Method and apparatus for measuring a parameter of a vehicle electrical system

- Midtronics, Inc.

A vehicle electrical system tester for testing the electrical system of a vehicle is provided. The electrical system has a wiring harness which extends between components of the vehicle and includes a plurality of wires. The vehicle electrical system tester is configured to measure an electrical parameter of at least one of the plurality of wires through a first connection to coupled to a first end of the at least one of the plurality of wires and a second connection coupled to a second end of the at least one of the plurality of wires. An electrical signal is applied between the first and second ends of the at least one of the plurality of wires and the electrical parameter of the at least one of the plurality of wires is responsively measured.

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Description

The present application is based on and claims the benefit of U.S. provisional patent application Ser. No. 61/330,497, filed May 3, 2010, the present application is also a Continuation-In-Part of and claims priority of U.S. patent application Ser. No. 12/261,336, filed Oct. 30, 2008, which is a Continuation-In-Part of U.S. patent application Ser. No. 11/641,594, filed Dec. 19, 2006, which is a Divisional of U.S. patent application Ser. No. 10/656,526, filed Sep. 5, 2003, now U.S. Pat. No. 7,154,276, the contents of which are hereby incorporated by reference in their entirety.

BACKGROUND OF THE INVENTION

The present invention relates to the measurement of electrical parameters of a vehicle electrical system. More specifically, the present invention relates to measuring an electrical parameter of an electrical system of a vehicle using a plurality of connections to the electrical system.

