Abstract: A method of detecting multi-surfaces of an object includes providing an imaging system capable of detecting surfaces of the object. After system parameters are set up, two-dimensional images of the object at multiple Z steps can be acquired. Each surface of the object can then be extracted using two steps. In a first step, the surface can be constructed based on a confidence threshold. In a second step, the surface can be enhanced using an interpolation filter.

Abstract: A method of detecting multi-surfaces of an object includes providing an imaging system capable of detecting surfaces of the object. After system parameters are set up, two-dimensional images of the object at multiple Z steps can be acquired. Each surface of the object can then be extracted using two steps. In a first step, the surface can be constructed based on a confidence threshold. In a second step, the surface can be enhanced using an interpolation filter.

Abstract: A three-dimensional (3D) microscope for patterned substrate measurement can include an objective lens, a reflected illuminator, a transmitted illuminator, a focusing adjustment device, an optical sensor, and a processor. The focusing adjustment device can automatically adjust the objective lens focus at a plurality of Z steps. The optical sensor can be capable of acquiring images at each of these Z steps. The processor can control the reflected illuminator, the transmitted illuminator, the focusing adjustment device, and the optical sensor. The processor can be configured to capture first and second images at multiple Z steps, the first image with the pattern using the reflected illuminator and the second image without the pattern using one of the reflected illuminator and the transmitted illuminator.

Abstract: A three-dimensional (3D) microscope for patterned substrate measurement can include an objective lens, a reflected illuminator, a transmitted illuminator, a focusing adjustment device, an optical sensor, and a processor. The focusing adjustment device can automatically adjust the objective lens focus at a plurality of Z steps. The optical sensor can be capable of acquiring images at each of these Z steps. The processor can control the reflected illuminator, the transmitted illuminator, the focusing adjustment device, and the optical sensor. The processor can be configured to capture first and second images at multiple Z steps, the first image with the pattern using the reflected illuminator and the second image without the pattern using one of the reflected illuminator and the transmitted illuminator.

Abstract: A three-dimensional (3D) microscope for patterned substrate measurement can include an objective lens, a reflected illuminator, a transmitted illuminator, a focusing adjustment device, an optical sensor, and a processor. The focusing adjustment device can automatically adjust the objective lens focus at a plurality of Z steps. The optical sensor can be capable of acquiring images at each of these Z steps. The processor can control the reflected illuminator, the transmitted illuminator, the focusing adjustment device, and the optical sensor. The processor can be configured to capture first and second images at multiple Z steps, the first image with the pattern using the reflected illuminator and the second image without the pattern using one of the reflected illuminator and the transmitted illuminator.

Abstract: A method of detecting multi-surfaces of an object includes providing an imaging system capable of detecting surfaces of the object. After system parameters are set up, two-dimensional images of the object at multiple Z steps can be acquired. Each surface of the object can then be extracted using two steps. In a first step, the surface can be constructed based on a confidence threshold. In a second step, the surface can be enhanced using an interpolation filter.

Abstract: A method of detecting multi-surfaces of an object includes providing an imaging system capable of detecting surfaces of the object. After system parameters are set up, two-dimensional images of the object at multiple Z steps can be acquired. Each surface of the object can then be extracted using two steps. In a first step, the surface can be constructed based on a confidence threshold. In a second step, the surface can be enhanced using an interpolation filter.

Abstract: A method of detecting multi-surfaces of an object includes providing an imaging system capable of detecting surfaces of the object. After system parameters are set up, two-dimensional images of the object at multiple Z steps can be acquired. Each surface of the object can then be extracted using two steps. In a first step, the surface can be constructed based on a confidence threshold. In a second step, the surface can be enhanced using an interpolation filter.

Abstract: A measurement system for monitoring an LED chip surface roughening process is described. A reflective illuminator can run reflectance measurements. A vertical positioning means can adjust a distance between an objective lens and an industrial sample. A horizontal positioning means can move objects in XY plane, and is specifically configured to hold the industrial sample and a reference sample. An optical sensor can acquire images of the industrial sample. A spectrometer can acquire reflectance spectrums of the industrial sample and the reference sample. A processor can control these components. The processor can perform deskew, and calculate an average reflectance and an oscillation amplitude from the reflectance spectrums of the industrial sample.

Abstract: A measurement system for monitoring an LED chip surface roughening process is described. A reflective illuminator can run reflectance measurements. A vertical positioning means can adjust a distance between an objective lens and an industrial sample. A horizontal positioning means can move objects in XY plane, and is specifically configured to hold the industrial sample and a reference sample. An optical sensor can acquire images of the industrial sample. A spectrometer can acquire reflectance spectrums of the industrial sample and the reference sample. A processor can control these components. The processor can perform deskew, and calculate an average reflectance and an oscillation amplitude from the reflectance spectrums of the industrial sample.

