Abstract: A low-heat-loss operation method of a line-focusing heat collection system and the line-focusing heat collection system are provided. The method includes the following steps. Solar energy is utilized to preheat a collector tube in an empty tube state, so that the collector tube is in a preheating mode. After a set preheating temperature is reached, a heat transfer working medium is injected into the collector tube. In the injection process of the heat transfer working medium, an injection section of the collector tube is converted into a focusing mode from a preheating mode. After heat collection is finished, the circulation of the heat transfer working medium is stopped, and the focusing mode of the collector tube is kept. In the drainage process of the heat transfer working medium, an emptying section of the collector tube is converted into a light heat-tracing mode from a focusing mode.

Abstract: The present disclosure provides compounds and pharmaceutically acceptable salts thereof, and methods of using the same. The compounds and methods have a range of utilities as therapeutics, diagnostics, and research tools. In particular, the subject compositions and methods are useful for reducing signaling output of oncogenic proteins.

Abstract: An electric heating device having an air channel includes an upper cover component and a lower shell component. A heater component is arranged in a lower shell of the lower shell component, and includes a heater shell, a heating member and a heating member base arranged in the heater shell. A ventilation portion is arranged at a heating member base to guide an air flow to the heating member, and is matched with a first air inlet on the lower shell and a second air inlet on the heater shell. The air flow is led to the heating member from an outside of the lower shell through the first air inlet, the second air inlet, and the ventilation in sequence.

Abstract: An optical signal processing method, a control unit, an optical transmission unit and a storage medium are disclosed. The optical signal processing method includes: acquiring an OSNR value from an optical receiving unit (S100); acquiring a spectrum shaping adjustment parameter according to the OSNR value (S200); and sending the spectrum shaping adjustment parameter to an optical transmission unit to adjust a filtering parameter of a shaping filter of the optical transmission unit, so that the optical transmission unit adjusts a spectrum waveform of an optical signal by utilizing the shaping filter after adjustment (S300).

Abstract: A handwriting recognition method is provided, which includes: obtaining handwritten original trajectory data in real-time; compressing the handwritten original trajectory data, to obtain compressed handwritten trajectory data; and inputting the compressed handwritten trajectory data into a compressed handwriting recognition model for recognition, to obtain a text recognition result corresponding to the handwritten original trajectory data. A handwriting recognition model is obtained by training with handwritten trajectory data of each piece of training data in a training data set, and the compressed handwriting recognition model is obtained by performing model compression on the handwriting recognition model. The handwriting recognition method can address the problem in the related art that the handwriting recognition accuracy is low caused by incorrect segmentation, thereby effectively improving the handwriting recognition accuracy.

Abstract: An optical signal processing method, a control unit, an optical transmission unit and a storage medium are disclosed. The optical signal processing method includes: acquiring an OSNR value from an optical receiving unit (S100); acquiring a spectrum shaping adjustment parameter according to the OSNR value (S200); and sending the spectrum shaping adjustment parameter to an optical transmission unit to adjust a filtering parameter of a shaping filter of the optical transmission unit, so that the optical transmission unit adjusts a spectrum waveform of an optical signal by utilizing the shaping filter after adjustment (S300).

Abstract: Provided are a method and an apparatus for detecting pixel defect of optical module, and a device, where the method includes: graying an image obtained by imaging a test binary image by an optical module in a darkroom environment to obtain a first grayscale image; determining a first grayscale area and a second grayscale area corresponding to two gray levels in the test binary image from the first grayscale image; determining a pixel point not matching a grayscale feature of respective grayscale region from the first grayscale area and the second grayscale area respectively as a pixel defect point; and determining the pixel defect of the optical module according to the pixel defect point. The technical solution provided in the present disclosure can detect accurately a pixel defect of an optical module which is advantageous in optimizing the processing technology of the optical module.

Abstract: Provided are a method and an apparatus for correcting a color convergence error, and a device. The method includes: controlling a projection system to project a first test pattern containing three sets of monochromatic test points and a second test pattern containing three sets of R, G, and B test points, to collect a first projection image and a second projection image on the projection screen; acquiring a first center-of-mass coordinate and a second center-of-mass coordinate corresponding to projection image points on the first projection image and the second projection image; calculating color noises corresponding to R, G, and B according to the first center-of-mass coordinate and the second center-of-mass coordinate; calculating color coordinates corresponding to the R, G, and B according to the color noises corresponding to the R, G, and B and the second center-of-mass coordinate; and adjusting an assembly parameter of the projection system.

Abstract: Provided are a method and an apparatus for adjusting an exposure time of a camera and a device, where the method includes: controlling the camera to collect an imaging light spot of an imaging component with a first exposure time; obtaining an energy value received when the camera collecting the imaging light spot; if the energy value is not within a set energy range, obtaining a curve parameter corresponding to an exposure time-energy curve according to the energy value and the first exposure time; calculating an estimated exposure time corresponding to an optimal energy value according to the curve parameter; and updating the first exposure time with the estimated exposure time corresponding to the optimal energy value. The technical solution provided in the present disclosure can adjust the exposure time of the camera to a reasonable value so as to improve the accuracy and reliability of light spot analysis.

Abstract: Provided are a method and an apparatus for detecting pixel defect of optical module, and a device, where the method includes: graying an image obtained by imaging a test binary image by an optical module in a darkroom environment to obtain a first grayscale image; determining a first grayscale area and a second grayscale area corresponding to two gray levels in the test binary image from the first grayscale image; determining a pixel point not matching a grayscale feature of respective grayscale region from the first grayscale area and the second grayscale area respectively as a pixel defect point; and determining the pixel defect of the optical module according to the pixel defect point. The technical solution provided in the present disclosure can detect accurately a pixel defect of an optical module which is advantageous in optimizing the processing technology of the optical module.