U.S. Pat. No. 3,873,911, issued Mar. 25, 1975, to Champlin; U.S. Pat. No. 3,909,708, issued Sep. 30, 1975, to Champlin; U.S. Pat. No. 4,816,768, issued Mar. 28, 1989, to Champlin; U.S. Pat. No. 4,825,170, issued Apr. 25, 1989, to Champlin; U.S. Pat. No. 4,881,038, issued Nov. 14, 1989, to Champlin; U.S. Pat. No. 4,912,416, issued Mar. 27, 1990, to Champlin; U.S. Pat. No. 5,140,269, issued Aug. 18, 1992, to Champlin; U.S. Pat. No. 5,343,380, issued Aug. 30, 1994; U.S. Pat. No. 5,572,136, issued Nov. 5, 1996; U.S. Pat. No. 5,574,355, issued Nov. 12, 1996; U.S. Pat. No. 5,583,416, issued Dec. 10, 1996; U.S. Pat. No. 5,585,728, issued Dec. 17, 1996; U.S. Pat. No. 5,589,757, issued Dec. 31, 1996; U.S. Pat. No. 5,592,093, issued Jan. 7, 1997; U.S. Pat. No. 5,598,098, issued Jan. 28, 1997; U.S. Pat. No. 5,656,920, issued Aug. 12, 1997; U.S. Pat. No. 5,757,192, issued May 26, 1998; U.S. Pat. No. 5,821,756, issued Oct. 13, 1998; U.S. Pat. No. 5,831,435, issued Nov. 3, 1998; U.S. Pat. No. 5,871,858, issued Feb. 16, 1999; U.S. Pat. No. 5,914,605, issued Jun. 22, 1999; U.S. Pat. No. 5,945,829, issued Aug. 31, 1999; U.S. Pat. No. 6,002,238, issued Dec. 14, 1999; U.S. Pat. No. 6,037,751, issued Mar. 14, 2000; U.S. Pat. No. 6,037,777, issued Mar. 14, 2000; U.S. Pat. No. 6,051,976, issued Apr. 18, 2000; U.S. Pat. No. 6,081,098, issued Jun. 27, 2000; U.S. Pat. No. 6,091,245, issued Jul. 18, 2000; U.S. Pat. No. 6,104,167, issued Aug. 15, 2000; U.S. Pat. No. 6,137,269, issued Oct. 24, 2000; U.S. Pat. No. 6,163,156, issued Dec. 19, 2000; U.S. Pat. No. 6,172,483, issued Jan. 9, 2001; U.S. Pat. No. 6,172,505, issued Jan. 9, 2001; U.S. Pat. No. 6,222,369, issued Apr. 24, 2001; U.S. Pat. No. 6,225,808, issued May 1, 2001; U.S. Pat. No. 6,249,124, issued Jun. 19, 2001; U.S. Pat. No. 6,259,254, issued Jul. 10, 2001; U.S. Pat. No. 6,262,563, issued Jul. 17, 2001; U.S. Pat. No. 6,294,896, issued Sep. 25, 2001; U.S. Pat. No. 6,294,897, issued Sep. 25, 2001; U.S. Pat. No. 6,304,087, issued Oct. 16, 2001; U.S. Pat. No. 6,310,481, issued Oct. 30, 2001; U.S. Pat. No. 6,313,607, issued Nov. 6, 2001; U.S. Pat. No. 6,313,608, issued Nov. 6, 2001; U.S. Pat. No. 6,316,914, issued Nov. 13, 2001; U.S. Pat. No. 6,323,650, issued Nov. 27, 2001; U.S. Pat. No. 6,329,793, issued Dec. 11, 2001; U.S. Pat. No. 6,331,762, issued Dec. 18, 2001; U.S. Pat. No. 6,332,113, issued Dec. 18, 2001; U.S. Pat. No. 6,351,102, issued Feb. 26, 2002; U.S. Pat. No. 6,359,441, issued Mar. 19, 2002; U.S. Pat. No. 6,363,303, issued Mar. 26, 2002; U.S. Pat. No. 6,377,031, issued Apr. 23, 2002; U.S. Pat. No. 6,392,414, issued May 21, 2002; U.S. Pat. No. 6,417,669, issued Jul. 9, 2002; U.S. Pat. No. 6,424,158, issued Jul. 23, 2002; U.S. Pat. No. 6,441,585, issued Aug. 17, 2002; U.S. Pat. No. 6,437,957, issued Aug. 20, 2002; U.S. Pat. No. 6,445,158, issued Sep. 3, 2002; U.S. Pat. No. 6,456,045; U.S. Pat. No. 6,466,025, issued Oct. 15, 2002; U.S. Pat. No. 6,465,908, issued Oct. 15, 2002; U.S. Pat. No. 6,466,026, issued Oct. 15, 2002; U.S. Pat. No. 6,469,511, issued Nov. 22, 2002; U.S. Pat. No. 6,495,990, issued Dec. 17, 2002; U.S. Pat. No. 6,497,209, issued Dec. 24, 2002; U.S. Pat. No. 6,507,196, issued Jan. 14, 2003; U.S. Pat. No. 6,534,993; issued Mar. 18, 2003; U.S. Pat. No. 6,544,078, issued Apr. 8, 2003; U.S. Pat. No. 6,556,019, issued Apr. 29, 2003; U.S. Pat. No. 6,566,883, issued May 20, 2003; U.S. Pat. No. 6,586,941, issued Jul. 1, 2003; U.S. Pat. No. 6,597,150, issued Jul. 22, 2003; U.S. Pat. No. 6,621,272, issued Sep. 16, 2003; U.S. Pat. No. 6,623,314, issued Sep. 23, 2003; U.S. Pat. No. 6,633,165, issued Oct. 14, 2003; U.S. Pat. No. 6,635,974, issued Oct. 21, 2003; U.S. Pat. No. 6,707,303, issued Mar. 16, 2004; U.S. Pat. No. 6,737,831, issued May 18, 2004; U.S. Pat. No. 6,744,149, issued Jun. 1, 2004; U.S. Pat. No. 6,759,849, issued Jul. 6, 2004; U.S. Pat. No. 6,781,382, issued Aug. 24, 2004; U.S. Pat. No. 6,788,025, filed Sep. 7, 2004; U.S. Pat. No. 6,795,782, issued Sep. 21, 2004; U.S. Pat. No. 6,805,090, filed Oct. 19, 2004; U.S. Pat. No. 6,806,716, filed Oct. 19, 2004; U.S. Pat. No. 6,850,037, filed Feb. 1, 2005; U.S. Pat. No. 6,850,037, issued Feb. 1, 2005; U.S. Pat. No. 6,871,151, issued Mar. 22, 2005; U.S. Pat. No. 6,885,195, issued Apr. 26, 2005; U.S. Pat. No. 6,888,468, issued May 3, 2005; U.S. Pat. No. 6,891,378, issued May 10, 2005; U.S. Pat. No. 6,906,522, issued Jun. 14, 2005; U.S. Pat. No. 6,906,523, issued Jun. 14, 2005; U.S. Pat. No. 6,909,287, issued Jun. 21, 2005; U.S. Pat. No. 6,914,413, issued Jul. 5, 2005; U.S. Pat. No. 6,913,483, issued Jul. 5, 2005; U.S. Pat. No. 6,930,485, issued Aug. 16, 2005; U.S. Pat. No. 6,933,727, issued Aug. 23, 200; U.S. Pat. No. 6,941,234, filed Sep. 6, 2005; U.S. Pat. No. 6,967,484, issued Nov. 22, 2005; U.S. Pat. No. 6,998,847, issued Feb. 14, 2006; U.S. Pat. No. 7,003,410, issued Feb. 21, 2006; U.S. Pat. No. 7,003,411, issued Feb. 21, 2006; U.S. Pat. No. 7,012,433, issued Mar. 14, 2006; U.S. Pat. No. 7,015,674, issued Mar. 21, 2006; U.S. Pat. No. 7,034,541, issued Apr. 25, 2006; U.S. Pat. No. 7,039,533, issued May 2, 2006; U.S. Pat. No. 7,058,525, issued Jun. 6, 2006; U.S. Pat. No. 7,081,755, issued Jul. 25, 2006; U.S. Pat. No. 7,106,070, issued Sep. 12, 2006; U.S. Pat. No. 7,116,109, issued Oct. 3, 2006; U.S. Pat. No. 7,119,686, issued Oct. 10, 2006; and U.S. Pat. No. 7,126,341, issued Oct. 24, 2006; U.S. Pat. No. 7,154,276, issued Dec. 26, 2006; U.S. Pat. No. 7,198,510, issued Apr. 3, 2007; U.S. Pat. No. 7,363,175, issued Apr. 22, 2008; U.S. Pat. No. 7,208,914, issued Apr. 24, 2007; U.S. Pat. No. 7,246,015, issued Jul. 17, 2007; U.S. Pat. No. 7,295,936, issued Nov. 13, 2007; U.S. Pat. No. 7,319,304, issued Jan. 15, 2008; U.S. Pat. No. 7,363,175, issued Apr. 22, 2008; U.S. Pat. No. 7,398,176, issued Jul. 8, 2008; U.S. Pat. No. 7,408,358, issued Aug. 5, 2008; U.S. Pat. No. 7,425,833, issued Sep. 16, 2008; U.S. Pat. No. 7,446,536, issued Nov. 4, 2008; U.S. Pat. No. 7,479,763, issued Jan. 20, 2009; U.S. Pat. No. 7,498,767, issued Mar. 3, 2009; U.S. Pat. No. 7,501,795, issued Mar. 10, 2009; U.S. Pat. No. 7,505,856, issued Mar. 17, 2009; U.S. Pat. No. 7,545,146, issued Jun. 9, 2009; U.S. Pat. No. 7,557,586, issued Jul. 7, 2009; U.S. Pat. No. 7,595,643, issued Sep. 29, 2009; U.S. Pat. No. 7,598,699, issued Oct. 6, 2009; U.S. Pat. No. 7,598,744, issued Oct. 6, 2009; U.S. Pat. No. 7,598,743, issued Oct. 6, 2009; U.S. Pat. No. 7,619,417, issued Nov. 17, 2009; U.S. Pat. No. 7,642,786, issued Jan. 5, 2010; U.S. Pat. No. 7,642,787, issued Jan. 5, 2010; U.S. Pat. No. 7,656,162, issued Feb. 2, 2010; U.S. Pat. No. 7,688,074, issued Mar. 30, 2010; U.S. Pat. No. 7,705,602, issued Apr. 27, 2010; U.S. Pat. No. 7,706,992, issued Apr. 27, 2010; U.S. Pat. No. 7,710,119, issued May 4, 2010; U.S. Pat. No. 7,723,993, issued May 25, 2010; U.S. Pat. No. 7,728,597, issued Jun. 1, 2010; U.S. Pat. No. 7,772,850, issued Aug. 10, 2010; U.S. Pat. No. 7,774,151, issued Aug. 10, 2010; U.S. Pat. No. 7,777,612, issued Aug. 17, 2010; U.S. Pat. No. 7,791,348, issued Sep. 7, 2010; U.S. Pat. No. 7,808,375, issued Oct. 5, 2010; U.S. Pat. No. 7,924,015, issued Apr. 12, 2011; U.S. patent application Ser. No. 09/780,146, filed Feb. 9, 2001, entitled STORAGE BATTERY WITH INTEGRAL BATTERY TESTER; U.S. patent application Ser. No. 09/756,638, filed Jan. 8, 2001, entitled METHOD AND APPARATUS FOR DETERMINING BATTERY PROPERTIES FROM COMPLEX IMPEDANCE/ADMITTANCE; U.S. patent application Ser. No. 09/862,783, filed May 21, 2001, entitled METHOD AND APPARATUS FOR TESTING CELLS AND BATTERIES EMBEDDED IN SERIES/PARALLEL