Abstract: It is a two-dimensional semiconductor-metal ohmic-contact structure, a preparation method therefor and use thereof, wherein the ohmic-contact structure comprises two-dimensional semiconductor having semimetal antimony or an alloy containing semimetal antimony deposited thereon to form an ideal van der Waals interface with strong orbital hybridization, and semimetal antimony is deposited on the two-dimensional semiconductor by high-vacuum evaporation; which is applied to semiconductor devices and realizes ultralow contact resistance between the metal and the two-dimensional semiconductor and significantly improve the performance of two-dimensional semiconductor devices.

Abstract: A monolithically and heterogeneously integrated micro-light-emitting diode (microLED) display chip includes the following parts from bottom to top: an LED epitaxial wafer, an isolation layer, a two-dimensional (2D) thin-film transistor (TFT) drive array. The LED epitaxial wafer is provided with a microLED column display array. The 2D TFT drive array is connected to the microLED column display array through a metal column array. A top-gate field-effect transistor (FET) or a back-gate FET is used as a 2D TFT. A channel layer of the 2D TFT is made of a 2D layered material. The vertical monolithic heterogeneous integration is achieved through a drive circuit defined by a microLED column array on the epitaxial wafer and the 2D TFT matrix. A preparation method of the monolithically and heterogeneously integrated microLED display chip is provided.

Abstract: The present invention provides a Fabry-Perot sensor for measuring inclination. Wherein the present inclinometer is fixed on a static detected object in application use, the mass block is flexibly connected to the top plate, thus the line between the center of gravity of the mass block and the connecting point on the top plate is perpendicular to the horizontal plane; a Fabry-Perot cavity is formed between the reflecting surface disposed at one end of the mass block and the end of the optic fiber. The detected object will be in a static state after tilting, the line between the center of gravity of the mass block and its connecting point on the top plate is still perpendicular to the level plane and the F-P cavity length will have a variation. Then the change of cavity length can be measured in accordance with the Fabry-Perot principle, thereby the tilting angle of the mass block is able to be further measured. Then the tilting angle is also the inclination of the detected object.