Patents by Inventor Yuri Kokotov

Yuri Kokotov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080177408
    Abstract: A method, system, and medium of modeling and/or for controlling a manufacturing process is disclosed. The method includes the steps of identifying one or more input parameters that cause a change in output characteristics, defining global nodes using estimated maximum and minimum values of the input parameters, and defining a mathematical equation that calculates a predicted output characteristic for each node. The method also includes the steps of receiving at least one empirical data point having one or more input parameter values and at least one empirical output value and adjusting the predicted output values at the nodes based on a difference between the at least one empirical output value and the predicted output characteristic calculated using the mathematical equation based on the one or more input parameter values.
    Type: Application
    Filed: December 20, 2007
    Publication date: July 24, 2008
    Inventors: Yuri Kokotov, Alexander T. Schwarm, Efim Entin, Jacques Seror, Jehuda Hartman, Yossi Fisher, Arulkumar P. Shanmugasundram, Moshe Sarfaty
  • Publication number: 20080021571
    Abstract: A method, system, and medium of modeling and/or for controlling a manufacturing process is disclosed. In particular, a method according to embodiments of the present invention includes calculating a set of predicted output values, and obtaining a prediction model based on a set of input parameters, the set of predicted output values, and empirical output values. Each input parameter causes a change in at least two outputs. The method also includes optimizing the prediction model by minimizing differences between the set of predicted output values and the empirical output values, and adjusting the set of input parameters to obtain a set of desired output values to control the manufacturing apparatus. Obtaining the prediction model includes transforming the set of input parameters into transformed input values using a transformation function of multiple coefficient values, and calculating the predicted output values using the transformed input values.
    Type: Application
    Filed: July 31, 2007
    Publication date: January 24, 2008
    Inventors: Yuri Kokotov, Efim Entin, Jacques Seror, Yossi Fisher, Shalomo Sarel, Arulkumar Shanmugasundram, Alexander Schwarm, Young Paik
  • Publication number: 20080011290
    Abstract: The invention provides receivers which can be used to heat a working fluid to high temperature. In preferred embodiments, concentrated solar radiation is received and converted to heat at varying depths in the receiver such that multiple layers of surface are used to heat the working fluid. In addition, the depth-loading configuration helps to trap received heat to reduce radiant thermal loss.
    Type: Application
    Filed: May 11, 2007
    Publication date: January 17, 2008
    Applicant: BrightSource Energy, Inc.
    Inventors: Arnold Goldman, Arieh Meitav, Ilia Yakupov, Israel Kroizer, Yuri Kokotov, Yoel Gilon
  • Patent number: 7272459
    Abstract: A method, system, and medium of modeling and/or for controlling a manufacturing process is disclosed. In particular, a method according to embodiments of the present invention includes the step of identifying one or more input parameters. Each input parameter causes a change in at least two outputs. The method also includes the step of storing values of the identified inputs and corresponding empirical output values along with predicted output values. The predicted output values are calculated based on, in part, the values of the identified inputs. The method also includes the step of calculating a set of transform coefficients by minimizing a score equation that is a function of differences between one or more of the empirical output values and their corresponding predicted output values.
    Type: Grant
    Filed: November 14, 2003
    Date of Patent: September 18, 2007
    Assignee: Applied Materials, Inc.
    Inventors: Yuri Kokotov, Efim Entin, Jacques Seror, Yossi Fisher, Shalomo Sarel, Arulkumar P. Shanmugasundram, Alexander T. Schwarm, Young Jeen Paik
  • Patent number: 6999836
    Abstract: A system, method and medium of controlling a semiconductor manufacturing tool using a feedback control mechanism. The feedback control mechanism includes features for receiving data points relating to an output of the tool. The data points include a current data point and at least one previous data point. The feedback control mechanism also includes features for determining whether the current data point is an erroneous outlier by comparing the current data point to a statistical representation of the at least one previous data point, and based on whether the at least one previous data point is an outlier. The feedback control mechanism further includes features for disregarding the current data point in calculating a feedback value of the feedback control mechanism if the current data point is determined as an erroneous outlier.
    Type: Grant
    Filed: August 1, 2003
    Date of Patent: February 14, 2006
    Assignee: Applied Materials, Inc.
    Inventors: Alexander T. Schwarm, Arulkumar P. Shanmugasundram, Jacques Seror, Yuri Kokotov, Efim Entin
  • Publication number: 20040225377
    Abstract: A method, system, and medium of modeling and/or for controlling a manufacturing process is disclosed. In particular, a method according to embodiments of the present invention includes the step of identifying one or more input parameters. Each input parameter causes a change in at least two outputs. The method also includes the step of storing values of the identified inputs and corresponding empirical output values along with predicted output values. The predicted output values are calculated based on, in part, the values of the identified inputs. The method also includes the step of calculating a set of transform coefficients by minimizing a score equation that is a function of differences between one or more of the empirical output values and their corresponding predicted output values.