SYSTEMS; U.S. patent application Ser. No. 09/880,473, filed Jun. 13, 2001; entitled BATTERY TEST MODULE; U.S. patent application Ser. No. 10/042,451, filed Jan. 8, 2002, entitled BATTERY CHARGE CONTROL DEVICE; U.S. patent application Ser. No. 10/109,734, filed Mar. 28, 2002, entitled APPARATUS AND METHOD FOR COUNTERACTING SELF DISCHARGE IN A STORAGE BATTERY; U.S. patent application Ser. No. 10/112,998, filed Mar. 29, 2002, entitled BATTERY TESTER WITH BATTERY REPLACEMENT OUTPUT; U.S. patent application Ser. No. 10/263,473, filed Oct. 2, 2002, entitled ELECTRONIC BATTERY TESTER WITH RELATIVE TEST OUTPUT; U.S. patent application Ser. No. 10/310,385, filed Dec. 5, 2002, entitled BATTERY TEST MODULE; U.S. patent application Ser. No. 09/653,963, filed Sep. 1, 2000, entitled SYSTEM AND METHOD FOR CONTROLLING POWER GENERATION AND STORAGE; U.S. patent application Ser. No. 10/174,110, filed Jun. 18, 2002, entitled DAYTIME RUNNING LIGHT CONTROL USING AN INTELLIGENT POWER MANAGEMENT SYSTEM; U.S. patent application Ser. No. 10/258,441, filed Apr. 9, 2003, entitled CURRENT MEASURING CIRCUIT SUITED FOR BATTERIES; U.S. patent application Ser. No. 10/681,666, filed Oct. 8, 2003, entitled ELECTRONIC BATTERY TESTER WITH PROBE LIGHT; U.S. patent application Ser. No. 10/791,141, filed Mar. 2, 2004, entitled METHOD AND APPARATUS FOR AUDITING A BATTERY TEST; U.S. patent application Ser. No. 10/867,385, filed Jun. 14, 2004, entitled ENERGY MANAGEMENT SYSTEM FOR AUTOMOTIVE VEHICLE; U.S. patent application Ser. No. 10/958,812, filed Oct. 5, 2004, entitled SCAN TOOL FOR ELECTRONIC BATTERY TESTER; U.S. Ser. No. 60/587,232, filed Dec. 14, 2004, entitled CELLTRON ULTRA, U.S. Ser. No. 60/653,537, filed Feb. 16, 2005, entitled CUSTOMER MANAGED WARRANTY CODE; U.S. Ser. No. 60/665,070, filed Mar. 24, 2005, entitled OHMMETER PROTECTION CIRCUIT; U.S. Ser. No. 60,694,199, filed Jun. 27, 2005, entitled GEL BATTERY CONDUCTANCE COMPENSATION; U.S. Ser. No. 60/705,389, filed Aug. 4, 2005, entitled PORTABLE TOOL THEFT PREVENTION SYSTEM, U.S. patent application Ser. No. 11/207,419, filed Aug. 19, 2005, entitled SYSTEM FOR AUTOMATICALLY GATHERING BATTERY INFORMATION FOR USE DURING BATTERY TESTER/CHARGING, U.S. Ser. No. 60/712,322, filed Aug. 29, 2005, entitled AUTOMOTIVE VEHICLE ELECTRICAL SYSTEM DIAGNOSTIC DEVICE, U.S. Ser. No. 60/713,168, filed Aug. 31, 2005, entitled LOAD TESTER SIMULATION WITH DISCHARGE COMPENSATION, U.S. Ser. No. 60/731,881, filed Oct. 31, 2005, entitled PLUG-IN FEATURES FOR BATTERY TESTERS; U.S. Ser. No. 60/731,887, filed Oct. 31, 2005, entitled AUTOMOTIVE VEHICLE ELECTRICAL SYSTEM DIAGNOSTIC DEVICE; U.S. patent application Ser. No. 11/304,004, filed Dec. 14, 2005, entitled BATTERY TESTER THAT CALCULATES ITS OWN REFERENCE VALUES; U.S. Ser. No. 60/751,853, filed Dec. 20, 2005, entitled BATTERY MONITORING SYSTEM; U.S. patent application Ser. No. 11/304,004, filed Dec. 14, 2005, entitled BATTERY TESTER WITH CALCULATES ITS OWN REFERENCE VALUES; U.S. Ser. No. 60/751,853, filed Dec. 20, 2005, entitled BATTERY MONITORING SYSTEM; U.S. patent application Ser. No. 11/356,443, filed Feb. 16, 2006, entitled ELECTRONIC BATTERY TESTER WITH NETWORK COMMUNICATION; U.S. patent application Ser. No. 11/519,481, filed Sep. 12, 2006, entitled BROAD-BAND LOW-CONDUCTANCE CABLES FOR MAKING KELVIN CONNECTIONS TO ELECTROCHEMICAL CELLS AND BATTERIES; U.S. Ser. No. 60/847,064, filed Sep. 25, 2006, entitled STATIONARY BATTERY MONITORING ALGORITHMS; U.S. patent application Ser. No. 11/641,594, filed Dec. 19, 2006, entitled METHOD AND APPARATUS FOR MEASURING A PARAMETER OF A VEHICLE ELECTRONIC SYSTEM; U.S. Ser. No. 60/950,182, filed Jul. 17, 2007, entitled BATTERY TESTER FOR HYBRID VEHICLE; U.S. Ser. No. 60/973,879, filed Sep. 20, 2007, entitled ELECTRONIC BATTERY TESTER FOR TESTING STATIONARY BATTERIES; U.S. patent application Ser. No. 11/931,907, filed Oct. 31, 2007, entitled BATTERY MAINTENANCE WITH PROBE LIGHT; U.S. Ser. No. 60/992,798, filed Dec. 6, 2007, entitled STORAGE BATTERY AND BATTERY TESTER; U.S. Ser. No. 61/061,848, filed Jun. 16, 2008, entitled KELVIN CLAMP FOR ELECTRONICALLY COUPLING TO A BATTERY CONTACT; U.S. patent application Ser. No. 12/168,264, filed Jul. 7, 2008, entitled BATTERY TESTERS WITH SECONDARY FUNCTIONALITY; U.S. patent application Ser. No. 12/174,894, filed Jul. 17, 2008, entitled BATTERY TESTER FOR ELECTRIC VEHICLE; U.S. patent application Ser. No. 12/204,141, filed Sep. 4, 2008, entitled ELECTRONIC BATTERY TESTER OR CHARGER WITH DATABUS CONNECTION; U.S. patent application Ser. No. 12/328,022, filed Dec. 4, 2008, entitled STORAGE BATTERY AND BATTERY TESTER; U.S. patent application Ser. No. 12/416,457, filed Apr. 1, 2009, entitled SYSTEM FOR AUTOMATICALLY GATHERING BATTERY INFORMATION; U.S. patent application Ser. No. 12/416,453, filed Apr. 1, 2009, entitled INTEGRATED TAG READER AND ENVIRONMENT SENSOR; U.S. patent application Ser. No. 12/416,445, filed Apr. 1, 2009, entitled SIMPLIFICATION OF INVENTORY MANAGEMENT; U.S. patent application Ser. No. 12/485,459, filed Jun. 16, 2009, entitled CLAMP FOR ELECTRONICALLY COUPLING TO A BATTERY CONTACT; U.S. patent application Ser. No. 12/498,642, filed Jul. 7, 2009, entitled ELECTRONIC BATTERY TESTER; U.S. patent application Ser. No. 12/697,485, filed Feb. 1, 2010, entitled ELECTRONIC BATTERY TESTER; U.S. patent application Ser. No. 12/698,375, filed Feb. 2, 2010, entitled ELECTRONIC BATTERY TESTER; U.S. patent application Ser. No. 12/712,456, filed Feb. 25, 2010, entitled METHOD AND APPARATUS FOR DETECTING CELL DETERIORATION IN AN ELECTROCHEMICAL CELL OR BATTERY; U.S. Ser. No. 61/311,485, filed Mar. 8, 2010, entitled BATTERY TESTER WITH DATABUS FOR COMMUNICATING WITH VEHICLE ELECTRICAL SYSTEM; U.S. Ser. No. 61/313,893, filed Mar. 15, 2010, entitled USE OF BATTERY MANUFACTURE/SELL DATE IN DIAGNOSIS AND RECOVERY OF DISCHARGED BATTERIES; U.S. patent application Ser. No. 12/758,407, filed Apr. 12, 2010, entitled ELECTRONIC BATTERY TESTER WITH NETWORK COMMUNICATION; U.S. patent application Ser. No. 12/765,323, filed Apr. 22, 2010, entitled AUTOMOTIVE VEHICLE ELECTRICAL SYSTEM DIAGNOSTIC DEVICE; U.S. patent application Ser. No. 12/769,911, filed Apr. 29, 2010, entitled STATIONARY BATTERY TESTER; U.S. Ser. No. 61/330,497, filed May 3, 2010, entitled MAGIC WAND WITH ADVANCED HARNESS DETECTION; U.S. patent application Ser. No. 12/786,890, filed May 25, 2010, entitled BATTERY TESTER WITH PROMOTION FEATURE; U.S. Ser. No. 61/348,901, filed May 27, 2010, entitled ELECTRONIC BATTERY TESTER; U.S. patent application Ser. No. 29/362,827, filed Jun. 1, 2010, entitled ELECTRONIC BATTERY TESTER; U.S. Ser. No. 61/351,017, filed Jun. 3, 2010, entitled IMPROVED ELECTRIC VEHICLE AND HYBRID ELECTRIC VEHICLE BATTERY MODULE BALANCER; U.S. patent application Ser. No. 12/818,290, filed Jun. 18, 2010, entitled BATTERY MAINTENANCE DEVICE WITH THERMAL BUFFER; U.S. Ser. No. 61/373,045, filed Aug. 12, 2010, entitled ELECTRONIC BATTERY TESTER FOR TESTING STATIONERY STORAGE BATTERY; U.S. patent application Ser. No. 12/888,689, filed Sep. 23, 2010, entitled BATTERY TESTER FOR ELECTRIC VEHICLE; U.S. patent application Ser. No. 12/894,951, filed Sep. 30, 2010, entitled BATTERY PACK MAINTENANCE FOR ELECTRIC VEHICLES; U.S. Ser. No. 61/411,162, filed Nov. 8, 2010, entitled ELECTRONIC BATTERY TESTER; U.S. patent application Ser. No. 13/037,641, filed Mar. 1, 2011, entitled MONITOR FOR FRONT TERMINAL BATTERIES; U.S. patent application Ser. No. 13/048,365, filed Mar. 15, 2011, entitled ELECTRONIC BATTERY TESTER WITH BATTERY AGE UNIT; which are incorporated herein by reference in their entirety.

