Patents by Inventor Yukio Kawano

Yukio Kawano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12009106
    Abstract: Provided is a technique for efficiently predicting the number (quantity) of occurrences of emergency medical service requests in a target area.
    Type: Grant
    Filed: November 8, 2019
    Date of Patent: June 11, 2024
    Assignee: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
    Inventors: Sunyong Kim, Ippei Shake, Kazuaki Obana, Atsuhiko Maeda, Michiharu Takemoto, Yukio Kikuya, Hiroshi Sato, Tetsuo Kawano, Kenichi Fukuda
  • Patent number: 11118977
    Abstract: Provided are a terahertz wave detection device and a terahertz wave detection system to execute checking at high speed with high sensitivity and accuracy and to execute omnidirectional inspection without requiring a large checking system. A flexible array sensor (30) includes: a terahertz wave detection element (10) having a flexible single-walled carbon nanotube film (11), and a first electrode (12) and a second electrode (13) disposed to face each other on a two-dimensional plane of the single-walled carbon nanotube film (11); and a flexible substrate (20) having flexibility to support the terahertz wave detection element (10) so as to be freely curved. The flexible substrate (20) is preferably formed in a curved or cylindrical shape, so that the terahertz wave detection elements (10) are arrayed on the flexible substrate 20 formed in a curved or cylindrical shape.
    Type: Grant
    Filed: May 9, 2018
    Date of Patent: September 14, 2021
    Assignee: Tokyo Institute of Technology
    Inventors: Yukio Kawano, Daichi Suzuki
  • Patent number: 10969335
    Abstract: A terahertz wave detection device includes a low-dimensional electron system material formed on a substrate; and a first electrode and a second electrode opposingly arranged on a two-dimensional plane of the low-dimensional electron system material. The first electrode and the second electrode are made of metals having different thermal conductivity. An 8-element array sensor includes eight terahertz wave detection devices aligned in an array. The terahertz wave detection device includes carbon nanotube film; a first electrode disposed on one side of the carbon nanotube film; and a second electrode disposed on the other side of the carbon nanotube film. The first electrode and the second electrode have different thermal conductivity.
    Type: Grant
    Filed: April 28, 2017
    Date of Patent: April 6, 2021
    Assignee: Tokyo Institute of Technology
    Inventors: Yukio Kawano, Daichi Suzuki
  • Publication number: 20210010932
    Abstract: A terahertz wave detection device includes a low-dimensional electron system material formed on a substrate; and a first electrode and a second electrode opposingly arranged on a two-dimensional plane of the low-dimensional electron system material. The first electrode and the second electrode are made of metals having different thermal conductivity. An 8-element array sensor includes eight terahertz wave detection devices aligned in an array. The terahertz wave detection device includes carbon nanotube film; a first electrode disposed on one side of the carbon nanotube film; and a second electrode disposed on the other side of the carbon nanotube film. The first electrode and the second electrode have different thermal conductivity.
    Type: Application
    Filed: April 28, 2017
    Publication date: January 14, 2021
    Inventors: Yukio KAWANO, Daichi SUZUKI
  • Publication number: 20200141806
    Abstract: Provided are a terahertz wave detection device and a terahertz wave detection system to execute checking at high speed with high sensitivity and accuracy and to execute omnidirectional inspection without requiring a large checking system. A flexible array sensor (30) includes: a terahertz wave detection element (10) having a flexible single-walled carbon nanotube film (11), and a first electrode (12) and a second electrode (13) disposed to face each other on a two-dimensional plane of the single-walled carbon nanotube film (11); and a flexible substrate (20) having flexibility to support the terahertz wave detection element (10) so as to be freely curved. The flexible substrate (20) is preferably formed in a curved or cylindrical shape, so that the terahertz wave detection elements (10) are arrayed on the flexible substrate 20 formed in a curved or cylindrical shape.
    Type: Application
    Filed: May 9, 2018
    Publication date: May 7, 2020
    Applicant: Tokyo Institute of Technology
    Inventors: Yukio KAWANO, Daichi SUZUKI
  • Patent number: 10436632
    Abstract: A terahertz image measurement device includes a terahertz detection sensor, a magnetic field generating unit, and a measurement control unit. The sensor detects near-field light of terahertz light emitted from a sample. The magnetic field generating unit has a coil disposed around the sample and the sensor, and wound to surround the optical axis of terahertz light irradiated on the sensor, and applies to the sensor a magnetic field generated by allowing an electric current to flow through the coil. The measurement control unit changes a value of the electric current flowing through the coil, sets a strength of the magnetic field to a magnetic field value for which a detection signal level of the terahertz light detected by the sensor increases prominently, and allows the magnetic field value to conform to a specific frequency of the terahertz light.
    Type: Grant
    Filed: December 14, 2016
    Date of Patent: October 8, 2019
    Assignee: TOKYO INSTITUTE OF TECHNOLOGY
    Inventor: Yukio Kawano
  • Publication number: 20180364094
    Abstract: A terahertz image measurement device includes a terahertz detection sensor, a magnetic field generating unit, and a measurement control unit. The sensor detects near-field light of terahertz light emitted from a sample. The magnetic field generating unit has a coil disposed around the sample and the sensor, and wound to surround the optical axis of terahertz light irradiated on the sensor, and applies to the sensor a magnetic field generated by allowing an electric current to flow through the coil. The measurement control unit changes a value of the electric current flowing through the coil, sets a strength of the magnetic field to a magnetic field value for which a detection signal level of the terahertz light detected by the sensor increases prominently, and allows the magnetic field value to conform to a specific frequency of the terahertz light.
