Optical device structure using GaN substrates and growth structures for laser applications
An optical device has a structured active region configured for selected wavelengths of light emissions.
Latest Soraa, Inc. Patents:
This application claims priority to U.S. Ser. No. 61/170,550, filed Apr. 17, 2009; U.S. Ser. No. 61/170,553, filed Apr. 17, 2009; U.S. Ser. No. 61/177,227, filed May 11, 2009; U.S. Ser. No. 61/243,502, filed Sep. 17, 2009; and U.S. Ser. No. 12/759,273, filed Apr. 13, 2010, each of which is commonly assigned and hereby incorporated by reference.
BACKGROUND OF THE INVENTIONThis invention is directed to optical devices and related methods. More particularly, the invention provides a method of manufacture and a device for emitting electromagnetic radiation using semipolar or non-polar gallium containing substrates such as GaN, MN, InN, InGaN, AlGaN, and AlInGaN, and others. Merely by way of example, the invention can be applied to optical devices, lasers, light emitting diodes, solar cells, photoelectrochemical water splitting and hydrogen generation, photodetectors, integrated circuits, and transistors, among other devices.
In the late 1800's, Thomas Edison invented the light bulb. The conventional light bulb, commonly called the “Edison bulb,” has been used for over one hundred years for a variety of applications including lighting and displays. The conventional light bulb uses a tungsten filament enclosed in a glass bulb sealed in a base, which is screwed into a socket. The socket is coupled to an AC or DC power source. The conventional light bulb can be found commonly in houses, buildings, and outdoor lightings, and other areas requiring light or displays.
Unfortunately, drawbacks exist with the conventional Edison light bulb. First, the conventional light bulb dissipates much thermal energy. More than 90% of the energy used for the conventional light bulb dissipates as thermal energy. Second, reliability is less than desired—the conventional light bulb routinely fails due to thermal expansion and contraction of the filament element. In addition, conventional light bulbs emit light over a broad spectrum, much of which does not result in illumination at wavelengths of spectral sensitivity to the human eye. Finally, conventional light bulbs emit light in all directions. They therefore are not ideal for applications requiring strong directionality or focus, such as projection displays, optical data storage, or specialized directed lighting.
In 1960, the laser was first demonstrated by Theodore H. Maiman at Hughes Research Laboratories in Malibu. This laser utilized a solid-state flashlamp-pumped synthetic ruby crystal to produce red laser light at 694 nm. By 1964, blue and green laser output was demonstrated by William Bridges at Hughes Aircraft utilizing a gas Argon ion laser. The Ar-ion laser utilized a noble gas as the active medium and produced laser light output in the UV, blue, and green wavelengths including 351 nm, 454.6 nm, 457.9 nm, 465.8 nm, 476.5 nm, 488.0 nm, 496.5 nm, 501.7 nm, 514.5 nm, and 528.7 nm. The Ar-ion laser had the benefit of producing highly directional and focusable light with a narrow spectral output, but the wall plug efficiency was less than 0.1%. The size, weight, and cost of the laser was undesirable as well.
As laser technology evolved, more efficient lamp pumped solid state laser designs were developed for the red and infrared wavelengths, but these technologies remained a challenge for blue and green lasers. As a result, lamp pumped solid state lasers were developed in the infrared, and the output wavelength was converted to the visible using specialty crystals with nonlinear optical properties. A green lamp pumped solid state laser had 3 stages: electricity powers lamp, lamp excites gain crystal which lases at 1064 nm, 1064 nm goes into frequency conversion crystal which converts to visible 532 nm. The resulting green and blue lasers were called “lamped pumped solid state lasers with second harmonic generation” (LPSS with SHG). These had wall plug efficiency of ˜1%, and were more efficient than Ar-ion gas lasers, but were still too inefficient, large, expensive, and fragile for broad deployment outside of specialty scientific and medical applications. Additionally, the gain crystal used in the solid state lasers typically had energy storage properties which made the lasers difficult to modulate at high speeds, limiting broader deployment.
To improve the efficiency of these visible lasers, high power diode (or semiconductor) lasers were utilized. These “diode pumped solid state lasers with SHG” (DPSS with SHG) had 3 stages: electricity powers 808 nm diode laser, 808 nm excites gain crystal which lases at 1064 nm, 1064 nm goes into frequency conversion crystal which converts to visible 532 nm. The DPSS laser technology extended the life and improved the wall plug efficiency of the LPSS lasers to 5-10%. This sparked further commercialization into specialty industrial, medical, and scientific applications. The change to diode pumping, however, increased the system cost and required precise temperature controls, leaving the laser with substantial size and power consumption. The result did not address the energy storage properties which made the lasers difficult to modulate at high speeds.
As high power laser diodes evolved and new specialty SHG crystals were developed, it became possible to directly convert the output of the infrared diode laser to produce blue and green laser light output. These “directly doubled diode lasers” or SHG diode lasers had 2 stages: electricity powers 1064 nm semiconductor laser, 1064 nm goes into frequency conversion crystal which converts to visible 532 nm green light. These lasers designs are intended to provide improved efficiency, cost and size compared to DPSS-SHG lasers, but the specialty diodes and crystals required make this challenging today. Additionally, while the diode-SHG lasers have the benefit of being directly modulated, they suffer from sensitivity to temperature which limits their application.
BRIEF SUMMARY OF THE INVENTIONThis invention provides a manufacturing method and a device for emitting electromagnetic radiation using semipolar or non-polar gallium containing substrates such as GaN, MN, InN, InGaN, AlGaN, and AlInGaN, and others. Merely by way of example, the invention can be applied to optical devices, lasers, light emitting diodes, solar cells, photoelectrochemical water splitting and hydrogen generation, photodetectors, integrated circuits, and transistors, among other devices.