There is an ongoing need to measure parameters of electrical systems of vehicles and heavy equipment. Such measurements can be used to diagnose operation, failure or impending failure of components or subsystems of electrical systems. For example, in electrical systems used in vehicles, measurement of electrical parameters of such systems can be used to diagnose operation of the system or indicate that maintenance is required before ultimate failure.

One particular measurement is the resistance of cabling used in the vehicle. For example, one such cable or set of cables connects the battery the of vehicle to the starter motor. The starter motor has a relatively large current draw and even a relatively small cable resistance can have a significant impact on operation of the starter motor.

Because the cable resistance is relatively small it typically cannot be measured using a standard ohm meter or other techniques which are normally used to measure resistance. One technique which has been used to measure the cable resistance is to run a very large current through the cable and measure the voltage drop. However, this is cumbersome and requires components capable of handling the large current.

SUMMARY OF THE INVENTION

A vehicle electrical system tester for testing the electrical system of a vehicle is provided. The electrical system has a wiring harness which extends between components of the vehicle and includes a plurality of wires. The vehicle electrical system tester is configured to measure an electrical parameter of at least one of the plurality of wires through a first connection to coupled to a first end of the at least one of the plurality of wires and a second connection coupled to a second end of the at least one of the plurality of wires. An electrical signal is applied between the first and second ends of the at least one of the plurality of wires and the electrical parameter of the at least one of the plurality of wires is responsively measured.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a simplified diagram of an electrical system of a vehicle.

FIG. 2 is a simplified block diagram showing an automotive vehicle electrical system tester in accordance with one example embodiment of the present invention.

FIG. 3A is a simplified electrical diagram showing a configuration of circuitry for measuring a parameter of a wire of the vehicle.

FIG. 3B is a simplified electrical diagram showing a configuration of circuitry for testing another wire of the vehicle.

FIG. 4 is a simplified block diagram showing sense circuitry for use with the tester of FIG. 2.

FIG. 5 is simplified block diagram showing current circuitry for use with the electrical system tester of FIG. 2.

FIG. 6 is a front plan view of the electrical system tester of FIG. 2.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

FIG. 1 is a simplified diagram of an electrical system 10 of a vehicle 12. Electrical system 10 includes a battery 20, a load 22 and cables 24 and 26 which connect load 22 to the positive terminal 30 of battery 20 and the negative terminal 32 of battery 20, respectively. Cables 24 and 26 are illustrated as having resistances R1 and R2, respectively.

FIG. 1 also shows Kelvin connections 40 and 42 coupled to the positive terminal 30 and the negative terminal 32 of battery 20 respectively. Kelvin connection 40 has a sense connection K1S and a current connection K1C. Similarly, Kelvin connection 42 has a sense connection K2S and a current connection K2C. FIG. 1 also illustrates test connections 44 and 46. In the embodiment of FIG. 1, these are illustrated as being Kelvin connections, however the present invention is not limited to this arrangement. Test connection 44 is connected between load 22 and cable 24. Similarly, test connection 46 is connected between load 22 and cable 26. Test connection 44 includes a sense connection T1S and a current connection T1C. Test connection 46 includes a sense connection T2S and a current connection T2C.

As discussed in the Background section, the resistances R1 and R2 of cables 24 or 26 can impact the amount of power which can be delivered to load 22. Even if the resistance values are relatively small, if a relatively large current passes through cables 24 and 26, the resultant voltage drop can significantly reduce the voltage across load 22 and therefore the amount of power which can be delivered to load 22. In many instances, it is desirable to measure the resistance R1 and R2 of cables 24 and 26, respectively, in order to identify a cable with a resistance which is too high. One technique which has been used to measure the resistance of the cables is to pass a large current through the cable and measure the resulting voltage drop across the cable. However, this is a cumbersome test and requires electrical test equipment which is capable of handling the large current draw. The present invention provides an apparatus and technique for measuring the resistance of a cable in a configuration similar to that shown in FIG. 1.

FIG. 2 is a simplified block diagram of automotive vehicle electrical system tester 100 in accordance with one example embodiment of the present invention. Tester 100 includes sense circuitry 102 which couples to connections K1S, K2S, T1S and T2S. Similarly, tester 100 includes current drive circuitry 104 which connects to K1C, K2C, T1C and T2C. Power supply circuitry 106 also couples to K1C and K2C and provides a power output which may be used for powering electrical components of tester 100. In another example embodiment, tester 100 includes a separate power source such as an internal battery. A microprocessor 108 couples to sense circuitry 102 and current circuitry 104 and operates in accordance with instructions stored in a memory 110. Memory 110 can include both volatile and non-volatile memory and may be used for permanently or temporarily storing information. User input/output circuitry 112 is shown coupled to microprocessor 108 and may include for example, button inputs, a display for output, audio inputs and outputs, etc. Such audio inputs or outputs can include a voice output or input, alarms, beepers, buzzers, etc. FIG. 2 also illustrates I/O circuitry 114 which can be optionally used by microprocessor 108 to communicate with any other type of device including network communications, other diagnostic components, centralized locations, printers, etc. In one example configuration, this includes a connection for coupling to the databus of the vehicle 12. For example, this could be an OBD II type databus.

The load 22 of the vehicle can be any type of load including loads which draw high current levels, for example, a starter motor, a magnetic switch, a ground connection, wiring harness, a terminal which may be susceptible to corrosion, a connection through a bolt which may have inappropriate torque or otherwise provide a poor connection, data carrying wires, sensor wiring, trailer wiring, etc. The invention is applicable to all wire sizes including small, medium and large gauge and is not limited to those discussed herein. In one example embodiment, the output is related to a particular current draw through the cabling. For example, the output can comprise an indication that there is a 0.5 volt drop through the cable when carrying a 500 amp current. Such parameter can also be used, for example, in a pass/fail test, i.e., if the voltage drop is more than a particular threshold at a given current level, a failure indication can be provided as an output. In one embodiment, the measured parameters comprise dynamic parameters such as dynamic conductance. However, any dynamic parameter can be used in accordance with the present invention including dynamic resistance, reactance, impedance, conductance, susceptance, and/or admittance, including any combination of these parameters, or others.

FIG. 3A is a simplified block diagram showing the electrical connections to wiring 24 for measurement of resistance R1. As illustrated in FIG. 3A, a current IL is applied by current source 104 through resistance R1 of cable 24. The current IL flows through a current path from the positive terminal 30 of battery 20, through cable 24 and resistance R1, and into test connector current connection T1C of test connector 44. The current source 104 provides a path for current from T1C to the K2C connection of Kelvin connector 42. This, as illustrated in FIG. 3A, couples to the negative terminal 32 of battery 20. The current source 104 can be an active or passive current source. For example, current source 104 may be a resistive load which operates under the control of microprocessor 108. Sense circuitry 102 is coupled across resistance R1 using the K1S sense connection of Kelvin connector 40 and the T1S sense connection of test connector 44. Note that as discussed herein, the test connections 44 and 46 are illustrated as Kelvin connections, however the invention is not limited to this configuration.

