Abstract: A vision inspection system includes a sorting platform having an upper surface supporting parts for inspection. An inspection station is positioned adjacent the sorting platform including an imaging device to image the parts in a field of view. A vision inspection controller receives images from the imaging device. The vision inspection controller includes an image histogram tool to pre-process the images to improve contrast of the images by redistributing lightness values of the images based on adaptive histogram equalization processing to generate enhanced images. The vision inspection controller processes the enhanced images based on an image analysis model to determine inspection results for each of the parts. The vision inspection controller has an artificial intelligence learning module operated to customize and configure the image analysis model based on the enhanced images.

Abstract: Provided are a probe head, a probe assembly and a spring probe including the same. The probe head comprises a contact portion and first, second and third body portions stacked in sequence; the contact portion has a size decreasing as away from the first body portion, the contact portion is for contacting an object to be tested; the first body portion has a radial size greater than the second and third body portions; the second body portion is surround by a second concave wall and a second boundary wall; the third body portion has a radial size not greater than the second boundary wall and larger than a smallest radial size of the second concave wall; the probe assembly includes the probe head and a pipe having a portion protruding into the second concave wall, thereby achieving easy assembly and good firmness of the pipe and the probe head.

Abstract: Provided are a probe joint including a micro-electromechanical probe head and a conductive member, and a spring probe including the same. The probe head includes a docking portion extending in a radial direction to form a deformable portion; and a contact portion for contacting an object to be tested, which is located at one end of the docking portion and has a size decreasing as away from the docking portion. The conductive member has a connecting section having an extended portion surrounding to define a carrier space; and a notch which communicates with the carrier space. When assembling, the docking portion can be disposed in the carrier space, the deformable portion extends out of the connecting section through the notch. The deformable portion can be deformed and forms a deformed portion, which partially wraps the extended portion, thereby preventing the probe head from being separated from the conductive member.

Abstract: A robotic labeling system includes a package locating system and a package identification station identifying a package orientation. The robotic labeling system includes a label application station having first and second label printers and first and second label applicators. The label printers are both capable of printing a shipping label and a customer specific label. The first label applicator applies a first label (either the shipping label or the customer specific label) to a first side of the package while the second label applicator applies a second label (other of the shipping label or the customer specific label) to a second side of the package different than the first side. The printing and application of the labels is based on the orientation of the package.

Abstract: A probe head for electrical detection of semiconductor devices and a probe assembly including the same are provided. The probe head includes: a probe head body; and at least one polygon cone shaped contact portion coupled to an end face of the probe head body. The probe head body includes at least three body portions sequentially stacked and coupled axially, the second body portion has an outer diameter greater than the first and third body portions. The at least one contact portion is disposed around the periphery of the end face of the probe head body. Each contact portion has an inclined edge or inclined plane inclined upward and outward from a central portion of the probe head body and oriented to facing a central axis of the probe head body. The first body portion has a hardness greater than or equal to the at least one contact portion.

Abstract: A capacitive touch sensor is disclosed for use with input signal. The capacitive touch sensor includes a number n of input/output lines. Each of the number n of input/output lines is electrically disconnected from every other of the number n of input/output lines. Each of the number n of input/output lines is arranged to cross every other of the number n of input/output lines. Each of a number ? of positions includes one of the number n of input/output lines crossing another of the number n of input/output lines.

Abstract: A capacitive touch sensor is disclosed for use with input signal. The capacitive touch sensor includes a number n of input/output lines. Each of the number n of input/output lines is electrically disconnected from every other of the number n of input/output lines. Each of the number n of input/output lines is arranged to cross every other of the number n of input/output lines. Each of a number ? of positions includes one of the number n of input/output lines crossing another of the number n of input/output lines.