This invention provides an optical device which includes a gallium nitride substrate having a semipolar or nonpolar crystalline surface region. The device also has an n-type GaN cladding layer overlying the substrate surface. In a preferred embodiment, the n-type GaN cladding layer has a thickness from 100 nm to 3000 nm with a silicon doping level of 5E17 to 3E18 cm-3. The device has an n-side SCH layer overlying the n-type GaN cladding layer. Preferably, the n-side SCH layer is comprised of InGaN with molar fraction of indium of between 3% and 5% and has a thickness from 40 to 60 nm. The optical device also has a multiple quantum well active region overlying the n-side SCH layer. Preferably, the multiple quantum well active region is comprised of seven 4.5-5.5 nm InGaN quantum wells separated by eight 4.5-5.5 nm GaN barriers. preferably the optical device has a p-side guide layer overlying the multiple quantum well active region. In a preferred embodiment, the p-side guide layer comprises GaN and has a thickness from 40 nm to 50 nm. The optical device has an electron blocking layer overlying the p-side guide layer. Preferably, the electron blocking layer comprises a magnesium doped AlGaN layer with molar fraction of aluminum of between 15% and 22% at a thickness from 10 nm to 15 nm. Preferably the optical device also has a p-GaN cladding layer overlying the electronic blocking layer. The p-GaN cladding layer has a thickness from 400 nm to 1000 nm with a magnesium doping level of 5E17 cm-3 to 1E19 cm-3 according to one or more embodiments. The device also has a p++-GaN contact layer overlying the p-GaN layer. The P++-GaN layer typically has a thickness from 20 nm to 40 nm with a Mg doping level of 1E20 cm-3 to 1E21 cm-3.
The present invention enables a cost-effective optical device for laser applications. In a specific embodiment, the optical device can be manufactured in a relatively simple and cost effective manner. Depending upon the embodiment, the present apparatus and method can be manufactured using conventional materials and/or methods. The laser device uses a semipolar or non-polar gallium nitride material capable of providing green laser light. In some embodiments, the laser is capable of emitting long wavelengths, for example, those ranging from about 470 nm to greater than about 530 nm, as well as others. A further understanding of the nature and advantages of the present invention may be appreciated by reference to the following portions of the specification and the accompanying drawings.
According to the present invention, techniques related generally to optical devices are provided. More particularly, the present invention provides a method and device for emitting electromagnetic radiation using semipolar or non-polar gallium containing substrates such as GaN, MN, InN, InGaN, AlGaN, and AlInGaN, and others. Merely by way of example, the invention can be applied to optical devices, lasers, light emitting diodes, solar cells, photoelectrochemical water splitting and hydrogen generation, photodetectors, integrated circuits, and transistors, among other devices. In a specific embodiment, the present laser device can be employed in either a semipolar or non-polar gallium containing substrate, as described below.
In a specific embodiment on semipolar GaN, the device has a laser stripe region formed overlying a portion of the semi polar crystalline orientation surface region. In a specific semipolar GaN embodiment, the laser stripe region is characterized by a cavity orientation is substantially parallel to the m-direction. In a specific embodiment, the laser strip region has a first end 107 and a second end 109.
In a specific embodiment on nonpolar GaN, the device has a laser stripe region formed overlying a portion of the semi or non-polar crystalline orientation surface region, as illustrated by
In a preferred semipolar embodiment, the device has a first cleaved m-face facet provided on the first end of the laser stripe region and a second cleaved m-face facet provided on the second end of the laser stripe region. The first cleaved m-facet is substantially parallel with the second cleaved m-facet. In a specific embodiment, the semipolar substrate is configured on (11-22) series of planes, enabling the formation of m-facets for laser cavities oriented in the m-direction. Mirror surfaces are formed on each of the cleaved surfaces. The first cleaved m-facet comprises a first mirror surface, typically provided by a scribing and breaking process. The scribing process can use any suitable technique, such as a diamond scribe or laser scribe or combinations. In a specific embodiment, the first mirror surface comprises a reflective coating. The reflective coating is selected from silicon dioxide, hafnia, and titaniatantalum pentoxidezirconia, including combinations, and the like. Depending upon the embodiment, the first mirror surface can be provided by an anti-reflective coating. Of course, there can be other variations, modifications, and alternatives.
In a preferred nonpolar embodiment, the device has a first cleaved c-face facet provided on the first end of the laser stripe region and a second cleaved c-face facet provided on the second end of the laser stripe region. In one or more embodiments, the first cleaved c-facet is substantially parallel with the second cleaved c-facet. In a specific embodiment, the nonpolar substrate is configured on (10-10) series of planes, which enables the formation of c-facets for laser cavities oriented in the c-direction. Mirror surfaces are formed on each of the cleaved surfaces. The first cleaved c-facet comprises a first mirror surface. In a preferred embodiment, the first mirror surface is provided by a scribing and breaking process. The scribing process can use any suitable techniques, such as a diamond scribe or laser scribe or combinations. In a specific embodiment, the first mirror surface comprises a reflective coating. The reflective coating is selected from silicon dioxide, hafnia, and titaniatantalum pentoxidezirconia, including combinations, and the like. Depending upon the embodiment, the first mirror surface can also comprise an anti-reflective coating. Of course, there can be other variations, modifications, and alternatives.
Also in a preferred semipolar embodiment, the second cleaved m-facet comprises a second mirror surface. The second mirror surface can be provided by a scribing and breaking process. Preferably, the scribing is performed by diamond or laser scribing. In a specific embodiment, the second mirror surface comprises a reflective coating, such as silicon dioxide, hafnia, and titaniatantalum pentoxidezirconia, combinations, and the like. In a specific embodiment, the second mirror surface comprises an anti-reflective coating. Of course, there can be other variations, modifications, and alternatives.
Also in a preferred nonpolar embodiment, the second cleaved c-facet comprises a second mirror surface. The second mirror surface can be provided by a scribing and breaking process, for example, diamond or laser scribing or the like. In a specific embodiment, the second mirror surface comprises a reflective coating, such as silicon dioxide, hafnia, and titaniatantalum pentoxidezirconia, combinations, and the like. In a specific embodiment, the second mirror surface comprises an anti-reflective coating. Of course, there can be other variations, modifications, and alternatives.
In a specific embodiment, the laser stripe has a length and width. The length ranges from about 50 microns to about 3000 microns. The strip also has a width ranging from about 0.5 microns to about 50 microns, but can be other dimensions. In a specific embodiment, the width is substantially constant in dimension, although there may be slight variations. The width and length are often formed using a masking and etching process, such as commonly used in the art.
In a specific semipolar embodiment, the device is also characterized by a spontaneously emitted light that is polarized in substantially parallel to the projection of the c-direction. That is, the device performs as a laser or the like. In a preferred embodiment, the spontaneously emitted light is characterized by a polarization ratio of greater than about 0.2 and less than about 1 parallel to the projection of the c-direction. In a preferred embodiment, the spontaneously emitted light is characterized by a wavelength ranging from about 500 to about 580 nanometers to yield a green laser. The spontaneously emitted light is highly polarized and is characterized by a polarization ratio parallel to the projection of the c-direction of greater than 0.4. Of course, there can be other variations, modifications, and alternatives.
