Abstract: According to one embodiment, an anomaly detection apparatus includes a processing circuit. The processing circuit is configured to: acquire measured values from sensors installed in a system, a first function, a first threshold, and a second function to output a second threshold; generate the predicted values based on the measured value and the first function; detect that a deviation between the measured values and the predicted values exceeds the first threshold; calculate the feature quantities based on the measured values; and determine whether a number of consecutive times is equal to or larger than the second threshold to detect an anomaly or a sign of the anomaly.

Abstract: According to one embodiment, an abnormality sign detection system comprising one or more computers configured to perform machine learning of an abnormality-sign detection-model that detects at least one of an abnormality in a target facility to be monitored and a sign of the abnormality, wherein the one or more computers are configured to: acquire a plurality of process amounts generated at the target facility; classify each of the plurality of process amounts into either correlation data for which correlation between the plurality of process amounts is learned or decorrelation data for which correlation between the plurality of process amounts is not learned; generate learning input data depending on classification, the learning input data being data in which each of the plurality of process amounts is associated with the correlation data or the decorrelation data; and perform the machine learning by inputting the learning input data to the abnormality-sign detection-model.

Abstract: According to one embodiment, a data processing apparatus includes a processor. The processor calculates, from the first measurement data, a first differential value set that is a set of first differential values in a time direction at a time included in the first period of the measurement values of the sensor of interest. The processor calculates, from the second measurement data, a second differential value set that is a set of second differential values in a time direction at a time included in the second period of the measurement values of the sensor of interest. The processor generates a first differential value distribution and a second differential value distribution using the second differential value set.