FIG. 3B is a simplified block diagram showing a similar arrangement used to measure the resistance R2 of cable 26. In FIG. 3B, a current IL is applied to resistance R2 using current source 104 along with connection K1C of Kelvin connector 40 which couples to the positive terminal 30 of battery 20 and test connection T2C of test connector 46. A sense connection for sense circuitry 102 is provided by connector K2S of Kelvin connector 42 coupled to the negative terminal 32 of battery 20 along with the connector T2S of test connector 46.

FIG. 4 is simplified diagram showing one example configuration of sense circuitry 102. As illustrated in FIG. 4, sense circuitry 102 includes a multiplexor 150 operated under the control of microprocessor 108 which couples to the Kelvin sense connections K1S and K2S. Multiplexor 150 is used to selectively couple one of the sense connections K1S and K2S to a differential amplifier 154. Similarly, a second multiplexor 152 operates under the control of microprocessor 108 and operates to selectively couple of the test sense connections T1S and T2S to the differential amplifier 154. Differential amplifier provides an amplified differential output to an analog to digital converter 156 which digitizes the analog signal and provides a digital signal to microprocessor 108. In one example configuration, the gain of the differential amplifier 154 maybe adjusted by microprocessor 108 to selectively increase or decrease the sensitivity of the circuitry.

FIG. 5 is a simplified block diagram showing one example embodiment of current circuitry 104 in greater detail. An embodiment illustrated in FIG. 5, a multiplexor 160 operates under the control of microprocessor 104 and selectively couples Kelvin connection K1C of Kelvin connector 40 or Kelvin connection K2C of Kelvin connector 42 to a current source 164. Similarly, a multiplexor 162 operates under the control of microprocessor 108 and selectively couples test current connection T1C of test connector 44 or test current connection T2C of test connector 46 to the current source 164. Current source 164 is coupled to microprocessor 108 and is controlled by microprocessor 108. Current source 164 may comprise, for example, a fixed resistance (in which case it is not necessary to connect current source 164 to microprocessor 108) or a plurality of selectable resistors or a variable resistance which provides a current path between one of the selected connectors coupled to multiplexor 160 and one of the connectors selected by multiplexor 162. In this configuration, the current source 164 is a passive current source formed by a resistance. However, an active current source may also be employed. Current 164 may also include current sense circuitry which is configured to measure a current IC flowing there through. This information can be provided to microprocessor 108 for use in determining the resistance of resistor R1 or R2 of cables 24 or 26, respectively.

During operation, microprocessor 108 shown in FIG. 2 controls operation of multiplexors 150, 152, 160 and 162 to arrange the test circuitry in the configuration illustrated in FIGS. 3A and 3B. The resistance being measured (R1 or R2) is calculated by microprocessor 108 using Ohms' law R=V/I where R is the resistance being measured, V is the voltage sensed by sense circuitry 102 and I is the current flowing through current circuitry 104. Operation by microprocessor 108 may be controlled by user I/O 112 shown in FIG. 2. For example, an operator may instruct the microprocessor 108 to initiate a measurement. In another example configuration, the operator instructs the microprocessor as to the amount of current IC to be applied during the test. This can be selected by the user, for example, based upon the type of wiring being measured, the specific use for the particular wiring being measured, the gauge of the wiring being measured, or other considerations as desired. The microprocessor 108 can provide an output, such as a pass/fail output by comparing the measured values with threshold levels. These threshold levels can be measured by a user through user I/O 112 and/or stored in memory 110. The particular thresholds may be changed based upon the particular test criteria being used. As discussed above, this could be based upon the particular wiring or cabling type, the use of which the wiring is applied, the gauge of the wiring, etc. Microprocessor 108 can also be configured to provide other information to the operator. For example, this includes any information which may be measured or otherwise retrieved by microprocessor 108 including voltage measures, maximum or minimum measurements, signal wave forms, user instructions or prompts, etc. In one example configuration, user I/O 112 may include an audible output such as voice prompting or verbal test results, or other sounds to instruct or provide information to an operator.

In one configuration, the user I/O 112 is used by an operator to instruct the microprocessor 108 as to the particular circuit configuration to be used as illustrated in FIGS. 3A and 3B. In another example configuration, for example, if a single test connector 44 or 46 is employed, microprocessor 108 measures a voltage using sense circuitry 102 between the test connection and Kelvin connectors 40 and/or 42. This measured voltage is used by microprocessor 108 to determine whether the test connector is coupled as showing by test connector 44 shown in FIG. 1 or if the test connector is coupled as shown by test connector 46 shown in FIG. 1. Based upon the measured voltage, microprocessor configures the circuitry in the proper configuration as illustrated in FIG. 3A or 3B.

FIG. 6 is a plan view showing tester 100 which includes a housing 200 carrying a display 202 and user input buttons 204, 206 and 208. Display 202 and buttons 204-208 can comprise user I/O 112 shown in FIG. 2. Another example component of the user input/output 112 includes LED's 210A, 210B and 212A and 212B. A battery cable 220 couples to housing 200 to plug 222 and connects to Kelvin connectors 40 and 42 shown in FIG. 1. The Kelvin connectors 40 and 42 can comprise, for example, “alligator” type clamps for coupling to the terminals of battery 20. A test cable 230 couples to housing 200 to plug 232. In the example shown in FIG. 6, a distal end of test cable 230 comprises a piercing probe 242 configured to pierce through an insulation of a cable under test. Note that in such a configuration, the test connector, such as 44 or 46, may or may not be a Kelvin connection as illustrated in the above figures and may comprise a single connector. Some loss in accuracy may be expected however in some situations this may be acceptable. In another example configuration, the Kelvin connectors are provided through test cable 230 up to the distal end 240 of the test cable 230. At the distal end 240, the two Kelvin connectors are coupled together and a single connection is used for connecting to the cable under test. In yet another example configuration, the piercing probe 242 comprises two piercing probes such that a Kelvin connection is provided by piercing through the insulation of the cable. A piercing probe is not necessary and any type of test connection may be used including standard test probe configuration such as those available on volt meters, clamps, etc.

Button 204 can be configured as a “enter” button and buttons 206 and 208 can be configured as “up” and “down” buttons for scrolling through and selecting menu items displayed on display 202. For example, this can be used to also to receive information regarding the “gauge” of the wire under test. LED's 210A and 210B and 212A and 212B can be used to display test information. For example, when a wire of a positive polarity is detected either or both LED's 212A or 212B may be illuminated. Similarly, when test probe 242 is connected is to a wire of negative polarity, either or both of the LED 210A/210B may be illuminated. Button 204 can be used for initiate test button and cause the test to begin. Upon completion of the test, the microprocessor 108 can be configured to illuminate LED 210B or 212B if the test is successful. If the wire fails the test, LED 210A or 212A may be illuminated. In a similar configuration, an audio output can be provided, for example, a high pitch solid continuous tone to indicate a “good” wire, a “good” power wire, a high pitch beeping tone to indicate a “bad” wire power wire, a low pitch solid tone to indicate a “good” ground wire, and a low beeping tone to indicate a “bad” ground wire.

In another example configuration, a wire size gauge 250 is provided on the side of housing 200. In this example, the wire size gauge 250 provides three wire size gauges, 252A, 252B and 252C. These may be used by an operator to determine the gauge of the wire under test and input into the microprocessor 108 using user I/O 112. In another example configuration, wire size gauge 250 comprises an automatic gauge in which the wire under test is placed into a slot or the like and a sensor automatically determines the gauge of the wire and provides this information to microprocessor 108.

In one example configuration, a small gauge wire is tested with a current load of 1.25 amps, a medium gauge wire is tested with a current load of 2.5 amps, and a large gauge wire is tested with a current load of 5.0 amps, all with a fixed failure threshold of 0.2 volts. (i.e., if the measured voltage across the wire is greater than 0.2 volts, a failure is indicated). In another example embodiment, a fixed current load is provided and microprocessor 108 scales the measured result based upon the gauge of the wire.

Although the above description shows two different Kelvin connections to the battery terminals, in one configuration, Kelvin connections are not used and another example configuration, only a single Kelvin connection is used or no Kelvin connections are used. Similarly, only a single test connector may be employed and the invention does not require the two test connectors described above. Such an embodiment may be employed if desired, for example, to simultaneously measure the resistances of two separate wires. In a typical configuration, a single test connector will be employed. Similarly, the test connector may be a single connector and a Kelvin connection is not required. If a Kelvin connection is used, the Kelvin connection point can be configured anywhere along the test connector wiring and may be at a point that the test connector couples to the wiring of the vehicle, or at some other point in the wiring between the distal end of the test connector and the circuitry of the tester. The measurements may be made using static measurement techniques to obtain a static parameter or may be made using dynamic measurement techniques to obtain a dynamic parameter. Although the discussion above has generally referred to “resistance”, the present invention is not limited to resistance and the parameter measured may be any parameter of the wire including those which have frequency dependent components. The tester may be powered with power from the battery of the electrical system or may contain an independent power source, for example, an internal battery. As discussed above, in some embodiments, Kelvin connections are provided to the terminals of the battery. In such a configuration, a parameter of the battery may be measured using the techniques discussed in the Background section, or other techniques.

The connection tip may be interchangeable and may be comprised a test probe, piercing tip, connector coupled to a particular type of electrical connection on the vehicle, or other configurations. As these tips are interchangeable, the overall resistance of the test connection may vary. Thus, in some configurations, the microprocessor 108 can be configured to implement a zeroing function whereby an operator can calibrate the measurement for the resistance of the wire based upon the selected probe tip. Such a configuration would typically not be required for a Kelvin connection. The zeroing function can be performed automatically by the microprocessor by measuring the resistance through the electrical connection, can be entered manually by an operator, may be selected by an operator scrolling through a table and selecting the probe in use. In such a configuration, memory 110 shown in FIG. 2 can contain information related to the resistance value for a particular probe.

In one configuration the measurement is presented to the operator in the form of “voltage drop at XX amps”. However, the actual measurement may be performed at a current level other than that presented to the operator. If a small current is employed, conductance measurement techniques can be used to determine the voltage drop. If a current other than the displayed current is employed, the microprocessor 108 performs a scaling on the measurement. For example, if 5 amps is used to perform the measurement, the microprocessor 108 can compute the results of voltage drop at a different value such as 25 amps for display to the operator. This scaling can occur automatically, or can be selected by an operator. Such selection may be, for example, by scrolling through a utility menu presented to the operator using user I/O 110. In such a configuration, memory 110 can contain a scaling factor for use by the microprocessor 108.

