Patents by Inventor Zia Azam

Zia Azam has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for computing feature density of a chip layout
    Patent number: 7322018
    Abstract: One embodiment of the present invention provides a system that computes feature density for a number of areas within a layout by moving a window across the layout, which allows the system to identify areas in the layout that violate a design rule. During operation, the system receives a layout. Next, the system places the window at a first location in the layout. The system then computes the feature density value based on the features within the window at the first location. Next, the system determines a second location in the layout based on the first location and the feature density value. The system then moves the window to the second location. Next, the system computes the feature density value based on the features within the window at the second location.
    Type: Grant
    Filed: August 29, 2005
    Date of Patent: January 22, 2008
    Assignee: Synopsys, Inc.
    Inventors: Keith D. Rast, Zia Azam
  • Method and apparatus for computing feature density of a chip layout
    Publication number: 20060195803
    Abstract: One embodiment of the present invention provides a system that computes feature density for a number of areas within a layout by moving a window across the layout, which allows the system to identify areas in the layout that violate a design rule. During operation, the system receives a layout. Next, the system places the window at a first location in the layout. The system then computes the feature density value based on the features within the window at the first location. Next, the system determines a second location in the layout based on the first location and the feature density value. The system then moves the window to the second location. Next, the system computes the feature density value based on the features within the window at the second location.
    Type: Application
    Filed: August 29, 2005
    Publication date: August 31, 2006
    Inventors: Keith Rast, Zia Azam