Abstract: A method and an apparatus for binarizing an intra prediction mode are provided. The method includes: acquiring an intra prediction mode of a luma component; if the intra prediction mode of the luma component is one kind of prediction mode in M, modifying a value of a serial number of a prediction mode Luma Angle of a chroma component to I; sequencing all prediction modes of the chroma component according to a preset rule; and performing binarization on the modified Luma Angle, and sending the binarized Luma Angle to a decoding end. A method for coding an intra prediction mode and a method and an apparatus for decoding an intra prediction mode are further provided. According to the present invention, coding efficiency is improved.

Abstract: A device for globally measuring a thickness of a metal film (901), comprises: a base (10); a rotating unit (20) comprising a fixed member (21) fixed on the base (10) and a rotating member (22) having a rotating joint (23); a working table (50) fixed on the rotating member (22) and having a vacuum passage which is formed therein and connected with the rotating joint (23); a linear driving unit (30) including a guide rail (31) fixed on the base (10) and a sliding block (32) slidable along the guide rail (31); a cantilever beam (40) disposed horizontally and defining a first end fixed with the sliding block (32) and a second end; a measuring head (80) connected to the second end of the cantilever beam (40), facing a surface of the working table (50) and having an eddy current probe (82) disposed therein.

Abstract: A device for globally measuring a thickness of a metal film (901), comprises: a base (10); a rotating unit (20) comprising a fixed member (21) fixed on the base (10) and a rotating member (22) having a rotating joint (23); a working table (50) fixed on the rotating member (22) and having a vacuum passage which is formed therein and connected with the rotating joint (23); a linear driving unit (30) including a guide rail (31) fixed on the base (10) and a sliding block (32) slidable along the guide rail (31); a cantilever beam (40) disposed horizontally and defining a first end fixed with the sliding block (32) and a second end; a measuring head (80) connected to the second end of the cantilever beam (40), facing a surface of the working table (50) and having an eddy current probe (82) disposed therein.

Abstract: A method and an apparatus for binarizing an intra prediction mode are provided. The method includes: acquiring an intra prediction mode of a luma component; if the intra prediction mode of the luma component is one kind of prediction mode in M, modifying a value of a serial number of a prediction mode Luma Angle of a chroma component to I; sequencing all prediction modes of the chroma component according to a preset rule; and performing binarization on the modified Luma Angle, and sending the binarized Luma Angle to a decoding end. A method for coding an intra prediction mode and a method and an apparatus for decoding an intra prediction mode are further provided. According to the present invention, coding efficiency is improved.