In a specific nonpolar embodiment, the device is also characterized by a spontaneously emitted light that is polarized parallel to the a-direction. That is, the device performs as a laser or the like. In a preferred embodiment, the spontaneously emitted light is characterized by a polarization ratio of greater than about 0.1 and less than about 1 parallel to the projection of the c-direction. In a preferred embodiment, the spontaneously emitted light characterized by a wavelength ranging from about 475 to about 530 nanometers to yield a blue-green or green laser and others and the spontaneously emitted light is highly polarized and is characterized by a polarization ratio parallel to the a-direction of greater than 0.5. Of course, there can be other variations, modifications, and alternatives.
In a specific embodiment, the device also has an overlying n-type gallium nitride layer 205, an active region 207, and an overlying p-type gallium nitride layer structured as a laser stripe region 211. In a specific embodiment, each of these regions is formed using an epitaxial deposition technique of metal organic chemical vapor deposition (MOCVD), molecular beam epitaxy (MBE), or other epitaxial growth techniques suitable for GaN growth. In a specific embodiment, the epitaxial layer is a high quality epitaxial layer overlying the n-type gallium nitride layer. In some embodiments the high quality layer is doped, for example, with Si or O to form n-type material, with a dopant concentration between about 1016 cm−3 and 1020 cm−3.
In a specific embodiment, an n-type AluInvGa1-u-vN layer, where 0≦u, v, u+v≦1, is deposited on the substrate. In a specific embodiment, the carrier concentration may lie in the range between about 1016 cm−3 and 1020 cm−3. The deposition may be performed using metalorganic chemical vapor deposition (MOCVD) or molecular beam epitaxy (MBE).
As an example, the bulk GaN substrate is placed on a susceptor in an MOCVD reactor. After closing, evacuating, and back-filling the reactor (or using a load lock configuration) to atmospheric pressure, the susceptor is heated to a temperature between about 1000 and about 1200 degrees Celsius in the presence of a nitrogen-containing gas. In one specific embodiment, the susceptor is heated to approximately 1100 degrees Celsius under flowing ammonia. A flow of a gallium-containing metalorganic precursor, such as trimethylgallium (TMG) or triethylgallium (TEG) is initiated, in a carrier gas, at a total rate between approximately 1 and 50 standard cubic centimeters per minute (sccm). The carrier gas may comprise hydrogen, helium, nitrogen, or argon. The ratio of the flow rate of the group V precursor (ammonia) to that of the group III precursor (trimethylgallium, triethylgallium, trimethylindium, trimethylaluminum) during growth is between about 2000 and about 12000. A flow of disilane in a carrier gas, with a total flow rate of between about 0.1 and 10 sccm, is initiated.
In a specific embodiment, the laser stripe region is made of the p-type gallium nitride layer 211. In a specific embodiment, the laser stripe is provided by an etching process selected from dry etching or wet etching. In a preferred embodiment, the etching process is dry, but other processes can be used. As an example, the dry etching process is an inductively coupled process using chlorine bearing species or a reactive ion etching process using similar chemistries. The chlorine bearing species are commonly derived from chlorine gas or the like. The device also has an overlying dielectric region, which exposes 213 contact region. In a specific embodiment, the dielectric region is an oxide such as silicon dioxide or silicon nitride. The contact region is coupled to an overlying metal layer 215. The overlying metal layer is a multilayered structure containing gold and platinum (Pt/Au), but can be others.
In a specific embodiment, the laser device has active region 207. The active region can include one to twenty quantum well regions according to one or more embodiments. As an example following deposition of the n-type AluInvGa1-u-vN layer for a predetermined period of time, so as to achieve a predetermined thickness, an active layer is deposited. The active layer may comprise a single quantum well or a multiple quantum well, with 1-20 quantum wells. The quantum wells may comprise InGaN wells and GaN barrier layers. In other embodiments, the well layers and barrier layers comprise AlwInxGa1-w-xN and AlyInzGa1-y-zN, respectively, where 0≦w, x, y, z, w+x, y+z≦1, where w<u, y and/or x>v, z so that the bandgap of the well layer(s) is less than that of the barrier layer(s) and the n-type layer. The well layers and barrier layers may each have a thickness between about 1 nm and about 40 nm. In another embodiment, the active layer comprises a double heterostructure, with an InGaN or AlwInxGa1-w-xN layer about 10 nm to 100 nm thick surrounded by GaN or AlyInzGa1-y-zN layers, where w<u, y and/or x>v, z. The composition and structure of the active layer are chosen to provide light emission at a preselected wavelength. The active layer may be left undoped (or unintentionally doped) or may be doped n-type or p-type.
In a specific embodiment, the active region can also include an electron blocking region, and a separate confinement heterostructure. In some embodiments, an electron blocking layer is preferably deposited. The electron-blocking layer may comprise AlsIntGa1-s-tN, where 0≦s, t, s+t≦1, with a higher bandgap than the active layer, and may be doped p-type. In one specific embodiment, the electron blocking layer comprises AlGaN. In another embodiment, the electron blocking layer comprises an AlGaN/GaN super-lattice structure, comprising alternating layers of AlGaN and GaN, each with a thickness between about 0.2 nm and about 5 nm.
As noted, the p-type gallium nitride structure, which can be a p-type doped AlqInrGa1-q-rN, where 0≦q, r, q+r≦1, layer is deposited above the active layer. The p-type layer may be doped with Mg, to a level between about 1016 cm−3 and 1022 cm−3, and may have a thickness between about 5 nm and about 1000 nm. The outermost 1-50 nm of the p-type layer may be doped more heavily than the rest of the layer, so as to enable an improved electrical contact. In a specific embodiment, the laser stripe is provided by a dry etching process, but wet etching may also be used. The device also has an overlying dielectric region, which exposes contact region 213. In a specific embodiment, the dielectric region is an oxide such as silicon dioxide.
