Methods for Testing Single-Use Devices
Methods for testing single-use electrical devices (e.g., explosive detonators and initiators) are provided to ensure operating reliability of such devices when used in the field. These methods facilitate testing of non-destructible components of single-use electrical devices at operating parameters during production or anytime before field use.
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1. Field of the Invention
The present invention relates generally to testing of devices, and more particularly to methods for testing single-use electrical devices for oilfield operations.
2. Background of the Invention
Testing of single-use devices during or after production and before field use poses a particular problem. It is difficult to be certain that such a single-use device will function as intended in the field, as any definitive operational test would, by definition, leave the device unusable. For example, electrical components of explosive devices (e.g., detonators, charges, initiators, and other explosive-related single-use devices) are destroyed upon detonation, thus conventional testing techniques are inadequate to fully test such devices at operating parameters.
Presently, one approach for testing single-use devices is to take a limited sample of the completed units under production, and carry out a destructive test of this sample. Standard statistical guidelines may then provide the probability that the remaining devices outside the sample will perform satisfactorily. While providing testing of the sample devices at operational parameters, this approach will not account for unique conditions found in the remaining devices outside the sample, which may cause malfunctioning or inoperability.
Another approach for testing single-use devices is to test the components of a single-use device as thoroughly as possible but short of operational levels which may cause destruction. For example, a capacitor in an electronic circuit of an explosive detonator may be tested by applying a voltage to the device, but not one sufficiently high to trigger the detonator. The capacitor may be charged during operations to 1200-1500V, but only be charged to 1000V in the production test. Thus, a weakened capacitor that would fail at 1100V would not be detected, and may result in a field failure. Therefore, while this type of testing identifies some faults at sub-operational levels, it does not stress the system to the same extent as operational use.
Accordingly, there exists a need for methods to test single-use devices such that the devices are still operational for use in the field.
SUMMARYThe present invention relates to methods for producing and testing single-use electrical devices to ensure operating reliability of such devices when used in the field. These methods facilitate testing of non-destructible components of single-use electrical devices at operating parameters during production.
Some embodiments of the present invention include a method for testing any non-destructive components on an electrical circuit board at operating parameters during production, yet before any actual single-use components are installed. In such embodiments, any single-use components may be installed on the circuit board after the non-destructive components are tested.
Other embodiments of the present invention include a method for testing any non-destructive components on an electrical circuit board at operating parameters during production and after single-use components are installed. In such embodiments, the conductive paths connecting the single-use components to the non-destructive components are left incomplete until after the non-destructive components are tested. Once the non-destructive components are tested at operating parameters, the conductive paths between the single-use components and the non-destructive components are completed.
Other or alternative embodiments of the present invention will be apparent from the following description, from the drawings, and from the claims.
BRIEF DESCRIPTION OF THE DRAWINGSThe manner in which these objectives and other desirable characteristics can be obtained is explained in the following description and attached drawings in which:
It is to be noted, however, that the appended drawings illustrate only typical embodiments of this invention and are therefore not to be considered limiting of its scope, for the invention may admit to other equally effective embodiments.
DETAILED DESCRIPTIONIn the following description, numerous details are set forth to provide an understanding of the present invention. However, it will be understood by those skilled in the art that the present invention may be practiced without these details and that numerous variations or modifications from the described embodiments may be possible.
In the specification and appended claims: the terms “connect “connection”, “connected”, “in connection with”, and “connecting” are used to mean “in direct connection with” or “in connection with via another element”; and the term “set” is used to mean “one element” or “more than one element”. As used herein, the terms “up” and “down”, “upper” and “lower”, “upwardly” and downwardly”, “upstream” and “downstream”; “above” and “below”; and other like terms indicating relative positions above or below a given point or element are used in this description to more clearly describe some embodiments of the invention. Moreover, as used herein, the term “single-use” describes a device or component of a device that is designed to only perform a function once under operational parameters before it is rendered inoperable; and the term “non-destructive” describes a device or component that is not a single-use device or component.