    Type: Application
    Filed: November 14, 2003
    Publication date: November 11, 2004
    Inventors: Yuri Kokotov, Efim Entin, Jacques Seror, Yossi Fisher, Shalomo Sarel, Arulkumar P. Shanmugasundram, Alexander T. Schwarm, Young Jeen Paik
  • Publication number: 20040143357
    Abstract: A system, method and medium of controlling a semiconductor manufacturing tool using a feedback control mechanism. The feedback control mechanism includes features for receiving data points relating to an output of the tool. The data points include a current data point and at least one previous data point. The feedback control mechanism also includes features for determining whether the current data point is an erroneous outlier by comparing the current data point to a statistical representation of the at least one previous data point, and based on whether the at least one previous data point is an outlier. The feedback control mechanism further includes features for disregarding the current data point in calculating a feedback value of the feedback control mechanism if the current data point is determined as an erroneous outlier.
    Type: Application
    Filed: August 1, 2003
    Publication date: July 22, 2004
    Inventors: Alexander T. Schwarm, Arulkumar P. Shanmugasundram, Jacques Seror, Yuri Kokotov, Efim Entin
  • Publication number: 20040015335
    Abstract: A method, system, and medium of modeling and/or for controlling a manufacturing process is disclosed. The method includes the steps of identifying one or more input parameters that cause a change in output characteristics, defining global nodes using estimated maximum and minimum values of the input parameters, and defining a mathematical equation that calculates a predicted output characteristic for each node. The method also includes the steps of receiving at least one empirical data point having one or more input parameter values and at least one empirical output value and adjusting the predicted output values at the nodes based on a difference between the at least one empirical output value and the predicted output characteristic calculated using the mathematical equation based on the one or more input parameter values.
    Type: Application
    Filed: March 4, 2003
    Publication date: January 22, 2004
    Applicant: Applied Materials Israel Ltd.
    Inventors: Yuri Kokotov, Alexander T. Schwarm, Efim Entin, Jacques Seror, Jehuda Hartman, Yossi Fisher, Arulkumar P. Shanmugasundram, Moshe Sarfaty
  • Patent number: 6678668
    Abstract: Apparatus for control of a complex process, said process being described by a plurality of input variables, a plurality of intermediate variables and a plurality of output variables having relationships therebetween such that ones of said inputs and said intermediate variables effect respectively different output variables, each of said output variables having a target, said apparatus comprising an optimizer for finding an optimum value for respective ones of said input and intermediate variables to maximize a summed convergence of said output variables to said targets.
    Type: Grant
    Filed: March 7, 2002
    Date of Patent: January 13, 2004
    Assignee: Insyst Ltd.
    Inventors: Yossi Fisher, Jehuda Hartman, Yuri Kokotov, Jacques Seror, Efim Entin
  • Publication number: 20030171829
    Abstract: Apparatus for control of a complex process, said process being described by a plurality of input variables, a plurality of intermediate variables and a plurality of output variables having relationships therebetween such that ones of said inputs and said intermediate variables effect respectively different output variables, each of said output variables having a target, said apparatus comprising an optimizer for finding an optimum value for respective ones of said input and intermediate variables to maximize a summed convergence of said output variables to said targets
    Type: Application
    Filed: March 7, 2002
    Publication date: September 11, 2003
    Applicant: Insyst Ltd.
    Inventors: Yossi Fisher, Jehuda Hartman, Yuri Kokotov, Jacques Seror, Efim Entin
  • Patent number: 5585569
    Abstract: An apparatus and a method for evaluating the stability of a disperse solid material against caking. The apparatus includes a chamber for storing a sample of the disperse solid material, the chamber having a diverging cross sectional area along a line of action of a compression load compressing the sample so as to cake a portion of the sample and an opening for enabling separation of the uncaked portion of the sample from the caked portion of the sample, a shutter for selectively sealing the opening during partial aggregation of the sample and a compression load mechanism for applying the compression load. The method includes the steps of providing a known weight of a sample of a disperse solid material, applying a compression load so as to cake a portion of the sample, separating an uncaked portion of the sample from a caked portion of the sample after partial aggregation of the sample and computing an index for the stability of the disperse solid material against caking.
    Type: Grant
    Filed: July 7, 1995
    Date of Patent: December 17, 1996
    Assignee: Temech Chemical Engineering Ltd.
    Inventors: Leonid Braginsky, Yuri Kokotov, Reuven Wachs