In a specific embodiment, the metal contact is made of suitable material. The reflective electrical contact may comprise at least one of silver, gold, aluminum, nickel, platinum, rhodium, palladium, chromium, or the like. The electrical contact may be deposited by thermal evaporation, electron beam evaporation, electroplating, sputtering, or another suitable technique. In a preferred embodiment, the electrical contact serves as a p-type electrode for the optical device. In another embodiment, the electrical contact serves as an n-type electrode for the optical device. Of course, there can be other variations, modifications, and alternatives. Further details of the cleaved facets appear below.
In a preferred embodiment, the growth structure is configured using between 3 and 5 or 5 and 7 quantum wells positioned between n-type GaN and p-type GaN cladding layers. In a specific embodiment, the n-type GaN cladding layer ranges in thickness from 500 nm to 2000 nm and has an n-type dopant such as Si with a doping level of between 1E18 cm-3 and 3E18 cm-3. In a specific embodiment, the p-type GaN cladding layer ranges in thickness from 500 nm to 1000 nm and has a p-type dopant such as Mg with a doping level of between lEl7 cm-3 and 5E19 cm-3. In a specific embodiment, the Mg doping level is graded such that the concentration would be lower in the region closer to the quantum wells.
In a specific preferred embodiment, the quantum wells have a thickness of between 3 nm and 5.5 nm or 5.5 nm and 8 nm, but can be others. In a specific embodiment, the quantum wells would be separated by barrier layers with thicknesses between 4 nm and 8 nm or 8 nm and 12 nm. The quantum wells and the barriers together comprise a multiple quantum well (MQW) region.
In a preferred embodiment, the device has barrier layers formed from GaN or InGaN. In a specific embodiment using InGaN, the indium contents range from 1% to 5% (molar percent).
An InGaN separate confinement hetereostructure layer (SCH) could be positioned between the n-type GaN cladding and the MQW region according to one or more embodiments. Typically, such separate confinement layer is commonly called the n-side SCH. The n-side SCH layer ranges in thickness from 10 nm to 50 nm or 50 nm to 100 nm and ranges in indium composition from 1% to 7% (mole percent), but can be others. In a specific embodiment, the n-side SCH layer may or may not be doped with an n-type dopant such as Si.
In yet another preferred embodiment, an InGaN separate confinement hetereostructure layer (SCH) is positioned between the p-type GaN cladding and the MQW region, which is called the p-side SCH. In a specific embodiment, the p-side SCH layer ranges in thickness from 10 nm to 50 nm or 50 nm to 100 nm and ranges in indium composition from 1% to 7% (mole percent), but can be others. The p-side SCH layer may or may not be doped with a p-type dopant such as Mg. In another embodiment, the structure would contain both an n-side SCH and a p-sideSCH.
In a specific preferred embodiment, an AlGaN electron blocking layer, with an aluminum content of between 14% and 22% (mole percent), is positioned between the MQW and the p-type GaN cladding layer either within the p-side SCH or between the p-side SCH and the p-type GaN cladding. The AlGaN electron blocking layer ranges in thickness from 10 nm to 20 nm and is doped with a p-type dopant such as Mg from 1E18 cm-3 and 1E20 cm-3 according to a specific embodiment.
Preferably, a p-contact layer positioned on top of and is formed overlying the p-type cladding layer. The p-contact layer would be comprised of GaN doped with a p-dopant such as Mg at a level ranging from 1E20 cm-3 to 1E22 cm-3.
Several more detailed embodiments, not intended to limit the scope of the claims, are described below.
EMBODIMENT AIn a specific embodiment, the present invention provides a laser device capable of emitting 474 nm and also 485 nm or 470 nm to 490 nm wavelength light. The device is provided with one or more of the following elements, as also referenced in
n-GaN cladding layer with a thickness from 100 nm to 3000 nm with Si doping level of 5E17 to 3E18 cm-3
n-side SCH layer comprised of InGaN with molar fraction of indium of between 3% and 5% and thickness from 45 to 65 nm.
Multiple quantum well active region layers comprised of five 4.5-5.5 nm InGaN quantum wells separated by six 4.5-5.5 nm GaN barriers
p-side SCH layer comprised of InGaN with molar fraction of indium of between 3% and 5% and thickness from 45 nm to 65 nm
Electron blocking layer comprised of AlGaN with molar fraction of aluminum of between 15% and 22% and thickness from 10 nm to 15 nm and doped with Mg
p-GaN cladding layer with a thickness from 400 nm to 1000 nm with Mg doping level of 5E17 cm-3 to 1E19 cm-3
p++-GaN contact layer with a thickness from 20 nm to 40 nm with Mg doping level of 1E20 cm-3 to 1E21 cm-3
In a specific embodiment, the above laser device is fabricated on a nonpolar oriented surface region. Preferably, the 474 nm configured laser device uses a nonpolar (10-10) substrate with a miscut or off cut of −0.3 to 0.3 degrees towards (0001) and −0.3 to 0.3 degrees towards (11-20). In a specific embodiment, the n-GaN/p-GaN is grown using an N2 subflow and N2 carrier gas.
EMBODIMENT BIn yet an alternative specific embodiment, the present invention provides a laser device capable of emitting 486 nm wavelength light, among others, in a ridge laser embodiment. The device is provided with one or more of the following elements, as also referenced in
n-GaN cladding layer with a thickness from 100 nm to 3000 nm with Si doping level of 5E17 to 3E18 cm-3
n-side SCH layer comprised of InGaN with molar fraction of indium of between 3% and 5% and thickness from 40 to 60 nm.
Multiple quantum well active region layers comprised of seven 4.5-5.5 nm InGaN quantum wells separated by eight 4.5-5.5 nm GaN barriers
p-side guide layer comprised of GaN with a thickness from 40 nm to 50 nm.
Electron blocking layer comprised of AlGaN with molar fraction of aluminum of between 15% and 22% and thickness from 10 nm to 15 nm and doped with Mg.
p-GaN cladding layer with a thickness from 400 nm to 1000 nm with Mg doping level of 5E17 cm-3 to 1E19 cm-3
p++-GaN contact layer with a thickness from 20 nm to 40 nm with Mg doping level of 1E20 cm-3 to 1E21 cm-3
In a specific embodiment, the laser device is fabricated on a non-polar (10-10) oriented surface region (m-plane). In a preferred embodiment, the non-polar substrate has a miscut or off cut of −0.8 to −1.2 degrees towards (0001) and −0.3 to 0.3 degrees towards (11-20). In a specific embodiment, the non-polar oriented surface region has an overlying n-GaN/p-GaN grown with H2/N2 subflow and H2 carrier gas.
