Abstract: An electronic device includes a serial signal test system to test serial signals generated by a serial signal generator. A test method tests serial signals using the electronic device. The test method sets test parameters that tests serial signals. Furthermore, the test method identifies an error bit from coded bits of each of the serial signals, and identifies abnormal attribute data of each of the serial signals. In addition, the test method generates a test report according to all identified error bits and abnormal attribute data.

Abstract: A test system includes a main selector, a first and a second switching connectors, a first and a second sub-selectors, and a processor. The main selector includes a number of first switches, a number of first contacts, and a number of second contacts. Each sub-selector includes a second switch, a third contact, and a fourth contact. The processor sends a first instruction and a second instruction to correspondingly control the main selector and a selected sub-selector.

Abstract: A testing system for bus parameters includes a wave displaying unit and a control module connected to the wave displaying unit. The control module includes a decode unit, a testing unit connected to the decode unit, and an output unit connected to the testing unit. The decode unit is connected to the wave displaying unit. The wave displaying unit is configured for receiving an electronic signal from a bus to be tested. The decode unit is configured for decoding the electronic signal to determine if the electronic signal is valid. The testing unit tests parameters of the bus. The output unit displays testing results for the parameters.

Abstract: A test system includes a serial advanced technology attachment (SATA) test apparatus, a number of test cables, and an oscillograph. Each test cable includes a soft sub-miniature-a wire and a sub-miniature-a connector. A first terminal of each sub-miniature-a wire is electrically fixed to an output of the SATA test apparatus. A second terminal of each sub-miniature-a wire is connected to the corresponding sub-miniature-a connector. Each sub-miniature-a connector is used to connect to an input of the oscillograph.

Abstract: A system and method for testing video graphics array (VGA) signal groups includes configuring a route parameter of each of the VGA signal groups, establishing a connection between an input channel and an output channel of a signal channel selector corresponding to each of the VGA signal groups, and transferring each of the VGA signal groups to the digital oscilloscope through the connection. The system and method further includes enabling the digital oscilloscope to analyze each of the VGA signal groups and acquire analysis results of each of the VGA signal groups.

Abstract: A test system includes a main selector, a first and a second switching connectors, a first and a second sub-selectors, and a processor. The main selector includes a number of first switches, a number of first contacts, and a number of second contacts. Each sub-selector includes a second switch, a third contact, and a fourth contact. The processor sends a first instruction and a second instruction to correspondingly control the main selector and a selected sub-selector.

Abstract: An electronic device includes a serial signal test system to test serial signals generated by a serial signal generator. A test method tests serial signals using the electronic device. The test method sets test parameters that tests serial signals. Furthermore, the test method identifies an error bit from coded bits of each of the serial signals, and identifies abnormal attribute data of each of the serial signals. In addition, the test method generates a test report according to all identified error bits and abnormal attribute data.

Abstract: A oscillograph and a signal integrity test method are provided. The oscillograph measures a serial data bus to obtain captured signals transmitted by each communication channel of the oscillograph. By identifying a time sequence for the captured signals transmitted by each communication channel, a test signal is determined. The oscillograph measures a clock frequency of the test signal, sampling a part of the test signal, and testing the part according to pre-set test items. If a predetermined number of samples of the test signal is tested, the oscillograph constitutes a completed signal integrity test of the serial data bus and a test report is generated.

Abstract: A testing system for bus parameters includes a wave displaying unit and a control module connected to the wave displaying unit. The control module includes a decode unit, a testing unit connected to the decode unit, and an output unit connected to the testing unit. The decode unit is connected to the wave displaying unit. The wave displaying unit is configured for receiving an electronic signal from a bus to be tested. The decode unit is configured for decoding the electronic signal to determine if the electronic signal is valid. The testing unit tests parameters of the bus. The output unit displays testing results for the parameters.

Abstract: A signal measurement method includes receiving a signal from a signal generating module; displaying a wave of the signal; reading a reference parameter of the signal, and adjusting the wave according to the reference parameter; measuring the signal according to the wave after adjustment; and displaying the measurement result.