Abstract: A power management apparatus, includes an artificial intelligence (AI) controller configured to monitor a user pattern, based on frequency band selection information of all users using a base station, to predict the user pattern, and a DC-DC converter configured to output a supply voltage based on the predicted user pattern.

Abstract: A capacitor component includes a body, including a dielectric layer and an internal electrode layer, and an external electrode disposed on the body and connected to the internal electrode layer. At least one hole is formed in the internal electrode layer, and a region, containing at least one selected from the group consisting of indium (In) and tin (Sn), is disposed in the hole. A method of manufacturing a capacitor component includes forming a dielectric green sheet, forming a conductive thin film, including a first conductive material and a second conductive material, on the dielectric green sheet, and sintering the conductive thin film to form an internal electrode layer. The internal electrode layer includes the first conductive material, and a region, including the second conductive material, is formed in the internal electrode layer.

Abstract: An image sensor includes a pixel configured to generate a pixel signal, using an analog signal processing voltage, a ramp signal generator configured to generate a ramp signal, using the analog signal processing voltage, a bias voltage generator configured to generate a bias voltage, using the analog signal processing voltage, and a noise compensator configured to generate a noise component, using a digital signal processing voltage and the analog signal processing voltage, and add the generated noise component to the generated bias voltage. The image sensor further includes a conversion circuit configured to generate a reference voltage, based on the generated ramp signal and the bias voltage to which the noise component is added, and generate an image signal by performing analog-to-digital conversion on the generated pixel signal, based on the generated reference voltage.

Abstract: An image sensor includes a pixel configured to generate a pixel signal, using an analog signal processing voltage, a ramp signal generator configured to generate a ramp signal, using the analog signal processing voltage, a bias voltage generator configured to generate a bias voltage, using the analog signal processing voltage, and a noise compensator configured to generate a noise component, using a digital signal processing voltage and the analog signal processing voltage, and add the generated noise component to the generated bias voltage. The image sensor further includes a conversion circuit configured to generate a reference voltage, based on the generated ramp signal and the bias voltage to which the noise component is added, and generate an image signal by performing analog-to-digital conversion on the generated pixel signal, based on the generated reference voltage.

Abstract: An image sensor includes a pixel array, an analog-to-digital converter (ADC), and a test circuit. The pixel array includes a plurality of pixels arranged in rows and columns. Each pixel generates an analog signal based on incident light. The ADC converts the analog signal to a digital signal using a counter. The test circuit receives a test code in a test mode, generates a count clock signal based on the test code, tests a counting operation of the counter according to the count clock signal, and externally outputs a test result of the counter through a test terminal.

Abstract: An image sensor includes a pixel array, an analog-to-digital converter (ADC), and a test circuit. The pixel array includes a plurality of pixels arranged in rows and columns. Each pixel generates an analog signal based on incident light. The ADC converts the analog signal to a digital signal using a counter. The test circuit receives a test code in a test mode, generates a count clock signal based on the test code, tests a counting operation of the counter according to the count clock signal, and externally outputs a test result of the counter through a test terminal.

Abstract: An image sensor includes a pixel array, an analog-to-digital converter (ADC), and a test circuit. The pixel array includes a plurality of pixels arranged in rows and columns. Each pixel generates an analog signal based on incident light. The ADC converts the analog signal to a digital signal using a counter. The test circuit receives a test code in a test mode, generates a count clock signal based on the test code, tests a counting operation of the counter according to the count clock signal, and externally outputs a test result of the counter through a test terminal.

Abstract: An image sensor includes a pixel array including a plurality of pixels, an analog-to-digital converter having a first counter for converting an analog signal into a digital signal, and an output buffer having a first memory. A first counter test result value generated as a test result for the first counter is stored in the first memory in a test mode. The output buffer outputs the first counter test result value from the first memory to an outside of the output buffer in response to a first selection signal. The output buffer further includes a reset logic circuit for resetting the first memory depending on whether the first counter test result value is output or not. The plurality of pixels generate the analog signal in response to incident light.

Abstract: An image sensor includes a pixel array including a plurality of pixels, an analog-to-digital converter having a first counter for converting an analog signal into a digital signal, and an output buffer having a first memory. A first counter test result value generated as a test result for the first counter is stored in the first memory in a test mode. The output buffer outputs the first counter test result value from the first memory to an outside of the output buffer in response to a first selection signal. The output buffer further includes a reset logic circuit for resetting the first memory depending on whether the first counter test result value is output or not. The plurality of pixels generate the analog signal in response to incident light.