EMBODIMENT CIn a specific embodiment, the present invention provides an alternative device structure capable of emitting 481 nm light, among others, in a ridge laser embodiment. The device is provided with one or more of the following elements, as also referenced in
n-GaN cladding layer with a thickness from 100 nm to 3000 nm with Si doping level of 5E17 to 3E18 cm-3
n-side SCH layer comprised of InGaN with molar fraction of indium of between 4% and 6% and thickness from 45 to 60 nm
Multiple quantum well active region layers comprised of five 4.5-5.5 nm InGaN quantum wells separated by four 9.5-10.5 nm InGaN barriers with an indium molar fraction of between 1.5% and 3%
p-side guide layer comprised of GaN with molar a thickness from 10 nm to 20 nm.
Electron blocking layer comprised of AlGaN with molar fraction of aluminum of between 15% and 22% and thickness from 10 nm to 15 nm and doped with Mg.
p-GaN cladding layer with a thickness from 400 nm to 1000 nm with Mg doping level of 5E17 cm-3 to 1E19 cm-3
p++-GaN contact layer with a thickness from 20 nm to 40 nm with Mg doping level of 1E20 cm-3 to 1E21 cm-3
In a specific embodiment, the laser device is fabricated on a non-polar oriented surface region (m-plane). In a preferred embodiment, the non-polar substrate has a miscut or off cut of −0.8 to −1.2 degrees towards (0001) and −0.3 to 0.3 degrees towards (11-20). In a specific embodiment, the non-polar oriented surface region has an overlying n-GaN/p-GaN grown with H2/N2 subflow and H2 carrier gas.
EMBODIMENT DIn a specific embodiment, the present invention provides an alternative device structure capable of emitting 501 nm light in a ridge laser embodiment. The device is provided with one or more of the following elements, as also referenced in
n-GaN cladding layer with a thickness from 100 nm to 3000 nm with Si doping level of 5E17 to 3E18 cm-3
n-side SCH layer comprised of InGaN with molar fraction of indium of between 3% and 7% and thickness from 40 to 60 nm
Multiple quantum well active region layers comprised of seven 3.5-4.5 nm InGaN quantum wells separated by eight 9.5-10.5 nm GaN barriers
p-side SCH layer comprised of InGaN with molar a fraction of indium of between 2% and 5% and a thickness from 15 nm to 25 nm.
Electron blocking layer comprised of AlGaN with molar fraction of aluminum of between 15% and 22% and thickness from 10 nm to 15 nm and doped with Mg.
p-GaN cladding layer with a thickness from 400 nm to 1000 nm with Mg doping level of 5E17 cm-3 to 1E19 cm-3
p++-GaN contact layer with a thickness from 20 nm to 40 nm with Mg doping level of 1E20 cm-3 to 1E21 cm-3
In a specific embodiment, the laser device is fabricated on a non-polar (10-10) oriented surface region (m-plane). In a preferred embodiment, the non-polar substrate has a miscut or off cut of −0.8 to −1.2 degrees towards (0001) and −0.3 to 0.3 degrees towards (11-20). In a specific embodiment, the non-polar oriented surface region has an overlying n-GaN/p-GaN grown with H2/N2 subflow and H2 carrier gas. In a preferred embodiment, the laser device configured for a 500 nm laser uses well regions and barriers fabricated using slow growth rates of between 0.3 and 0.6 angstroms per second, but can be others. In a specific embodiment, the slow growth rate is believed to maintain the quality of the InGaN at longer wavelengths.
While the above has been a full description of the specific embodiments, various modifications, alternative constructions and equivalents can be used. Therefore, the above description and illustrations should not be taken as limiting the scope of the present invention which is defined by the appended claims.
Claims
1. An optical device consisting of:
- a gallium nitride substrate member having a semipolar or nonpolar crystalline surface region;
- an n-type GaN cladding layer overlying the surface region, the n-type GaN cladding layer having a thickness from 100 nm to 3000 nm with a silicon doping level of 5E17 cm-3 to 3E18 cm-3;
- an n-side SCH layer overlying the n-type GaN cladding layer, the n-side SCH layer comprised of InGaN with molar fraction of indium of between 3% and 5% and having a thickness from 40 nm to 60 nm;
- a multiple quantum well active region overlying the n-side SCH layer, the multiple quantum well active region comprised of seven 4.5 nm to 5.5 nm InGaN quantum wells separated by eight 4.5 nm to 5.5 nm GaN barriers;
- a p-side guide layer overlying the multiple quantum well active region, the p-side guide layer comprised of GaN and having a thickness from 40 nm to 50 nm;
- an electron blocking layer overlying the p-side guide layer, the electron blocking layer comprised of AlGaN with molar fraction of aluminum of between 15% and 22% and having a thickness from 10 nm to 15 nm and doped with magnesium;
- a p-GaN cladding layer overlying the electronic blocking layer, the p-GaN cladding layer having a thickness from 400 nm to 1000 nm with a magnesium doping level of 5E17 cm-3 to 1E19 cm-3; and
- a p++-GaN contact layer overlying the p-GaN layer, the P++-GaN contact layer having a thickness from 20 nm to 40 nm with Mg doping level of 1E20 cm-3 to 1E21 cm-3.
