace direction of the stylus, a cumulative move distance storage module configured to cumulatively store the move distance of the stylus detected by the stylus move distance detector; and. a notification module (controller) configured to make a comparison between the threshold value stored in the threshold value storage module and the cumulative move distance stored in the cumulative move distance storage module and notifying a user of replacement of the stylus when the cumulative move distance has exceeded the threshold value.
    Type: Application
    Filed: February 11, 2011
    Publication date: August 18, 2011
    Applicant: MITUTOYO CORPORATION
    Inventors: Yukihiro Sakata, Hiroomi Honda, Hiroyuki Hidaka
  • Publication number: 20090058486
    Abstract: A master-slave circuit that includes a master circuit having input data stored therein, a storage unit for receiving the input data in response to receiving a sleep mode setting signal that sets a sleep mode, and for storing the input data, and a first control unit for interrupting the supply of a power supply voltage to the master circuit after the input data is stored in the storage unit.
    Type: Application
    Filed: August 18, 2008
    Publication date: March 5, 2009
    Applicant: FUJITSU LIMITED
    Inventors: Tadashi OZAWA, Masaki Komaki, Katsuhito Hashiba, Tatsuki Sahashi, Yukihiro Sakata, Hiroto Nishihata, Akihiro Miki
  • Patent number: 7277818
    Abstract: The invention provides an aspherical workpiece leveling method for leveling an aspherical workpiece mounted on a tilt correction table. The method includes three-dimensionally measuring a surface of the aspherical workpiece containing an extreme value; deriving a secondary curved surface from the obtained three-dimensionally measured values to obtain an extreme value of the secondary curved surface as a temporary extreme value; obtaining three-dimensionally measured values at three or more points from the surround about the obtained temporary extreme value; obtaining a plane defined by the obtained three-dimensionally measured values at three or more points; and adjusting the tilt correction table for leveling the obtained plane.
    Type: Grant
    Filed: March 6, 2006
    Date of Patent: October 2, 2007
    Assignee: Mitutoyo Corporation
    Inventors: Yukihiro Sakata, Fumihiro Takemura
  • Publication number: 20060196063
    Abstract: The invention provides an aspherical workpiece leveling method for leveling an aspherical workpiece mounted on a tilt correction table. The method comprises three-dimensionally measuring a surface of the aspherical workpiece containing an extreme value; deriving a secondary curved surface from the obtained three-dimensionally measured values to obtain an extreme value of the secondary curved surface as a temporary extreme value; obtaining three-dimensionally measured values at three or more points from the surround about the obtained temporary extreme value; obtaining a plane defined by the obtained three-dimensionally measured values at three or more points; and adjusting the tilt correction table for leveling the obtained plane.
    Type: Application
    Filed: March 6, 2006
    Publication date: September 7, 2006
    Applicant: MITUTOYO CORPORATION
    Inventors: Yukihiro Sakata, Fumihiro Takemura
  • Patent number: 6886264
    Abstract: A reference fixture (20) for a roundness measuring instrument performs acquisition of origin information of a roundness measuring instrument (1) including a workpiece rotary mechanism (3) on which a workpiece is set and a probe (14) provided with a stylus (14a) and also performs calibration of the probe (14). The reference fixture (20) includes a mount (21), a calibration master (22) provided on a top face of the mount (21) for calibrating the sensitivity of the probe (14), an origin ball (23) disposed above the calibration master (22) for providing the origin information of the roundness measuring instrument (1) by the stylus (14a) of the probe (14), and a holder (25) that holds the origin ball (23).
    Type: Grant
    Filed: April 7, 2004
    Date of Patent: May 3, 2005
    Assignee: Mitutoyo Corporation
    Inventors: Yukihiro Sakata, Yoshiyuki Oomori, Hideki Shindo, Kazushi Noguchi
  • Publication number: 20040200085
    Abstract: A reference fixture (20) for a roundness measuring instrument performs acquisition of origin information of a roundness measuring instrument (1) including a workpiece rotary mechanism (3) on which a workpiece is set and a probe (14) provided with a stylus (14a) and also performs calibration of the probe (14). The reference fixture (20) includes a mount (21), a calibration master (22) provided on a top face of the mount (21) for calibrating the sensitivity of the probe (14), an origin ball (23) disposed above the calibration master (22) for providing the origin information of the roundness measuring instrument (1) by the stylus (14a) of the probe (14), and a holder (25) that holds the origin ball (23).
    Type: Application
    Filed: April 7, 2004
    Publication date: October 14, 2004
    Applicant: MITUTOYO CORPORATION
    Inventors: Yukihiro Sakata, Yoshiyuki Oomori, Hideki Shindo, Kazushi Noguchi