In one embodiment, a relatively small current is employed. This reduces the amount of heat generated and reduces the power requirements of the testing device. The measurement can be performed using a dynamic forcing function such as a time varying current signal. For example, short pulses can be used if the device is not capable of sustaining a large current output for an extended period of time. In one example, a pulse width between 10 and 100 msec is used to perform the measurement.

The microprocessor can be configured to automatically sense the polarity of the connection. In such a configuration, the microprocessor sense the voltage measured and determines whether the probe is coupled to a power wire or to a ground wire and the appropriate load is applied. For example, if zero volts is sensed, the wire being tested is most likely a ground wire. Similar, if twelve volts is sensed, the wire being tested is most likely used to supply power. However, in some example configurations, a zero voltage reading may also indicate that the wire being tested is not connected. Similarly, a twelve volt reading may not be a power supplying wire if, for example, the alternator of the vehicle is generating a fifteen volt output. One example configuration to address this concern is to bias the probe tip to a voltage level. For example, circuitry within component 104 (or 102) can be provided to bias the probe tip to a value somewhere between the voltage at the two power leads coupled to the battery 20. When the probe tip is then coupled to the vehicle, the voltage at the probe tip will be pulled to either a more negative or positive value. Microprocessor 108 can sense this voltage and make a determination as to whether the probe is connected to a power lead or a ground lead. For example, if the probe tip voltage is within a predetermined voltage level from electrical ground, microprocessor can determine that the probe is connected to a ground connection. Similarly, if the probe tip is pulled within a predetermined voltage level from the plus connection of the battery, a microprocessor 108 can determine that a power lead is under test. In one example, the predetermined voltage is one volt which is advantageous if a protective diode is employed in the lead which would provide a voltage drop of 0.6 volts.

In one configuration, the tester 100 is configured to test an electrical connection in a wiring harness of an automotive vehicle. For example, referring to FIG. 1, element 22 can comprise the sensor of a vehicle, such as a sensor used to sense a condition of an engine or component of the vehicle. Similarly, element 22 can comprise a control element of the vehicle, such as an element used to control operation of the vehicle engine or drive system, convenience accessories, etc. In such a configuration, the wiring 24 may be part of a large bundle of wires (i.e., a wiring harness) whereby it is difficult to identify ends of a particular wire under test. When performing such tests, other connectors, for example, illustrated in FIG. 1, can be coupled to the vehicle power supply such as the battery and/or electrical ground. In such a configuration, the current circuitry 104 is configured to inject a tone signal having an AC component into the wire 24. This AC component may have a frequency in the audible range such that the sense circuitry 102 can be used to identify an opposite end of the wire 24. For example, the second connection can act as a probe (see 240 in FIG. 6) which, when placed in proximity of the wire will receive the tone signal. The sense circuitry 102 can be coupled to an audio output, for example user I/O 112, such that an operator can identify the selected wire by listening to a tone from the audio output. The volume of the tone will increase as the probe is placed in closer proximity to the selected wire and reach a maximum when the selected wire is touched by the probe.

Once the correct ends of the wire have been connected to the circuitry, the microprocessor 108 performs tests on the selected wire. Such tests include determining the current load capacity of the wire, identifying electrical short circuits or leakage to other wires, identifying leakage to electrical ground or power sources, testing the load carrying capacity of the wire for DC or AC signals including signals of different frequencies, etc. These tests can be performed for both AC and DC signals. For example, although a particular wiring connection may be capable of carrying a DC signal, AC signals (such as those used for data transmission, etc.) may be significantly degraded through the wiring due to stray inductance or capacitance. These tests can be performed by disconnecting both ends of the wire 24.

An operator can be prompted by the microprocessor 108 to perform the particular steps required for such a test. A memory 110 can be configured to contain a database of information related to the proper characteristics for wires used to connect to different types of systems. For example, data transmission wires may have one set of requirements whereas wiring used to connect to an analog sensor may have a different set of requirements. In such a configuration, the operator can scroll through a list of components and select the proper component for the particular wire being tested.

Although the present invention has been described with reference to preferred embodiments, workers skilled in the art will recognize that changes may be made in form and detail without departing from the spirit and scope of the invention. The measurements can be taken using multiple connections to the electrical system or by moving a single pair of connections to various positions on the electrical system. An output can be provided to instruct the operator where to place the connections.

Claims

1. A vehicle electrical system tester for testing the electrical system of a vehicle, the electrical system having a wiring harness which extends between electrical components of the vehicle, the wiring harness including a plurality of wires, the vehicle electrical system tester configured to measure an electrical parameter of at least one of the plurality of wires and comprising:

a first Kelvin connection having a current connection and a sense connection, the first Kelvin connection configured to couple to a first end of the at least one of the plurality of wires of the wiring harness;
a second Kelvin connection having a current connection and a sense connection, the second Kelvin connection configured to couple to a second end of the at least one of the plurality of wires of the wiring harness; and
test circuitry coupled to the first Kelvin connection and the second Kelvin connection, the test circuitry applying an electrical signal between the first and second ends of the at least one of the plurality of wires through the current connection of the first Kelvin connection and the current connection of the second Kelvin connection, responsively measuring the electrical parameter of the at least one of the plurality of wires of the wiring harness using the sense connection of the first Kelvin connection and the sense connection of the second Kelvin connection and provides an output to a user related to a load carrying ability of the at least one of the plurality of wires which is determined based upon the measured parameter.

2. The vehicle electrical system tester of claim 1 wherein the measured parameter is based upon a measurement made through a connection to a battery of the vehicle.

3. The vehicle electrical system tester of claim 1 including an electrical connection to a battery of the vehicle and wherein circuitry of the vehicle system electrical tester is powered with power from the battery.

4. The vehicle electrical system tester of claim 1 wherein the test circuitry is further configured to provide an output to an operator, the output to the operator assisting the operator in identifying the second end of the at least one of the plurality of wires of the wiring harness.

5. The vehicle electrical system tester of claim 4 wherein the output comprises a tone.

6. The vehicle electrical system tester of claim 5 wherein the test circuitry applies a tone signal to the first end of the wire and the tone signal is received by the second Kelvin connection.

7. The vehicle electrical system tester of claim 1 including an input coupled to the microprocessor configured to receive information from an operator related to at least one of the components of the vehicle coupled to the first end of the at least one of the plurality of wires of the wiring harness.

8. The vehicle electrical system tester of claim 7 including a user output displaying a plurality of vehicle components and wherein the operator selects a vehicle component coupled to one end of the at least one of the plurality of wires of the wiring harness from the plurality of components through a user input.

9. The vehicle electrical system tester of claim 1 wherein the signal comprises a DC signal.

10. The vehicle electrical system tester of claim 1 wherein the signal comprises a AC signal.

11. The vehicle electrical system tester of claim 1 wherein the parameter relates to the ability of the at least one of the plurality of wires to carry digital data.

12. The vehicle electrical system tester of claim 1 including a user output and wherein the test circuitry prompts an operator to disconnect at least one end of the plurality of wires from the vehicle electrical system through a user output.

13. The vehicle electrical system tester of claim 1 wherein the second Kelvin connection comprises a piercing probe configured to pierce insulation of the at least one of the plurality of wires.

14. The vehicle electrical system tester of claim 1 including a user input coupled to the test circuitry.

15. The vehicle electrical system tester of claim 14 when the user input is configured to receive information related to a gauge of the at least one of the plurality of wires.

16. The vehicle electrical system tester of claim 1 wherein the test circuitry provides an output in the form of “voltage drop at XX amps”.

17. The vehicle electrical system tester of claim 1 wherein the test circuitry provides an output related to electrical parameter of the at least one of the plurality of wires and a scaling factor.

18. The vehicle electrical system tester of claim 1 wherein the electrical parameter of the at least one of the plurality of wires comprises a dynamic parameter.

19. A method of testing wiring of an electrical system of a vehicle, the wiring including a wiring harness which extends between electrical components of the vehicle, the wiring harness including a plurality of wires, the method comprising:

coupling test circuitry to one end of at least one of the plurality of wires in the wiring harness using a first Kelvin connection, the first Kelvin connection comprising a current connection and a sense connection;
coupling the test circuitry to a second end of the at least one of the plurality of wires of the wiring harness using a second Kelvin connection, the second Kelvin connection comprising a current connection and a sense connection; applying a signal with the test circuitry between the first and second ends of the at least one of the plurality of wires of the wiring harness through the current connection of the first Kelvin connection and the current connection of the second Kelvin connection;
measuring a parameter of the at least one of the plurality of wires of the wiring harness with the test circuitry using the sense connection of the first Kelvin connection and the sense connection of the second Kelvin connection; and
provides an output to a user related to a load carrying ability of the at least one of the plurality of wires which is determined based upon the measured parameter.

20. The method of claim 19 including connecting to a battery of the vehicle and wherein the measured parameter is based upon a measurement made through a connection to the battery.

21. The method of claim 19 including providing an output to an operator, the output to the operator assisting the operator in identifying the second end of the at least one of the plurality of wires.

22. The method of claim 19 wherein the output comprises a tone.

23. The method of claim 20 including applying a tone signal to the first end of the at least one of the plurality of wires and receiving the tone signal with a probe proximate the second end of the at least one of the plurality of wires.

24. The method of claim 19 including receiving an input from an operator related to at least one of the components of the vehicle coupled to the first end of the at least one of the plurality of wires of the wiring harness.

25. The method of claim 24 including displaying a plurality of vehicle components on a display and wherein the operator selects a vehicle component coupled to one end of the at least one of the plurality of wires from the plurality of components.

26. The vehicle electrical system tester of claim 1 wherein the test performed on the at least one of the plurality of wires comprises a AC or a DC load capacity test.

27. The vehicle electrical system tester of claim 1 wherein the test performed on the at least one of the plurality of wires comprises detecting an electrical short circuit.

28. The vehicle electrical system tester of claim 1 wherein the test performed on the at least one of the plurality of wires comprises detecting leakage.

29. The vehicle electrical system tester of claim 1 wherein the microprocessor identifies the at least one of the plurality of wires based upon a voltage level bias applied to the first Kelvin connection.

30. The vehicle electrical system tester of claim 29 wherein the microprocessor identifies a power lead or a ground lead based upon the voltage level bias.

31. The vehicle electrical system tester of claim 1, wherein the first Kelvin connection is coupled to a battery and the second Kelvin connection is coupled to a load of the vehicle.