4341592 | July 27, 1982 | Shortes et al. |
4860687 | August 29, 1989 | Frijlink |
5334277 | August 2, 1994 | Nakamura |
5366953 | November 22, 1994 | Char et al. |
5527417 | June 18, 1996 | Lida et al. |
5607899 | March 4, 1997 | Yoshida et al. |
5632812 | May 27, 1997 | Hirabayashi |
5696389 | December 9, 1997 | Ishikawa et al. |
5821555 | October 13, 1998 | Saito et al. |
5888907 | March 30, 1999 | Tomoyasu et al. |
5926493 | July 20, 1999 | O'Brien et al. |
6069394 | May 30, 2000 | Hashimoto et al. |
6147953 | November 14, 2000 | Duncan |
6153010 | November 28, 2000 | Kiyoku et al. |
6379985 | April 30, 2002 | Cervantes et al. |
6451157 | September 17, 2002 | Hubacek |
6586762 | July 1, 2003 | Kozaki |
6680959 | January 20, 2004 | Tanabe et al. |
6734461 | May 11, 2004 | Shiomi et al. |
6755932 | June 29, 2004 | Masuda et al. |
6814811 | November 9, 2004 | Ose |
6833564 | December 21, 2004 | Shen et al. |
6858081 | February 22, 2005 | Biwa et al. |
6920166 | July 19, 2005 | Akasaka et al. |
7053413 | May 30, 2006 | D'Evelyn et al. |
7063741 | June 20, 2006 | D'Evelyn |
7220324 | May 22, 2007 | Baker et al. |
7303630 | December 4, 2007 | Motoki et al. |
7312156 | December 25, 2007 | Granneman et al. |
7323723 | January 29, 2008 | Ohtsuka et al. |
7338828 | March 4, 2008 | Imer et al. |
7390359 | June 24, 2008 | Miyanaga et al. |
7470555 | December 30, 2008 | Matsumura |
7489441 | February 10, 2009 | Scheible et al. |
7555025 | June 30, 2009 | Yoshida |
7727332 | June 1, 2010 | Habel et al. |
7749326 | July 6, 2010 | Kim et al. |
7806078 | October 5, 2010 | Yoshida |
7968864 | June 28, 2011 | Akita et al. |
8017932 | September 13, 2011 | Okamoto et al. |
20020050488 | May 2, 2002 | Nikitin et al. |
20020085603 | July 4, 2002 | Okumura |
20030000453 | January 2, 2003 | Unno et al. |
20030001238 | January 2, 2003 | Ban |
20030012243 | January 16, 2003 | Okumura |
20030020087 | January 30, 2003 | Goto et al. |
20030140846 | July 31, 2003 | Biwa et al. |
20030216011 | November 20, 2003 | Nakamura et al. |
20040025787 | February 12, 2004 | Selbrede et al. |
20040060518 | April 1, 2004 | Nakamura et al. |
20040151222 | August 5, 2004 | Sekine |
20040196877 | October 7, 2004 | Kawakami et al. |
20050040384 | February 24, 2005 | Tanaka et al. |
20050072986 | April 7, 2005 | Sasaoka |
20050168564 | August 4, 2005 | Kawaguchi et al. |
20050224826 | October 13, 2005 | Keuper et al. |
20050229855 | October 20, 2005 | Raaijmakers |
20060037529 | February 23, 2006 | D'Evelyn |
20060060131 | March 23, 2006 | Atanackovic |
20060078022 | April 13, 2006 | Kozaki et al. |
20060079082 | April 13, 2006 | Bruhns et al. |
20060086319 | April 27, 2006 | Kasai et al. |
20060118799 | June 8, 2006 | D'Evelyn et al. |
20060144334 | July 6, 2006 | Yim et al. |
20060189098 | August 24, 2006 | Edmond |
20060193359 | August 31, 2006 | Kuramoto |
20060216416 | September 28, 2006 | Sumakeris et al. |
20060256482 | November 16, 2006 | Araki et al. |
20060288928 | December 28, 2006 | Eom et al. |
20070110112 | May 17, 2007 | Sugiura |
20070217462 | September 20, 2007 | Yamasaki |
20080087919 | April 17, 2008 | Tysoe et al. |
20080092812 | April 24, 2008 | McDiarmid et al. |
20080095492 | April 24, 2008 | Son et al. |
20080124817 | May 29, 2008 | Bour et al. |
20080164578 | July 10, 2008 | Tanikella et al. |
20080173735 | July 24, 2008 | Mitrovic et al. |
20080191192 | August 14, 2008 | Feezle et al. |
20080191223 | August 14, 2008 | Nakamura et al. |
20080217745 | September 11, 2008 | Miyanaga et al. |
20080232416 | September 25, 2008 | Okamoto et al. |
20080285609 | November 20, 2008 | Ohta et al. |
20080291961 | November 27, 2008 | Kamikawa et al. |
20080303033 | December 11, 2008 | Brandes |
20080315179 | December 25, 2008 | Kim et al. |
20090058532 | March 5, 2009 | Kikkawa et al. |
20090078944 | March 26, 2009 | Kubota et al. |
20090081857 | March 26, 2009 | Hanser et al. |
20090141765 | June 4, 2009 | Kohda et al. |
20090159869 | June 25, 2009 | Ponce et al. |
20090229519 | September 17, 2009 | Saitoh |
20090250686 | October 8, 2009 | Sato et al. |
20090267100 | October 29, 2009 | Miyake et al. |
20090301387 | December 10, 2009 | D'Evelyn |
20090301388 | December 10, 2009 | D'Evelyn |
20090309110 | December 17, 2009 | Raring et al. |
20090309127 | December 17, 2009 | Raring et al. |
20090320744 | December 31, 2009 | D'Evelyn |
20100001300 | January 7, 2010 | Raring et al. |
20100003492 | January 7, 2010 | D'Evelyn |
20100006873 | January 14, 2010 | Raring et al. |
20100025656 | February 4, 2010 | Raring et al. |
20100031875 | February 11, 2010 | D'Evelyn |
20100096615 | April 22, 2010 | Okamoto et al. |
20100140745 | June 10, 2010 | Khan et al. |
20100151194 | June 17, 2010 | D'Evelyn |
20100295054 | November 25, 2010 | Okamoto et al. |
20100302464 | December 2, 2010 | Raring |
20100316075 | December 16, 2010 | Raring et al. |
20110056429 | March 10, 2011 | Raring et al. |
20110057167 | March 10, 2011 | Ueno et al. |
20110064100 | March 17, 2011 | Raring et al. |
20110064101 | March 17, 2011 | Raring et al. |
20110064102 | March 17, 2011 | Raring et al. |
20110103418 | May 5, 2011 | Hardy et al. |
20110180781 | July 28, 2011 | Raring et al. |
20110186874 | August 4, 2011 | Shum |
20110186887 | August 4, 2011 | Trottier et al. |
20110247556 | October 13, 2011 | Raring et al. |
2007-173467 | July 2007 | JP |
- Lin et al. ( Influence of Separate Confinement Heterostructure Layer on Carrier Distribution in InGaAsP Laser Diodes with Nonidentical Multiple Quantum Wells; Lin et al, Japanese Jouranal of Appliedd Physics, vol. 43, No. 10, 2004, pp. 7032-7035).
- Zhong et al. (Demonstration of high power blue-green light emitting diode on semipolar (1122 bul GaN substrate, Electronics Letters, Jul. 19, 2007, vol. 43, No. 15).
