Patents by Inventor Zsolt John Laczik

Zsolt John Laczik has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8077390
    Abstract: A method of producing an optical element that has spatial variation in refractive index includes providing a curable liquid crystal composition; applying a spatially varying electric field to the liquid crystal composition to induce a desired spatial variation in refractive index; and curing the liquid crystal composition while the electric field is still applied to fix the spatial variation in refractive index when the electric field is removed.
    Type: Grant
    Filed: August 14, 2006
    Date of Patent: December 13, 2011
    Inventor: Zsolt John Laczik
  • Publication number: 20090097116
    Abstract: A method of producing an optical element that has spatial variation in refractive index is disclosed. The method comprises: providing a curable liquid crystal composition; applying a spatially varying electric field to the liquid crystal composition to induce a desired spatial variation in refractive index; and curing the liquid crystal composition while the electric field is still applied to fix the spatial variation in refractive index when the electric field is removed.
    Type: Application
    Filed: August 14, 2006
    Publication date: April 16, 2009
    Applicant: Isis Innovation Limited
    Inventor: Zsolt John Laczik
  • Patent number: 6545764
    Abstract: Topographic analysis apparatus consists of a light source (1) and associated optics (2) for illuminating a mirrored surface O with a parallel light beam. Light reflected from the mirrored surface is collected by a camera (4) that is mounted on a moveable carriage (5) so that images of the mirrored surface O may be recorded at a plurality of different distances from the surface. The Makyoh topograms produced using this apparatus are then analyzed using phase extraction software to iteratively determine the profile of the surface of the object and the object's reflectivity. In this way Makyoh topograms may be used for quantitative as well as qualitative analysis of a reflective surface such as a semiconductor wafer.
    Type: Grant
    Filed: July 20, 2001
    Date of Patent: April 8, 2003
    Assignee: ISIS Innovation Limited
    Inventor: Zsolt John Laczik