Abstract: An electronic device supporting multi-panel interface displaying is provided. The electronic device has: a processing unit configured to provide an operating interface, wherein the operating interface has a plurality of interface components; and a multi-device group communication unit configured to perform a device coordination process between the electronic device and at least one other electronic device, wherein the at least one other electronic device has a corresponding processing unit and a corresponding multi-device group communication unit, and the processing unit adjusts at least one of the interface components displayed on the electronic device according to a number of devices in the device coordination process between the electronic device and the at least one other electronic device.

Abstract: A service workflow generation apparatus, having a quality of service (QoS) monitor for obtaining a plurality of real time QoS values respectively corresponding to a plurality of service elements on the web. A QoS calculation module generates a plurality of possible service workflows composed of the service elements and a plurality of overall QoS values of the possible service workflows based on the real time QoS values by using a Modified Heuristic Algorithm. A service workflow selection module dynamically selects a service workflow from the possible service workflows according to the overall QoS value.

Abstract: A message processing method for publishing a message is provided. A first message including a message topic and a privacy level setting is received. It is determined whether the privacy level setting of the first message is erroneous according to the message topic and a privacy inherent relationship corresponding thereto. If so, the privacy level setting of the first message is corrected according to a predetermined privacy inherent policy. Thereafter, the first message is dispatched to at least one subscriber corresponding to the message topic.

Abstract: Within a method for estimating a microelectronic fabrication product yield and a system for estimating the microelectronic fabrication product yield there is employed a specific mathematic algorithm for estimating yield of a new microelectronic fabrication product within at least one microelectronic fabrication facility. The specific algorithm is solved incident to parametric data correlation with existing production data within the at least one microelectronic fabrication facility.

Abstract: Within a method for estimating a microelectronic fabrication product yield and a system for estimating the microelectronic fabrication product yield there is employed a specific mathematic algorithm for estimating yield of a new microelectronic fabrication product within at least one microelectronic fabrication facility. The specific algorithm is solved incident to parametric data correlation with existing production data within the at least one microelectronic fabrication facility.