- Lin et al. ( Influence of Separate Confinement Heterostructure Layer on Carrier Distribution in InGaAsP Laser Diodes with Nonidentical Multiple Quantum Wells; Lin et al, Japanese Jouranal of Appliedd Physics, vol. 43, No. 10, 2004, pp. 7032-7035.
- Zhong et al. (Demonstration of high power blue-green light emitting diode on semipolar (1122) bulk GaN substrate, Electronics Letters, Jul. 19, 2007, vol. 43, No. 15).
- U.S. Appl. No. 12/942,817, filed Nov. 9, 2010, Pfister et al.
- U.S. Appl. No. 12/963,238, filed Sep. 20, 2010, Raring et al.
- U.S. Appl. No. 12/880,803, filed Sep. 13, 2010, Raring et al.
- U.S. Appl. No. 12/880,889, filed Sep. 13, 2010, Raring et al.
- U.S. Appl. No. 12/749,466, filed Mar. 29, 2010, Raring et al.
- U.S. Appl. No. 12/749,476, filed Mar. 29, 2010, Poblenz et al.
- U.S. Appl. No. 12/727,148, filed Mar. 18, 2010, Raring.
- U.S. Appl. No. 12/573,820, filed Oct. 5, 2009, Raring et al.
- U.S. Appl. No. 12/502,382, filed Jul. 14, 2009, Raring et al.
- U.S. Appl. No. 12/502,058, filed Jul. 13, 2009, Raring et al.
- U.S. Appl. No. 12/497,289, filed Jul. 2, 2009, Raring et al.
- Aoki et al., “InGaAs/InGaAsP MQW Electroabsorption Modulator Integrated with a DFB Laser Fabricated by Band-Gap Energy Control Selective Area MOCVD, 1993, ”IEEE J Quantum Electronics, vol. 29, pp. 2088-2096.
- Asano et al., “100-mW kink-Free Blue-Violet Laser Diodes with Low Aspect Ratio,” 2003, IEEE Journal of Quantum Electronics, vol. 39, No. 1, pp. 135-140.
- Bernardini et al., “Spontaneous Polarization and Piezoelectric Constants of III-V Nitrides,” 1997, Physical Review B, vol. 56, No. 16, pp. 10024-10027.
- Caneau et al., “Studies on Selective OMVPE of (Ga,In)/(As,P),” 1992, Journal of Crystal Growth, vol. 124, pp. 243-248.
- Chen et al., “Growth and Optical Properties of Highly Uniform and Periodic InGaN Nanostructures,” 2007, Advanced Materials, vol. 19, pp. 1707-1710.
- D'Evelyn et al., “Bulk GaN Crystal Growth by the High-Pressure Ammonothermal Method,” Journal of Crystal Growth, 2007, vol. 300, pp. 11-16.
- Fujii et al., “Increase in the Extraction Efficiency of GaN-based Light-Emitting Diodes Via Surface Roughening,” 2004, Applied Physics Letters, vol. 84, No. 6, pp. 855-857.
- Funato et al., “Blue, Green, and Amber InGaN/GaN Light-Emitting Diodes on Semipolar (1122) GaN Substrates,” 2006, Journal of Japanese Applied Physics, vol. 45, No. 26, pp. L659-L662.
- Funato et al., “Monolithic Polychromatic Light-Emitting Diodes Based on InGaN Microfacet Quantum Wells toward Tailor-Made Solid-State Lighting,” 2008, Applied Physics Express, vol. 1, pp. 011106-1-011106-3.
- Gardner et al. “Blue-emitting InGaN-GaN double-heterostructure light-emitting diodes reaching maximum quantum efficiency above 200 A/ cm2”, Applied Physics Letters 91, 243506 (2007).
- hap ://techon.nikkeibp. co jp/english/NEWS—EN/20080122/146009.
- Hiramatsu et al., Selective Area Growth and Epitaxial Lateral Overgrowth of GaN by Metalorganic Vapor Phase Epitaxy and Hydride Vapor Phase Epitaxy. Materials Science and Engineering B, vol. 59, May 6, 1999. pp. 104-111.
- Iso et al., “High Brightness Blue InGaN/GaN Light Emitting Diode on Nonpolar m-plane Bulk GaN Substrate,” 2007, Japanese Journal of Applied Physics, vol. 46, No. 40, pp. L960-L962.
- Kendall et al., “Energy Savings Potential of Solid State Lighting in General Lighting Applications,” 2001, Report for the Department of Energy, pp. 1-35.
- Kim et al, “Improved Electroluminescence on Nonpolar m-plane InGaN/GaN Qantum Well LEDs”, 2007, Physica Status Solidi (RRL), vol. 1, No. 3, pp. 125-127.
- Kuramoto et al., “Novel Ridge-Type InGaN Multiple-Quantum-Well Laser Diodes Fabricated by Selective Area Re-Growth on n-GaN Substrates,” 2007, Journal of Japanese Applied Physics, vol. 40, pp. 925-927.
- Masui et al. “Electrical Characteristics of Nonpolar InGaN-Based Light-Emitting Diodes Evaluated at Low Temperature,” Jpn. J. Appl. Phys. 46 pp. 7309-7310 (2007).
- Michiue et al. “Recent development of nitride LEDs and LDs,” Proceedings of SPIE, vol. 7216, 72161Z (2009).
- Nakamura et al., “InGaN/Gan/AlGaN-based Laser Diodes with Modulation-doped Strained-layer Superlattices Grown on an Epitaxially Laterally Grown GaN Substrate”, 1998, Applied Physics Letters, vol. 72, No. 12, pp. 211-213.
- Nam et al., “Later Epitaxial Overgrowth of GaN films on SiO2 Areas Via Metalorganic Vapor Phase Epitaxy,” 1998, Journal of Electronic Materials, vol. 27, No. 4, pp. 233-237.
- Okamoto et al., “Pure Blue Laser Diodes Based on Nonpolar m-Plane Gallium Nitride with InGaN Waveguiding Layers,” 2007, Journal of Japanese Applied Physics, vol. 46, No. 35, pp. 820-822.
- Okamoto et. al “Continuous-Wave Operation of m-Plane InGaN Multiple Quantum Well Laser Diodes” The Japan Society of I Applied Physics JJAP Express LEtter, vol. 46, No. 9, 2007 pp. L187-L89.