Abstract: A mobile phone includes a signal processor, an operating module, and a power supply system. The working voltage of the operating module is bigger than that of the signal processor. The power supply system includes a power source, a voltage boosting unit, and a controller. The input terminal and output terminal of the voltage boosting unit is connected to the power source and the operating module respectively. The controller is configured for connecting the signal processor to the power source or the output terminal of the voltage boosting unit corresponding to the output voltage of the power source being bigger or smaller than a preset threshold voltage.

Abstract: A three-dimensional (3D) microscope includes various insertable components that facilitate multiple imaging and measurement capabilities. These capabilities include Nomarski imaging, polarized light imaging, quantitative differential interference contrast (q-DIC) imaging, motorized polarized light imaging, phase-shifting interferometry (PSI), and vertical-scanning interferometry (VSI).

Abstract: A method of detecting multi-surfaces of an object includes providing an imaging system capable of detecting surfaces of the object. After system parameters are set up, two-dimensional images of the object at multiple Z steps can be acquired. Each surface of the object can then be extracted using two steps. In a first step, the surface can be constructed based on a confidence threshold. In a second step, the surface can be enhanced using an interpolation filter.

Abstract: A three-dimensional (3D) microscope for patterned substrate measurement can include an objective lens, a reflected illuminator, a transmitted illuminator, a focusing adjustment device, an optical sensor, and a processor. The focusing adjustment device can automatically adjust the objective lens focus at a plurality of Z steps. The optical sensor can be capable of acquiring images at each of these Z steps. The processor can control the reflected illuminator, the transmitted illuminator, the focusing adjustment device, and the optical sensor. The processor can be configured to capture first and second images at multiple Z steps, the first image with the pattern using the reflected illuminator and the second image without the pattern using one of the reflected illuminator and the transmitted illuminator.

Abstract: A piezoelectric buzzer driving circuit (200) for driving a piezoelectric buzzer (211) with two terminals includes a reverser (216). The reverser includes an output terminal and an input terminal (24) configured for receiving a controlling signal to control an output of the reverser. The two terminals of the piezoelectric buzzer respectively connected to the input terminal and the output terminal such that a D-value of the voltage across the piezoelectric buzzer is twice as large as the voltage of the controlling signal.

Abstract: A voice recognition system and method thereof. The communication system comprises a setup controller, a voice recognition controller, and an application controller. The setup controller receives a voice keyword table including a voice recognizable keyword and a corresponding application instruction. The voice recognition controller, coupled to the setup controller, receives the voice keyword table from the setup controller, receives a first voice input, and matches a first voice input to the voice recognizable keyword to determine the corresponding application instruction. The application controller, coupled to the voice recognition controller, receives and performs the corresponding application instruction. The setup controller, the voice recognition controller, and the application controller communicate through wireless communication.

Abstract: An imaging device includes a housing, a lens unit, a detection unit, a central processing unit and a driving unit. The lens unit is configured for moving between a first position where the lens unit is received in the housing, and a second position where the lens unit extends from the housing. The detection unit is configured for detecting a current acceleration of the imaging device. The central processing unit is configured for receiving the current acceleration and generating a low driving voltage value if the current acceleration is smaller than a predetermined value and a high driving voltage value if the current acceleration is equal to or greater than the predetermined value. The driving unit is configured for receiving the generated driving voltage value from the central processing unit and retracting the lens unit from the second position to the first position based on the driving voltage.

Abstract: A mobile phone includes a signal processor, an operating module, and a power supply system. The working voltage of the operating module is bigger than that of the signal processor. The power supply system includes a power source, a voltage boosting unit, and a controller. The input terminal and output terminal of the voltage boosting unit is connected to the power source and the operating module respectively. The controller is configured for connecting the signal processor to the power source or the output terminal of the voltage boosting unit corresponding to the output voltage of the power source being bigger or smaller than a preset threshold voltage.

Abstract: An improved voice recognition system in which a Voice Keyword Table is generated and downloaded from a set-up device to a voice recognition device. The VKT includes visual form data, spoken form data, phonetic format data, and an entry corresponding to a keyword, and TTS-generated voice prompts and voice models corresponding to the phonetic format data. A voice recognition system on the voice recognition device is updated by the set-up device. Furthermore, voice models in the voice recognition device are modified by the set-up device.

Abstract: A power switch system (200) for selectively providing power from a primary power source and a secondary power source to an electronic device, includes a detecting module (24), and a selecting module (30). The detecting module is connected to the primary power source. The selecting module is connected to an output terminal of the detecting module, the primary power source, and the secondary power source, and outputs the power from the primary power source to the electronic device if the primary power source is available. The detecting module is configured for determining whether the primary power source is available for the electronic device and generating a switch signal if the primary power source is unavailable, and the selecting module outputs power from the secondary power source to the electronic device in response to the switch signal.