Abstract: Provided are a method and an apparatus for correcting a color convergence error, and a device. The method includes: controlling a projection system to project a first test pattern containing three sets of monochromatic test points and a second test pattern containing three sets of R, G, and B test points, to collect a first projection image and a second projection image on the projection screen; acquiring a first center-of-mass coordinate and a second center-of-mass coordinate corresponding to projection image points on the first projection image and the second projection image; calculating color noises corresponding to R, G, and B according to the first center-of-mass coordinate and the second center-of-mass coordinate; calculating color coordinates corresponding to the R, G, and B according to the color noises corresponding to the R, G, and B and the second center-of-mass coordinate; and adjusting an assembly parameter of the projection system.

Abstract: Provided are a method and an apparatus for adjusting an exposure time of a camera and a device, where the method includes: controlling the camera to collect an imaging light spot of an imaging component with a first exposure time; obtaining an energy value received when the camera collecting the imaging light spot; if the energy value is not within a set energy range, obtaining a curve parameter corresponding to an exposure time-energy curve according to the energy value and the first exposure time; calculating an estimated exposure time corresponding to an optimal energy value according to the curve parameter; and updating the first exposure time with the estimated exposure time corresponding to the optimal energy value. The technical solution provided in the present disclosure can adjust the exposure time of the camera to a reasonable value so as to improve the accuracy and reliability of light spot analysis.

Abstract: A transistor is provided, which includes: a semiconductor growth substrate and a semiconductor thermoelectric effect device, wherein the semiconductor thermoelectric effect device contains a semiconductor compound layer, a metal layer, a heat conducting layer, a thermocouple heat conducting device and a heat sink layer, the semiconductor compound layer is grown on the semiconductor growth substrate, the metal layer is grown on the semiconductor compound layer, the heat conducting layer is grown on the metal layer, the thermocouple heating conducting device is grown on the heat conducting layer, and the heat sink layer is grown on the other side surface of the thermocouple heat conducting device opposite to the heat conducting layer. The thermocouple heating conducting device may further contain power supply arms which are grown on the heat conducting layer and are electrically connected with the thermocouple heat conducting device.

Abstract: The disclosure discloses a method and device for testing link performance, a logic processor and a Network Processor (NP). The method includes that: a first-type message is sent to an opposite node, and parameter information of the local node is acquired according to the first-type message; and a second-type message sent by the opposite node is received, and parameter information of the opposite node is acquired according to the second-type message, wherein a Central Processing Unit (CPU) of the local node is capable of calculating link performance between the local node and the opposite node according to the parameter information of the local node and the parameter information of the opposite node.

Abstract: An apparatus and a method for detecting spectrum interference. The apparatus includes: a receiving antenna; a normal signal processing unit; an interference signal processing unit; a radio frequency channel processing unit, configured to perform radio frequency processing for a received normal signal, and to perform radio frequency processing for a preprocessed interference signal in an idle timeslot; a radio frequency sampling unit, configured to perform, according to an input sampling clock, radio frequency sampling for the normal signal, for the interference signal, and to send the interference signal to an interference signal detecting unit; and the interference signal detecting unit, configured to perform fast Fourier transform in a digital domain for the interference signal, to perform frequency band identification, and to acquire a communication mode of the interference signal.

Abstract: A transistor is provided, which includes: a semiconductor growth substrate and a semiconductor thermoelectric effect device, wherein the semiconductor thermoelectric effect device contains a semiconductor compound layer, a metal layer, a heat conducting layer, a thermocouple heat conducting device and a heat sink layer, the semiconductor compound layer is grown on the semiconductor growth substrate, the metal layer is grown on the semiconductor compound layer, the heat conducting layer is grown on the metal layer, the thermocouple heating conducting device is grown on the heat conducting layer, and the heat sink layer is grown on the other side surface of the thermocouple heat conducting device opposite to the heat conducting layer. The thermocouple heating conducting device may further contain power supply arms which are grown on the heat conducting layer and are electrically connected with the thermocouple heat conducting device.

Abstract: An apparatus and a method for detecting spectrum interference are described.

Abstract: A manufacturing method of a resistive random access storage unit, includes: forming a resistance layer on a first metal layer having a flat surface; forming a passivation layer on the resistance layer; performing an etching process to obtain a plurality of basic units, a basic unit comprising a first metal layer, a resistance layer, and a passivation layer, which are laminated sequentially; depositing a insulating dielectric layer, and flattening the insulating dielectric layer; etching the insulating dielectric layer and the passivation layer to form contacting holes corresponded to the basic units; filling metal wires in the contacting holes; forming a second metal layer. According to the above method, a uniformly distributed resistance can be formed on a whole wafer.

Abstract: A manufacturing method of a resistive random access storage unit, includes: forming a resistance layer on a first metal layer having a flat surface; forming a passivation layer on the resistance layer; performing an etching process to obtain a plurality of basic units, a basic unit comprising a first metal layer, a resistance layer, and a passivation layer, which are laminated sequentially; depositing a insulating dielectric layer, and flattening the insulating dielectric layer; etching the insulating dielectric layer and the passivation layer to form contacting holes corresponded to the basic units; filling metal wires in the contacting holes; forming a second metal layer. According to the above method, a uniformly distributed resistance can be formed on a whole wafer.