Abstract: Memory devices and methods of forming the same are provided. A memory device of the present disclosure includes a bottom dielectric layer, a gate structure extending vertically from the bottom dielectric layer, a stack structure, and a dielectric layer extending between the gate structure and the stack structure. The stack structure includes a first silicide layer, a second silicide layer, an oxide layer extending bet ween the first and second silicide layers, a channel region over the oxide layer and extending between the first and second silicide layers, and an isolation layer over the second silicide layer. The first and second silicide layers include cobalt, titanium, tungsten, or palladium.

Abstract: Some aspects provide determination of a function to rectify functional differences between netlist G1 and netlist G2 having inputs V. The determination may include determination of a signal s of netlist G1 that can be re-synthesized so as to correct the functional differences between netlist G1 and netlist G2, assignment of respective static values to a first plurality of inputs V, assignment of respective initial values to a second plurality of inputs V, determination of a first function based on the assigned static values, the assigned initial values, a first error function reflecting the difference between outputs of netlist G1 and netlist G2 for each vector of inputs V in a case that s equals 0, and a second error function reflecting the difference between the outputs of netlist G1 and netlist G2 for each vector of inputs V in a case that s equals 1.

Abstract: Some embodiments relate to a method and apparatus for performing logic equivalence checking (EC) of circuits using adaptive learning based on a persistent cache containing information on sub-problems solved from previous equivalency checking runs. These sub-problems can include basic EC tasks such as logic cone comparison and/or state element mapping.

Abstract: Some embodiments relate to a method and apparatus for performing logic equivalence checking (EC) of circuits using adaptive learning based on a persistent cache containing information on sub-problems solved from previous equivalency checking runs. These sub-problems can include basic EC tasks such as logic cone comparison and/or state element mapping.

Abstract: Some aspects provide determination of a function to rectify functional differences between netlist G1 and netlist G2 having inputs V. The determination may include determination of a signal s of netlist G1 that can be re-synthesized so as to correct the functional differences between netlist G1 and netlist G2, assignment of respective static values to a first plurality of inputs V, assignment of respective initial values to a second plurality of inputs V, determination of a first function based on the assigned static values, the assigned initial values, a first error function reflecting the difference between outputs of netlist G1 and netlist G2 for each vector of inputs V in a case that s equals 0, and a second error function reflecting the difference between the outputs of netlist G1 and netlist G2 for each vector of inputs V in a case that s equals 1.

Abstract: Some embodiments relate to a method and apparatus for performing logic equivalence checking (EC) of circuits using adaptive learning based on a persistent cache containing information on sub-problems solved from previous equivalency checking runs. These sub-problems can include basic EC tasks such as logic cone comparison and/or state element mapping.

Abstract: Some embodiments relate to a method and apparatus for performing logic equivalence checking (EC) of circuits using adaptive learning based on a persistent cache containing information on sub-problems solved from previous equivalency checking runs. These sub-problems can include basic EC tasks such as logic cone comparison and/or state element mapping.

Abstract: Some embodiments relate to a method and apparatus for performing logic equivalence checking (EC) of circuits using adaptive learning based on a persistent cache containing information on sub-problems solved from previous equivalency checking runs. These sub-problems can include basic EC tasks such as logic cone comparison and/or state element mapping.

Abstract: An equivalence checking method provides first and second logic functions. Don't care gates are inserted for don't care conditions in the first and second logic functions. The insertion of the don't care gates creates a first intermediate circuit and a second intermediate circuit. All 3DC gates of the first intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. All 3DC gates of the second intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. First and second circuit are produced in response to propagating and merging the 3DC gates. A combinational equivalence check is then performed of the first circuit to the second circuit under different equivalence relations.

Abstract: An equivalence checking method provides first and second logic functions. Don't care gates are inserted for don't care conditions in the first and second logic functions. The insertion of the don't care gates creates a first intermediate circuit and a second intermediate circuit. All 3DC gates of the first intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. All 3DC gates of the second intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. First and second circuit are produced in response to propagating and merging the 3DC gates. A combinational equivalence check is then performed of the first circuit to the second circuit under different equivalence relations.

Abstract: An equivalence checking method provides first and second logic functions. Don't care gates are inserted for don't care conditions in the first and second logic functions. The insertion of the don't care gates creates a first intermediate circuit and a second intermediate circuit. All 3DC gates of the first intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. All 3DC gates of the second intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. First and second circuits are produced in response to propagating and merging the 3DC gates. A combinational equivalence check is then performed of the first circuit to the second circuit under different equivalence relations.

Abstract: Some embodiments relate to a method and apparatus for performing logic equivalence checking (EC) of circuits using adaptive learning based on a persistent cache containing information on sub-problems solved from previous equivalency checking runs. These sub-problems can include basic EC tasks such as logic cone comparison and/or state element mapping.

Abstract: An equivalence checking method provides first and second logic functions. Don't care gates are inserted for don't care conditions in the first and second logic functions. The insertion of the don't care gates creates a first intermediate circuit and a second intermediate circuit. All 3DC gates of the first intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. All 3DC gates of the second intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. First and second circuit are produced in response to propagating and merging the 3DC gates. A combinational equivalence check is then performed of the first circuit to the second circuit under different equivalence relations.