Abstract: An image sensor includes a pixel array, an analog-to-digital converter (ADC), and a test circuit. The pixel array includes a plurality of pixels arranged in rows and columns. Each pixel generates an analog signal based on incident light. The ADC converts the analog signal to a digital signal using a counter. The test circuit receives a test code in a test mode, generates a count clock signal based on the test code, tests a counting operation of the counter according to the count clock signal, and externally outputs a test result of the counter through a test terminal.

Abstract: An apparatus for controlling a pixel output level includes a column signal line connected to an output node of at least one pixel sensor. The apparatus includes a load circuit is connected between the column signal line and a ground terminal. The apparatus also includes a level adjusting circuit configured to adjust a voltage level of a pixel signal output from the at least one pixel sensor to the column signal line based on a correction target value.

Abstract: A vision sensor chip includes a photoelectric conversion element that generates a current based on an incident light, a current-voltage (I-V) converter that converts the current into a voltage, an AC coupling capacitor directly connected to the I-V converter, an open-loop amplifier that includes a reset switch and amplifies a voltage provided by the I-V converter via the AC coupling capacitor. An event detection block detects motion according to a change in the amplified output voltage and generates first and second detection signals. A reset signal generator generates a reset signal controlling operation of the reset switch in response to first and second control signals respectively related to the first and second detection signals.

Abstract: An ambient light sensor includes a photoelectric conversion unit, a current control unit, a signal conversion unit and a comparison unit. The photoelectric conversion unit provides a photo current having a magnitude corresponding to illuminance of incident light to a first node. The current control unit generates a control current exponentially proportional to an elapse time based on a clock signal, provides the control current to the first node, and outputs a digital code corresponding to the elapse time in response to a reset signal. The signal conversion unit generates a comparison voltage logarithmically proportional to a sum of the photo current and the control current. The comparison unit generates the reset signal by comparing a magnitude of the comparison voltage and a magnitude of a reference voltage. The ambient light sensor generates the digital code effectively representing illuminance of ambient light that eyes of a human being perceives.

Abstract: A dynamic vision sensor includes a sensing pixel array including a plurality of sensing pixels each detecting a change of light intensity to output an event by a unit of time-stamp and a control unit that controls the sensing pixel array. Here, each of the sensing pixels has an inclined N-polygon shape, where N is an even number greater than or equal to 4. In addition, each of the sensing pixels includes first sides extended in a first direction that stand opposite to each other in a second direction in a staggered form and second sides extended in the second direction that stand opposite to each other in the first direction in a staggered form, where the first direction is perpendicular to the second direction.

Abstract: A vision sensor chip includes a photoelectric conversion element that generates a current based on an incident light, a current-voltage (I-V) converter that converts the current into a voltage, an AC coupling capacitor directly connected to the I-V converter, an open-loop amplifier that includes a reset switch and amplifies a voltage provided by the I-V converter via the AC coupling capacitor. An event detection block detects motion according to a change in the amplified output voltage and generates first and second detection signals. A reset signal generator generates a reset signal controlling operation of the reset switch in response to first and second control signals respectively related to the first and second detection signals.

Abstract: An apparatus for controlling a pixel output level includes a column signal line connected to an output node of at least one pixel sensor. The apparatus includes a load circuit is connected between the column signal line and a ground terminal. The apparatus also includes a level adjusting circuit configured to adjust a voltage level of a pixel signal output from the at least one pixel sensor to the column signal line based on a correction target value.

Abstract: An ambient light sensor includes a photoelectric conversion unit, a current control unit, a signal conversion unit and a comparison unit. The photoelectric conversion unit provides a photo current having a magnitude corresponding to illuminance of incident light to a first node. The current control unit generates a control current exponentially proportional to an elapse time based on a clock signal, provides the control current to the first node, and outputs a digital code corresponding to the elapse time in response to a reset signal. The signal conversion unit generates a comparison voltage logarithmically proportional to a sum of the photo current and the control current. The comparison unit generates the reset signal by comparing a magnitude of the comparison voltage and a magnitude of a reference voltage. The ambient light sensor generates the digital code effectively representing illuminance of ambient light that eyes of a human being perceives.