A single-use device may include one or more components in electrical connection. For example, with respect to
Generally, it may be desirable to test a single-use device, like the detonator 10 of
According to another embodiment of the present invention, as shown in
With more particularity,
Still with reference to
With respect to
Although only a few exemplary embodiments of this invention have been described in detail above, those skilled in the art will readily appreciate that many modifications are possible in the exemplary embodiments without materially departing from the novel teachings and advantages of this invention. Accordingly, all such modifications are intended to be included within the scope of this invention as defined in the following claims. In the claims, means-plus-function clauses are intended to cover the structures described herein as performing the recited function and not only structural equivalents, but also equivalent structures. Thus, although a nail and a screw may not be structural equivalents in that a nail employs a cylindrical surface to secure wooden parts together, whereas a screw employs a helical surface, in the environment of fastening wooden parts, a nail and a screw may be equivalent structures. It is the express intention of the applicant not to invoke 35 U.S.C. §112, paragraph 6 for any limitations of any of the claims herein, except for those in which the claim expressly uses the words ‘means for’ together with an associated function.
Claims
1. A method for testing an electrical device having a single-use component and another component, comprising:
- testing the device; and
- electrically connecting the single-use component to the other component, wherein the testing is performed before the single-use component and the other component are electrically connected.
2. The method of claim 1, wherein electrically connecting the single-use component and the other component comprises mounting the single-use component to a circuit board having a conductive path formed between the single-use component and the other component.
3. The method of claim 1, further comprising:
- mounting the single-use component and the other component to a circuit board before the testing is performed,
- wherein electrically connecting the single-use component and the other component comprises completing a conductive path between the single-use component and the other component.
4. A method for producing an electrical device having a single-use component and at least one other component, comprising:
- providing a circuit board for receiving the single-use component and the at least one other component and a conductive path for electrically connecting the single-use component and the at least one other component;
- installing the at least one other component on the circuit board;
- installing the single-use component on the circuit board, wherein the conductive path is incomplete between the single-use component and the at least one other component;
- testing the at least one other component; and
- completing the conductive path between the single-use component and the at least one other component.
5. The method of claim 4, wherein completing the conductive path between the single-use component and the at least one other component comprises:
- applying solder between the between the single-use component and the at least one other component.
6. The method of claim 4, wherein completing the conductive path between the single-use component and the at least one other component comprises:
- connecting a wire between the single-use component and the at least one other component.
7. The method of claim 4, wherein completing the conductive path between the single-use component and the at least one other component comprises:
- mounting a resistor between the single-use component and the at least one other component.
8. The method of claim 4, wherein completing the conductive path between the single-use component and the at least one other component comprises:
- applying a conductive strip between the single-use component and the at least one other component.
9. The method of claim 4, wherein installing the components on the circuit board comprises:
- mounting the single-use component on one side of the circuit board; and mounting the at least one other component on the other side of the circuit board.
10. The method of claim 9, wherein completing the conductive path between the single-use component and the at least one other component comprises:
- forming a hole in the circuit board between the single-use component and the at least one other component; and
- filling the hole with a conductive element.
11. The method of claim 10, wherein the conductive element is solder.
12. The method of claim 10, wherein the conductive element is a pin.
13. The method of claim 4, wherein the electrical device is an explosive detonator.
14. The method of claim 13, wherein the single-use component is selected from a group consisting of an exploding foil initiator, an exploding bridge wire initiator, a semiconductor bridge initiator, and a hotwire.
15. The method of claim 13, wherein the at least one other component is selected from a group consisting of a filter, an addressable chip, a capacitor, a resistor, a transformer, a switch, and a diode.
16. The method of claim 4, wherein the electrical device is an igniter.
17. The method of claim 16, wherein the single-use component is selected from a group consisting of an exploding foil initiator, an exploding bridge wire initiator, a semiconductor bridge initiator, and a hotwire.
18. The method of claim 16, wherein the at least one other component is selected from a group consisting of a filter, an addressable chip, a capacitor, a resistor, a transformer, a switch, and a diode.
19. A method for producing an electrical device having a single-use component and a multi-use component, comprising:
- providing a circuit board having a conductive pad for receiving the single-use component, a conductive pad for receiving the multi-use component, and a conductive path for electrically connecting the conductive pad of the single-use component and the conductive pad of the multi-use component;
- installing the multi-use component on one of the conductive pads of the circuit board;
- installing the single-use component on the other conductive pad of the circuit board, wherein the conductive path is incomplete between the conductive pads;
- testing the multi-use component in a test fixture; and
- completing the conductive path between the conductive pads.
20. The method of claim 17, wherein completing the conductive path between the conductive pads comprises:
- connecting a wire between the conductive pads.
Type: Application
Filed: Dec 20, 2004
Publication Date: Jul 6, 2006
Applicant: SCHLUMBERGER TECHNOLOGY CORPORATION (Sugar Land, TX)
Inventor: David Gerez (Houston, TX)
Application Number: 10/905,176
International Classification: F42B 3/12 (20060101);