- Purvis, “Changing the Crystal Face of Gallium Nitride.” The Advance Semiconductor Magazine, vol. 18, No. 8, Nov. 2005.
- Sato et al., “High Power and High Efficiency Green Light Emitting Diode on free-Standing Semipolar (1122) Bulk GaN Substrate,” 2007.Physica Status Solidi (RRL), vol. 1, pp. 162-164.
- Sato et al., “Optical Properties of Yellow Light-Emitting-Diodes Grown on Semipolar (1122) Bulk GaN Substrate,” 2008, Applied Physics Letter, vol. 92, No. 22, pp. 221110-1-221110-3.
- Schmidt et al., “Demonstration of Nonpolar m-plane InGaN/GaN Laser Diodes,” 2007, Journal of Japanese Applied Physics, vol. 46, No. 9, pp. 190-191.
- Schmidt et al., “High Power and High External Efficiency m-plane InGaN Light Emitting Diodes,” 2007, Japanese Journal of Applied Physics, vol. 46, No. 7, pp. L126-L128.
- Shchekin et al., “High Performance Thin-film Flip-Chip InGaN-GaN Light-emitting Diodes,” 2006, Applied Physics Letters, vol. 89, pp. 071109-071109-3.
- Shen et al. “Auger recombination in InGaN measured by photoluminescence,” Applied Physics Letters, 91, 141101 (2007).
- Sizov et al., “500-nm Optical Gain Anisotropy of Semipolar (1122) InGaN Quantum Wells,” 2009, Applied Physics Express, vol. 2, pp. 071001-1-071001-3.
- Tomiya et. al. Dislocation related issues in the degradation of GaN-based laser diodes, IEEE Journal of Selected Topics in Quantum Electronics vol. 10, No. 6 (2004).
- Tyagi et al., “High Brightness Violet InGaN/GaN Light Emitting Diodes on Semipolar (1011) Bulk GaN Substrates,” 2007, Japanese Journal of Applied Physics, vol. 46, No. 7, pp. L129-L131.
- Uchida et al.,“Recent Progress in High-Power Blue-violet Lasers,” 2003, IEEE Journal of Selected Topics in Quantum Electronics, vol. 9, No. 5, pp. 1252-1259.
- Waltereit et al., “Nitride Semiconductors Free of Electrostatic Fields for Efficient White Light-emitting Diodes,” 2000, Nature: International Weekly Journal of Science, vol. 406, pp. 865-868.
- Wierer et al., “High-power AlGaInN Flip-chip Light-emitting Diodes,” 2001, Applied Physics Letters, vol. 78, No. 22, pp. 3379-3381.
- Yamaguchi, A. Atsushi, “Anisotropic Optical Matrix Elements in Strained GaN-quantum Wells with Various Substrate Orientations,” 2008, Physica Status Solidi (PSS), vol. 5, No. 6, pp. 2329-2332.
- Yoshizumi et al. “Continuous-Wave operation of 520 nm Green InGaN-Based Laser Diodes on Semi-Polar {20-21} GaN Substrates,” Applied Physics Express 2 (2009).—1310 1410.
- Yu et al., “Multiple Wavelength Emission from Semipolar InGaN/GaN Quantum Wells Selectively Grown by MOCVD,” in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest (CD) (Optical Society of America, 2007), paper JTuA92.
- Zhong et al., “Demonstration of High Power Blue-Green Light Emitting Diode on Semipolar (1122) Bulk GaN Substrate,” 2007, Electron Letter, vol. 43, No. 15, pp. 825-826.
- Zhong et al., “High Power and High Efficiency Blue Light Emitting Diode on Freestanding Semipolar (1122) Bulk GaN Substrate,” 2007, Applied Physics Letter, vol. 90, No. 23, pp. 233504-233504-3.
- Office action for U.S. Appl. No. 12/573,820 (Oct. 11, 2011).
- Office action for U.S. Appl. No. 12/749,466 (Feb. 3, 2012).
- Office action for U.S. Appl. No. 13/046,565 (Feb. 2, 2012).
- Office action for U.S. Appl. No. 13/046,565 (Nov. 7, 2011).
- Office action for U.S. Appl. No. 12/484,924 (Oct. 31, 2011).
- Office action for U.S. Appl. No. 12/497,289 (Feb. 2, 2012).
- Office action for U.S. Appl. No. 12/759,273 (Nov. 21, 2011).
- Office action for U.S. Appl. No. 12/762,269 (Oct. 12, 2011).
- Office action for U.S. Appl. No. 12/778,718 (Nov. 25, 2011).
- Notice of Allowance for U.S. Appl. No. 12/762,278 (Nov. 7, 2011).
- Abare “Cleaved and Etched Facet Nitride Laser Diodes,” IEEE Journal of Selected Topics in Quantum Electronics, vol. 4, No. 3, pp. 505-509 (May 1998).
- Asif Khan “Cleaved cavity optically pumped InGaN-GaN laser grown on spinel substrates,” Appl. Phys. Lett. 69 (16), pp. 2418-2420 (Oct. 14, 1996).
- Okamoto et al. in “High-Efficiency Continuous-Wave Operation of Blue-Green Laser Diodes Based on Nonpolar m-Plane Gallium Nitride,” The Japan Society of Applied Physics, Applied Physics Express 1 (Jun. 2008).
- Park, “Crystal orientation effects on electronic properties of wurtzite InGaN/GaN quantum wells,”,Journal of Applied Physics vol. 91, No. 12, pp. 9904-9908 (Jun. 2002).
- Romanov “Strain-induced polarization in wurtzite III-nitride semipolar layers,” Journal of Applied Physics 100, pp. 023522-1 through 023522-10 (Jul. 25, 2006).
- Schoedl “Facet degradation of GaN heterostructure laser diodes,” Journal of Applied Physics vol. 97, issue 12, pp. 123102-1 to 123102-8 (2005).
Type: Grant
Filed: Apr 16, 2010
Date of Patent: Oct 23, 2012
Assignee: Soraa, Inc. (Fremont, CA)
Inventor: James W. Raring (Goleta, CA)
Primary Examiner: A. Sefer
Assistant Examiner: Farid Khan
Attorney: Kilpatrick Townsend & Stockton LLP
Application Number: 12/762,271
International Classification: H01L 33/00 (20100101);