32. The vehicle electrical system tester of claim 1, further comprising a third Kelvin connection and a fourth Kelvin connection, wherein the third Kelvin connection is coupled to a battery and the fourth Kelvin connection is coupled to a load of the vehicle.

Referenced Cited
U.S. Patent Documents
85553 January 1869 Adams
2000665 May 1935 Neal
2417940 March 1947 Lehman
2437772 March 1948 Wall
2514745 July 1950 Dalzell
2727221 December 1955 Springg
3025455 March 1962 Jonsson
3178686 April 1965 Mills
3215194 November 1965 Sununu et al.
3223969 December 1965 Alexander
3267452 August 1966 Wolf
3356936 December 1967 Smith
3562634 February 1971 Latner
3593099 July 1971 Scholl
3607673 September 1971 Seyl
3652341 March 1972 Halsall et al.
3676770 July 1972 Sharaf et al.
3699433 October 1972 Smith, Jr.
3729989 May 1973 Little
3750011 July 1973 Kreps
3753094 August 1973 Furuishi et al.
3776177 December 1973 Bryant et al.
3796124 March 1974 Crosa
3808522 April 1974 Sharaf
3811089 May 1974 Strzelewicz
3816805 June 1974 Terry
3850490 November 1974 Zehr
3857082 December 1974 van Opijnen
3873911 March 1975 Champlin
3876931 April 1975 Godshalk
3886426 May 1975 Daggett
3886443 May 1975 Miyakawa et al.
3889248 June 1975 Ritter
3906329 September 1975 Bader
3909708 September 1975 Champlin
3920284 November 1975 Lane et al.
3936744 February 3, 1976 Perlmutter
3946299 March 23, 1976 Christianson et al.
3947757 March 30, 1976 Grube et al.
3969667 July 13, 1976 McWilliams
3979664 September 7, 1976 Harris
3984762 October 5, 1976 Dowgiallo, Jr.
3984768 October 5, 1976 Staples
3989544 November 2, 1976 Santo
3997830 December 14, 1976 Newell et al.
4008619 February 22, 1977 Alcaide et al.
4023882 May 17, 1977 Pettersson
4024953 May 24, 1977 Nailor, III
4047091 September 6, 1977 Hutchines et al.
4053824 October 11, 1977 Dupuis et al.
4056764 November 1, 1977 Endo et al.
4057313 November 8, 1977 Polizzano
4070624 January 24, 1978 Taylor
4086531 April 25, 1978 Bernier
4106025 August 8, 1978 Katz
4112351 September 5, 1978 Back et al.
4114083 September 12, 1978 Benham et al.
4126874 November 21, 1978 Suzuki et al.
4160916 July 10, 1979 Papasideris
4178546 December 11, 1979 Hulls et al.
4193025 March 11, 1980 Frailing et al.
4207610 June 10, 1980 Gordon
4207611 June 10, 1980 Gordon
4217645 August 12, 1980 Barry et al.
4218745 August 19, 1980 Perkins
4280457 July 28, 1981 Bloxham
4297639 October 27, 1981 Branham
4307342 December 22, 1981 Peterson
4315204 February 9, 1982 Sievers et al.
4316185 February 16, 1982 Watrous et al.
4322685 March 30, 1982 Frailing et al.
4351405 September 28, 1982 Fields et al.
4352067 September 28, 1982 Ottone
4360780 November 23, 1982 Skutch, Jr.
4361809 November 30, 1982 Bil et al.
4363407 December 14, 1982 Buckler et al.
4369407 January 18, 1983 Korbell
4379989 April 12, 1983 Kurz et al.
4379990 April 12, 1983 Sievers et al.
4385269 May 24, 1983 Aspinwall et al.
4390828 June 28, 1983 Converse et al.
4392101 July 5, 1983 Saar et al.
4396880 August 2, 1983 Windebank
4408157 October 4, 1983 Beaubien
4412169 October 25, 1983 Dell'Orto
4423378 December 27, 1983 Marino et al.
4423379 December 27, 1983 Jacobs et al.
4424491 January 3, 1984 Bobbett et al.
4425791 January 17, 1984 Kling
4441359 April 10, 1984 Ezoe
4459548 July 10, 1984 Lentz et al.
4514694 April 30, 1985 Finger
4520353 May 28, 1985 McAuliffe
4521498 June 4, 1985 Juergens
4564798 January 14, 1986 Young
4620767 November 4, 1986 Woolf
4633418 December 30, 1986 Bishop
4637359 January 20, 1987 Cook
4659977 April 21, 1987 Kissel et al.
4663580 May 5, 1987 Wortman
4665370 May 12, 1987 Holland
4667143 May 19, 1987 Cooper et al.
4667279 May 19, 1987 Maier
4678998 July 7, 1987 Muramatsu
4679000 July 7, 1987 Clark
4680528 July 14, 1987 Mikami et al.
4686442 August 11, 1987 Radomski
4697134 September 29, 1987 Burkum et al.
4707795 November 17, 1987 Alber et al.
4709202 November 24, 1987 Koenck et al.
4710861 December 1, 1987 Kanner
4719428 January 12, 1988 Liebermann
4723656 February 9, 1988 Kiernan et al.
4743855 May 10, 1988 Randin et al.
4745349 May 17, 1988 Palanisamy et al.
4773011 September 20, 1988 VanHoose
4781629 November 1, 1988 Mize
D299909 February 21, 1989 Casey
4816768 March 28, 1989 Champlin
4820966 April 11, 1989 Fridman
4825170 April 25, 1989 Champlin
4847547 July 11, 1989 Eng, Jr. et al.
4849700 July 18, 1989 Morioka et al.
4874679 October 17, 1989 Miyagawa
4876495 October 24, 1989 Palanisamy et al.
4881038 November 14, 1989 Champlin
4885523 December 5, 1989 Koenck
4888716 December 19, 1989 Ueno
4901007 February 13, 1990 Sworm
4907176 March 6, 1990 Bahnick et al.
4912416 March 27, 1990 Champlin
4913116 April 3, 1990 Katogi et al.
4926330 May 15, 1990 Abe et al.
4929931 May 29, 1990 McCuen
4931738 June 5, 1990 MacIntyre et al.
4932905 June 12, 1990 Richards
4933845 June 12, 1990 Hayes
4934957 June 19, 1990 Bellusci
4937528 June 26, 1990 Palanisamy
4947124 August 7, 1990 Hauser
4949046 August 14, 1990 Seyfang
4956597 September 11, 1990 Heavey et al.
4965738 October 23, 1990 Bauer et al.
4968941 November 6, 1990 Rogers
4968942 November 6, 1990 Palanisamy
4969834 November 13, 1990 Johnson
4983086 January 8, 1991 Hatrock
5004979 April 2, 1991 Marino et al.
5030916 July 9, 1991 Bokitch
5032825 July 16, 1991 Kuznicki
5034893 July 23, 1991 Fisher
5037778 August 6, 1991 Stark et al.
5047722 September 10, 1991 Wurst et al.
5081565 January 14, 1992 Nabha et al.
5087881 February 11, 1992 Peacock
5095223 March 10, 1992 Thomas
5108320 April 28, 1992 Kimber
5109213 April 28, 1992 Williams
5126675 June 30, 1992 Yang
5130658 July 14, 1992 Bohmer
5140269 August 18, 1992 Champlin
5144218 September 1, 1992 Bosscha
5144248 September 1, 1992 Alexandres et al.
D330338 October 20, 1992 Wang
5159272 October 27, 1992 Rao et al.
5160881 November 3, 1992 Schramm et al.
5164653 November 17, 1992 Reem
5168208 December 1, 1992 Schultz et al.
5170124 December 8, 1992 Blair et al.
5179335 January 12, 1993 Nor
5187382 February 16, 1993 Kondo
5194799 March 16, 1993 Tomantschger
5204611 April 20, 1993 Nor et al.
5214370 May 25, 1993 Harm et al.
5214385 May 25, 1993 Gabriel et al.
5223747 June 29, 1993 Tschulena
5241275 August 31, 1993 Fang
5254952 October 19, 1993 Salley et al.
5266880 November 30, 1993 Newland
5278759 January 11, 1994 Berra et al.
5281919 January 25, 1994 Palanisamy
5281920 January 25, 1994 Wurst
5295078 March 15, 1994 Stich et al.
5298797 March 29, 1994 Redl
5300874 April 5, 1994 Shimamoto et al.
5302902 April 12, 1994 Groehl
5313152 May 17, 1994 Wozniak et al.
5315287 May 24, 1994 Sol
5321626 June 14, 1994 Palladino
5321627 June 14, 1994 Reher
5323337 June 21, 1994 Wilson et al.
5325041 June 28, 1994 Briggs
5331268 July 19, 1994 Patino et al.
5332927 July 26, 1994 Paul et al.
5336993 August 9, 1994 Thomas et al.
5338515 August 16, 1994 Dalla Betta et al.
5339018 August 16, 1994 Brokaw
5343380 August 30, 1994 Champlin
5345384 September 6, 1994 Przybyla et al.
5347163 September 13, 1994 Yoshimura
5352968 October 4, 1994 Reni et al.
5357519 October 18, 1994 Martin et al.
5365160 November 15, 1994 Leppo et al.
5365453 November 15, 1994 Startup et al.
5369364 November 29, 1994 Renirie et al.
5381096 January 10, 1995 Hirzel
5384540 January 24, 1995 Dessel
5387871 February 7, 1995 Tsai
5394093 February 28, 1995 Cervas
5402007 March 28, 1995 Center et al.
5410754 April 1995 Klotzbach et al.
5412308 May 2, 1995 Brown
5412323 May 2, 1995 Kato et al.
5425041 June 13, 1995 Seko et al.
5426371 June 20, 1995 Salley et al.
5426416 June 20, 1995 Jefferies et al.
5430645 July 4, 1995 Keller
5432025 July 11, 1995 Cox
5432426 July 11, 1995 Yoshida
5434495 July 18, 1995 Toko
5435185 July 25, 1995 Eagan
5442274 August 15, 1995 Tamai
5445026 August 29, 1995 Eagan
5449996 September 12, 1995 Matsumoto et al.
5449997 September 12, 1995 Gilmore et al.
5451881 September 19, 1995 Finger
5453027 September 26, 1995 Buell et al.
5457377 October 10, 1995 Jonsson
5459660 October 17, 1995 Berra
5469043 November 21, 1995 Cherng et al.
5485090 January 16, 1996 Stephens
5488300 January 30, 1996 Jamieson
5504674 April 2, 1996 Chen et al.
5508599 April 16, 1996 Koenck
5519383 May 21, 1996 De La Rosa
5528148 June 18, 1996 Rogers
5537967 July 23, 1996 Tashiro et al.
5541489 July 30, 1996 Dunstan
5546317 August 13, 1996 Andrieu
5548273 August 20, 1996 Nicol et al.
5550485 August 27, 1996 Falk
5561380 October 1, 1996 Sway-Tin et al.
5562501 October 8, 1996 Kinoshita et al.
5563496 October 8, 1996 McClure
5572136 November 5, 1996 Champlin
5573611 November 12, 1996 Koch et al.
5574355 November 12, 1996 McShane et al.
5578915 November 26, 1996 Crouch, Jr. et al.
5583416 December 10, 1996 Klang
5585416 December 17, 1996 Audett et al.
5585728 December 17, 1996 Champlin
5589757 December 31, 1996 Klang
5592093 January 7, 1997 Klingbiel
5592094 January 7, 1997 Ichikawa
5596260 January 21, 1997 Moravec et al.
5596261 January 21, 1997 Suyama
5598098 January 28, 1997 Champlin
5602462 February 11, 1997 Stich et al.
5606242 February 25, 1997 Hull et al.
5614788 March 25, 1997 Mullins et al.
5621298 April 15, 1997 Harvey
5631536 May 20, 1997 Tseng
5631831 May 20, 1997 Bird et al.
5633985 May 27, 1997 Severson et al.
5637978 June 10, 1997 Kellett et al.
5642031 June 24, 1997 Brotto
5644212 July 1, 1997 Takahashi
5650937 July 22, 1997 Bounaga
5652501 July 29, 1997 McClure et al.
5653659 August 5, 1997 Kunibe et al.
5654623 August 5, 1997 Shiga et al.
5656920 August 12, 1997 Cherng et al.
5661368 August 26, 1997 Deol et al.
5666040 September 9, 1997 Bourbeau
5675234 October 7, 1997 Greene
5677077 October 14, 1997 Faulk
5684678 November 4, 1997 Barrett
5691621 November 25, 1997 Phuoc et al.
5699050 December 16, 1997 Kanazawa
5701089 December 23, 1997 Perkins
5705929 January 6, 1998 Caravello et al.
5707015 January 13, 1998 Guthrie
5710503 January 20, 1998 Sideris et al.
5711648 January 27, 1998 Hammerslag
5712795 January 27, 1998 Layman et al.
5717336 February 10, 1998 Basell et al.
5717937 February 10, 1998 Fritz
5721688 February 24, 1998 Bramwell
5732074 March 24, 1998 Spaur et al.
5739667 April 14, 1998 Matsuda et al.
5744962 April 28, 1998 Alber et al.
5745044 April 28, 1998 Hyatt, Jr. et al.
5747189 May 5, 1998 Perkins
5747909 May 5, 1998 Syverson et al.
5747967 May 5, 1998 Muljadi et al.
5754417 May 19, 1998 Nicollini
5757192 May 26, 1998 McShane et al.
5760587 June 2, 1998 Harvey
5772468 June 30, 1998 Kowalski et al.
5773962 June 30, 1998 Nor
5773978 June 30, 1998 Becker
5778326 July 7, 1998 Moroto et al.
5780974 July 14, 1998 Pabla et al.
5780980 July 14, 1998 Naito
5789899 August 4, 1998 van Phuoc et al.
5793359 August 11, 1998 Ushikubo
5796239 August 18, 1998 van Phuoc et al.
5808469 September 15, 1998 Kopera
5811979 September 22, 1998 Rhein
5818201 October 6, 1998 Stockstad et al.
5818234 October 6, 1998 McKinnon
5820407 October 13, 1998 Morse et al.
5821756 October 13, 1998 McShane et al.
5821757 October 13, 1998 Alvarez et al.
5825174 October 20, 1998 Parker
5831435 November 3, 1998 Troy
5832396 November 3, 1998 Moroto et al.
5850113 December 15, 1998 Weimer et al.
5862515 January 19, 1999 Kobayashi et al.
5865638 February 2, 1999 Trafton
5869951 February 9, 1999 Takahashi
5871858 February 16, 1999 Thomsen et al.
5872443 February 16, 1999 Williamson
5872453 February 16, 1999 Shimoyama et al.
5883306 March 16, 1999 Hwang
5884202 March 16, 1999 Arjomand
5895440 April 20, 1999 Proctor et al.
5903154 May 11, 1999 Zhang et al.
5903716 May 11, 1999 Kimber et al.
5912534 June 15, 1999 Benedict
5914605 June 22, 1999 Bertness
5916287 June 29, 1999 Arjomand et al.
5927938 July 27, 1999 Hammerslag
5929609 July 27, 1999 Joy et al.
5935180 August 10, 1999 Fieramosca et al.
5939855 August 17, 1999 Proctor et al.
5939861 August 17, 1999 Joko et al.
5945829 August 31, 1999 Bertness
5946605 August 31, 1999 Takahisa et al.
5950144 September 7, 1999 Hall et al.
5951229 September 14, 1999 Hammerslag
5953322 September 14, 1999 Kimball
