Abstract: An assessment system (100) used to creating an assessment of workpieces includes a database module (40), a connecting module (20), and a server module (30). The database module stores computer aided design (CAD) drawings of the checked workpieces. The database module and the server module are connected to each other via the connecting module. The server module is connected to the database module and includes an inquiry module and a processor module. The inquiry module inquires the CAD drawings of each checked workpiece and acquires relational parameters of the checked workpieces from the CAD drawings. The processor module processes the parameters acquired by the inquiry module, and the server module creates an assessment according to the parameters and data processed by the processor module.

Abstract: A measuring system (100) includes a measuring instrument (10) and a processing device (20). The measuring instrument includes a base (12), a guide column (14), a sliding member (16), and a digital micrometer (18). The guide column is vertically attached to the base. The sliding member is moveably attached to the guide column. The digital micrometer is firmly fastened to the sliding member. The processing device is electronically connected with the digital micrometer. The processing device receives a measured value from the digital micrometer and diplays a testing result after processing the measured value.

Abstract: An assessment system (100) used to creating an assessment of workpieces includes a database module (40), a connecting module (20), and a server module (30). The database module stores computer aided design (CAD) drawings of the checked workpieces. The database module and the server module are connected to each other via the connecting module. The server module is connected to the database module and includes an inquiry module and a processor module. The inquiry module inquires the CAD drawings of each checked workpiece and acquires relational parameters of the checked workpieces from the CAD drawings. The processor module processes the parameters acquired by the inquiry module, and the server module creates an assessment according to the parameters and data processed by the processor module.