    Type: Application
    Filed: December 14, 2016
    Publication date: December 20, 2018
    Applicant: TOKYO INSTITUTE OF TECHNOLOGY
    Inventor: Yukio KAWANO
  • Patent number: 8253104
    Abstract: A terahertz wave detecting apparatus includes a semiconductor chip 12 in which a 2-dimensional electron gas 13 is formed at a constant position from its surface, and a carbon nanotube 14, a conductive source electrode 15, a drain electrode 16 and a gate electrode 17 provided in close contact with the surface of the chip. The carbon nanotube 14 extends along the surface of the chip, where both ends of the tube are connected to the source electrode and the drain electrode of the chip, and the gate electrode 17 is spaced at a constant interval from the side surface of the carbon nanotube. Further, the apparatus includes a SD current detecting circuit 18 for applying a voltage between the source electrode and the drain electrode and for detecting SD current therebetween, a gate voltage applying circuit 19 for applying a variable gate voltage between the source electrode and the gate electrode, and a magnetic field generating device 20 for applying a variable magnetic field to the chip.
    Type: Grant
    Filed: September 1, 2009
    Date of Patent: August 28, 2012
    Assignee: Riken
    Inventors: Yukio Kawano, Koji Ishibashi
  • Patent number: 8148688
    Abstract: A near-field terahertz wave detector comprises a semiconductor chip (12) whose longitudinal electrical resistance along its surface changes due to a near-field wave of a terahertz wave (1), an insulating film (18) which covers the surface of the semiconductor chip, and a conductive film (20) able to shield the terahertz wave by covering the surface of the insulating film. The conductive film (20) has an aperture (21) whose maximum size is one digit or more smaller than the wavelength of the terahertz wave. Further, a planar conductive probe (14) is provided between the conductive film (20) and the semiconductor chip (12). The conductive probe (14) is insulated from the conductive film (20) by the insulating film (18), and a tip (14a) of the conductive probe (14) is located inside the aperture (21).
    Type: Grant
    Filed: January 9, 2009
    Date of Patent: April 3, 2012
    Assignee: Riken
    Inventors: Yukio Kawano, Koji Ishibashi
  • Patent number: 7947955
    Abstract: A terahertz wave detecting apparatus includes a semiconductor chip 12, a two-dimensional graphene 14, a conductive source electrode 15, and a drain electrode 16 and a gate electrode 17. The two-dimensional graphene 14 is connected to the source electrode and the drain electrode. The apparatus further includes a SD voltage detection circuit 18, a gate voltage applying circuit 19 and a magnetic field generating device 20.
    Type: Grant
    Filed: February 5, 2010
    Date of Patent: May 24, 2011
    Assignee: Riken
    Inventors: Yukio Kawano, Koji Ishibashi
  • Publication number: 20100200755
    Abstract: A terahertz wave detecting apparatus includes a semiconductor chip 12, a two-dimensional graphene 14, a conductive source electrode 15, and a drain electrode 16 and a gate electrode 17. The two-dimensional graphene 14 is connected to the source electrode and the drain electrode. The apparatus further includes a SD voltage detection circuit 18, a gate voltage applying circuit 19 and a magnetic field generating device 20.
    Type: Application
    Filed: February 5, 2010
    Publication date: August 12, 2010
    Applicant: RIKEN
    Inventors: Yukio KAWANO, Koji ISHIBASHI
  • Publication number: 20100051812
    Abstract: A terahertz wave detecting apparatus includes a semiconductor chip 12 in which a 2-dimensional electron gas 13 is formed at a constant position from its surface, and a carbon nanotube 14, a conductive source electrode 15, a drain electrode 16 and a gate electrode 17 provided in close contact with the surface of the chip. The carbon nanotube 14 extends along the surface of the chip, where both ends of the tube are connected to the source electrode and the drain electrode of the chip, and the gate electrode 17 is spaced at a constant interval from the side surface of the carbon nanotube. Further, the apparatus includes a SD current detecting circuit 18 for applying a voltage between the source electrode and the drain electrode and for detecting SD current therebetween, a gate voltage applying circuit 19 for applying a variable gate voltage between the source electrode and the gate electrode, and a magnetic field generating device 20 for applying a variable magnetic field to the chip.
    Type: Application
    Filed: September 1, 2009
    Publication date: March 4, 2010
    Applicant: RIKEN
    Inventors: Yukio Kawano, Koji Ishibashi
  • Publication number: 20100006892
    Abstract: A near-field terahertz wave detector comprises a semiconductor chip (12) whose longitudinal electrical resistance along its surface changes due to a near-field wave of a terahertz wave (1), an insulating film (18) which covers the surface of the semiconductor chip, and a conductive film (20) able to shield the terahertz wave by covering the surface of the insulating film. The conductive film (20) has an aperture (21) whose maximum size is one digit or more smaller than the wavelength of the terahertz wave. Further, a planar conductive probe (14) is provided between the conductive film (20) and the semiconductor chip (12). The conductive probe (14) is insulated from the conductive film (20) by the insulating film (18), and a tip (14a) of the conductive probe (14) is located inside the aperture (21).
    Type: Application
    Filed: January 9, 2009
    Publication date: January 14, 2010
    Applicant: RIKEN
    Inventors: Yukio Kawano, Koji Ishibashi