5955951 September 21, 1999 Wischerop et al.
5961561 October 5, 1999 Wakefield, II
5961604 October 5, 1999 Anderson et al.
5963012 October 5, 1999 Garcia et al.
5969625 October 19, 1999 Russo
5973598 October 26, 1999 Beigel
5978805 November 2, 1999 Carson
5982138 November 9, 1999 Krieger
5990664 November 23, 1999 Rahman
6002238 December 14, 1999 Champlin
6005489 December 21, 1999 Siegle et al.
6005759 December 21, 1999 Hart et al.
6008652 December 28, 1999 Theofanopoulos et al.
6009369 December 28, 1999 Boisvert et al.
6016047 January 18, 2000 Notten et al.
6031354 February 29, 2000 Wiley et al.
6031368 February 29, 2000 Klippel et al.
6037745 March 14, 2000 Koike et al.
6037749 March 14, 2000 Parsonage
6037751 March 14, 2000 Klang
6037777 March 14, 2000 Champlin
6037778 March 14, 2000 Makhija
6046514 April 4, 2000 Rouillard et al.
6051976 April 18, 2000 Bertness
6055468 April 25, 2000 Kaman et al.
6061638 May 9, 2000 Joyce
6064372 May 16, 2000 Kahkoska
6072299 June 6, 2000 Kurle et al.
6072300 June 6, 2000 Tsuji
6075339 June 13, 2000 Reipur et al.
6081098 June 27, 2000 Bertness et al.
6081109 June 27, 2000 Seymour et al.
6081154 June 27, 2000 Ezell et al.
6087815 July 11, 2000 Pfeifer et al.
6091238 July 18, 2000 McDermott
6091245 July 18, 2000 Bertness
6094033 July 25, 2000 Ding et al.
6097193 August 1, 2000 Bramwell
6100670 August 8, 2000 Levesque
6100815 August 8, 2000 Pailthorp
6104167 August 15, 2000 Bertness et al.
6113262 September 5, 2000 Purola et al.
6114834 September 5, 2000 Parise
6121880 September 19, 2000 Scott et al.
6136914 October 24, 2000 Hergenrother et al.
6137269 October 24, 2000 Champlin
6140797 October 31, 2000 Dunn
6141608 October 31, 2000 Rother
6144185 November 7, 2000 Dougherty et al.
6147598 November 14, 2000 Murphy et al.
6150793 November 21, 2000 Lesesky et al.
6158000 December 5, 2000 Collins
6161640 December 19, 2000 Yamaguchi
6163156 December 19, 2000 Bertness
6164063 December 26, 2000 Mendler
6167349 December 26, 2000 Alvarez
6172483 January 9, 2001 Champlin
6172505 January 9, 2001 Bertness
6177737 January 23, 2001 Palfey et al.
6181545 January 30, 2001 Amatucci et al.
6184656 February 6, 2001 Karunasiri et al.
6191557 February 20, 2001 Gray et al.
6202739 March 20, 2001 Pal et al.
6211651 April 3, 2001 Nemoto
6211653 April 3, 2001 Stasko
6215275 April 10, 2001 Bean
6218805 April 17, 2001 Melcher
6218936 April 17, 2001 Imao
6222342 April 24, 2001 Eggert et al.
6222369 April 24, 2001 Champlin
D442503 May 22, 2001 Lundbeck et al.
6225808 May 1, 2001 Varghese et al.
6225898 May 1, 2001 Kamiya et al.
6236186 May 22, 2001 Helton et al.
6236332 May 22, 2001 Conkright et al.
6236949 May 22, 2001 Hart
6238253 May 29, 2001 Qualls
6242887 June 5, 2001 Burke
6249124 June 19, 2001 Bertness
6250973 June 26, 2001 Lowery et al.
6254438 July 3, 2001 Gaunt
6259170 July 10, 2001 Limoge et al.
6259254 July 10, 2001 Klang
6262563 July 17, 2001 Champlin
6262692 July 17, 2001 Babb
6263268 July 17, 2001 Nathanson
6263322 July 17, 2001 Kirkevold et al.
6271643 August 7, 2001 Becker et al.
6271748 August 7, 2001 Derbyshire et al.
6272387 August 7, 2001 Yoon
6275008 August 14, 2001 Arai et al.
6285191 September 4, 2001 Gollomp et al.
6294896 September 25, 2001 Champlin
6294897 September 25, 2001 Champlin
6304087 October 16, 2001 Bertness
6307349 October 23, 2001 Koenck et al.
6310481 October 30, 2001 Bertness
6313607 November 6, 2001 Champlin
6313608 November 6, 2001 Varghese et al.
6316914 November 13, 2001 Bertness
6320351 November 20, 2001 Ng et al.
6323650 November 27, 2001 Bertness et al.
6324042 November 27, 2001 Andrews
6329793 December 11, 2001 Bertness et al.
6331762 December 18, 2001 Bertness
6332113 December 18, 2001 Bertness
6346795 February 12, 2002 Haraguchi et al.
6347958 February 19, 2002 Tsai
6351102 February 26, 2002 Troy
6356042 March 12, 2002 Kahlon et al.
6356083 March 12, 2002 Ying
6359441 March 19, 2002 Bertness
6359442 March 19, 2002 Henningson et al.
6363303 March 26, 2002 Bertness
RE37677 April 30, 2002 Irie
6377031 April 23, 2002 Karuppana et al.
6384608 May 7, 2002 Namaky
6388448 May 14, 2002 Cervas
6389337 May 14, 2002 Kolls
6392414 May 21, 2002 Bertness
6396278 May 28, 2002 Makhija
6407554 June 18, 2002 Godau et al.
6411098 June 25, 2002 Laletin
6417669 July 9, 2002 Champlin
6420852 July 16, 2002 Sato
6424157 July 23, 2002 Gollomp et al.
6424158 July 23, 2002 Klang
6433512 August 13, 2002 Birkler et al.
6437957 August 20, 2002 Karuppana et al.
6441585 August 27, 2002 Bertness
6445158 September 3, 2002 Bertness et al.
6448778 September 10, 2002 Rankin
6449726 September 10, 2002 Smith
6456036 September 24, 2002 Thandiwe
6456045 September 24, 2002 Troy et al.
6465908 October 15, 2002 Karuppana et al.
6466025 October 15, 2002 Klang
6466026 October 15, 2002 Champlin
6469511 October 22, 2002 Vonderhaar et al.
6473659 October 29, 2002 Shah et al.
6477478 November 5, 2002 Jones et al.
6495990 December 17, 2002 Champlin
6497209 December 24, 2002 Karuppana et al.
6500025 December 31, 2002 Moenkhaus et al.
6505507 January 14, 2003 Imao
6507196 January 14, 2003 Thomsen et al.
6526361 February 25, 2003 Jones et al.
6529723 March 4, 2003 Bentley
6531848 March 11, 2003 Chitsazan et al.
6532425 March 11, 2003 Boost et al.
6533316 March 18, 2003 Breed et al.
6534992 March 18, 2003 Meissner et al.
6534993 March 18, 2003 Bertness
6536536 March 25, 2003 Gass et al.
6544078 April 8, 2003 Palmisano et al.
6545599 April 8, 2003 Derbyshire et al.
6556019 April 29, 2003 Bertness
6566883 May 20, 2003 Vonderhaar et al.
6570385 May 27, 2003 Roberts et al.
6577107 June 10, 2003 Kechmire
6586941 July 1, 2003 Bertness et al.
6597150 July 22, 2003 Bertness et al.
6599243 July 29, 2003 Woltermann et al.
6600815 July 29, 2003 Walding
6611740 August 26, 2003 Lowrey et al.
6614349 September 2, 2003 Proctor et al.
6618644 September 9, 2003 Bean
6621272 September 16, 2003 Champlin
6623314 September 23, 2003 Cox et al.
6624635 September 23, 2003 Lui
6628011 September 30, 2003 Droppo et al.
6629054 September 30, 2003 Makhija et al.
6633165 October 14, 2003 Bertness
6635974 October 21, 2003 Karuppana et al.
6636790 October 21, 2003 Lightner et al.
6667624 December 23, 2003 Raichle et al.
6679212 January 20, 2004 Kelling
6686542 February 3, 2004 Zhang
6696819 February 24, 2004 Bertness
6707303 March 16, 2004 Bertness et al.
6732031 May 4, 2004 Lightner et al.
6736941 May 18, 2004 Oku et al.
6737831 May 18, 2004 Champlin
6738697 May 18, 2004 Breed
6740990 May 25, 2004 Tozuka et al.
6744149 June 1, 2004 Karuppana et al.
6745153 June 1, 2004 White et al.
6759849 July 6, 2004 Bertness
6771073 August 3, 2004 Henningson et al.
6777945 August 17, 2004 Roberts et al.
6781344 August 24, 2004 Hedegor et al.
6781382 August 24, 2004 Johnson
6784635 August 31, 2004 Larson
6784637 August 31, 2004 Raichle et al.
6788025 September 7, 2004 Bertness et al.
6795782 September 21, 2004 Bertness et al.
6796841 September 28, 2004 Cheng et al.
6805090 October 19, 2004 Bertness et al.
6806716 October 19, 2004 Bertness et al.
6825669 November 30, 2004 Raichle et al.
6832141 December 14, 2004 Skeen et al.
6842707 January 11, 2005 Raichle et al.
6845279 January 18, 2005 Gilmore et al.
6850037 February 1, 2005 Bertness
6856162 February 15, 2005 Greatorex et al.
6856972 February 15, 2005 Yun et al.
6871151 March 22, 2005 Bertness
6885195 April 26, 2005 Bertness
6888468 May 3, 2005 Bertness
6891378 May 10, 2005 Bertness et al.
6904796 June 14, 2005 Pacsai et al.
6906522 June 14, 2005 Bertness et al.
6906523 June 14, 2005 Bertness et al.
6906624 June 14, 2005 McClelland et al.
6909287 June 21, 2005 Bertness
6909356 June 21, 2005 Brown et al.
6911825 June 28, 2005 Namaky
6913483 July 5, 2005 Restaino et al.
6914413 July 5, 2005 Bertness et al.
6919725 July 19, 2005 Bertness et al.
6930485 August 16, 2005 Bertness et al.
6933727 August 23, 2005 Bertness et al.
6941234 September 6, 2005 Bertness et al.
6957133 October 18, 2005 Hunt et al.
6967484 November 22, 2005 Bertness
6972662 December 6, 2005 Ohkawa et al.
6983212 January 3, 2006 Burns
6993421 January 31, 2006 Pillar et al.
6998847 February 14, 2006 Bertness et al.
7003410 February 21, 2006 Bertness et al.
7003411 February 21, 2006 Bertness
7012433 March 14, 2006 Smith et al.
7015674 March 21, 2006 VonderHaar
7029338 April 18, 2006 Orange et al.
7034541 April 25, 2006 Bertness et al.
7039533 May 2, 2006 Bertness et al.
7042346 May 9, 2006 Paulsen
7058525 June 6, 2006 Bertness et al.
7069979 July 4, 2006 Tobias
7081755 July 25, 2006 Klang et al.
7089127 August 8, 2006 Thibedeau et al.
7098666 August 29, 2006 Patino
7102556 September 5, 2006 White
7106070 September 12, 2006 Bertness et al.
7116109 October 3, 2006 Klang
7119686 October 10, 2006 Bertness et al.
7120488 October 10, 2006 Nova et al.
7126341 October 24, 2006 Bertness et al.
7129706 October 31, 2006 Kalley
7154276 December 26, 2006 Bertness
7170393 January 30, 2007 Martin
7177925 February 13, 2007 Carcido et al.
7182147 February 27, 2007 Cutler et al.
7184905 February 27, 2007 Stefan
7198510 April 3, 2007 Bertness
7200424 April 3, 2007 Tischer et al.
7202636 April 10, 2007 Reynolds et al.
7208914 April 24, 2007 Klang
7209850 April 24, 2007 Brott et al.
7209860 April 24, 2007 Trsar et al.
7212887 May 1, 2007 Shah et al
7219023 May 15, 2007 Banke et al.
7233128 June 19, 2007 Brost et al.
7235977 June 26, 2007 Koran et al.
7246015 July 17, 2007 Bertness et al.
7272519 September 18, 2007 Lesesky et al.
7287001 October 23, 2007 Falls et al.
7295936 November 13, 2007 Bertness et al.
7319304 January 15, 2008 Veloo et al.
7339477 March 4, 2008 Puzio et al.
7363175 April 22, 2008 Bertness et al.
7398176 July 8, 2008 Bertness
7408358 August 5, 2008 Knopf
7425833 September 16, 2008 Bertness et al.
7446536 November 4, 2008 Bertness
7453238 November 18, 2008 Melichar
7479763 January 20, 2009 Bertness
7498767 March 3, 2009 Brown et al.
7501795 March 10, 2009 Bertness et al.
7505856 March 17, 2009 Restaino et al.
7545146 June 9, 2009 Klang et al.
7557586 July 7, 2009 Vonderhaar et al.
7590476 September 15, 2009 Shumate
7592776 September 22, 2009 Tsukamoto et al.
7595643 September 29, 2009 Klang
7598699 October 6, 2009 Restaino et al.
7598743 October 6, 2009 Bertness
7598744 October 6, 2009 Bertness et al.
7619417 November 17, 2009 Klang
7642786 January 5, 2010 Philbrook
7642787 January 5, 2010 Bertness et al.
7656162 February 2, 2010 Vonderhaar et al.
7657386 February 2, 2010 Thibedeau et al.
7667437 February 23, 2010 Johnson et al.
7679325 March 16, 2010 Seo
7684908 March 23, 2010 Ogilvie et al.
7688074 March 30, 2010 Cox et al.
7698179 April 13, 2010 Leung et al.
7705602 April 27, 2010 Bertness
7706991 April 27, 2010 Bertness et al.
7710119 May 4, 2010 Bertness
7723993 May 25, 2010 Klang
7728556 June 1, 2010 Yano et al.
7728597 June 1, 2010 Bertness
7744149 June 29, 2010 Murray et al.
7751953 July 6, 2010 Namaky
7772850 August 10, 2010 Bertness
7774151 August 10, 2010 Bertness
7777612 August 17, 2010 Sampson et al.
7791348 September 7, 2010 Brown et al.
7808375 October 5, 2010 Bertness et al.
7848857 December 7, 2010 Nasr et al.
7883002 February 8, 2011 Jin et al.
7902990 March 8, 2011 Delmonico et al.
7924015 April 12, 2011 Bertness
7940053 May 10, 2011 Brown et al.
7990155 August 2, 2011 Henningson
7999505 August 16, 2011 Bertness
8164343 April 24, 2012 Bertness
8306690 November 6, 2012 Bertness
20010012738 August 9, 2001 Duperret
20010035737 November 1, 2001 Nakanishi et al.
20010048215 December 6, 2001 Breed et al.
20020003423 January 10, 2002 Bertness et al.
20020004694 January 10, 2002 McLeod
20020007237 January 17, 2002 Phung et al.
20020010558 January 24, 2002 Bertness et al.
20020021135 February 21, 2002 Li et al.
20020027346 March 7, 2002 Breed et al.
20020030495 March 14, 2002 Kechmire
20020036504 March 28, 2002 Troy et al.
20020041175 April 11, 2002 Lauper et al.
20020044050 April 18, 2002 Derbyshire et al.
20020047711 April 25, 2002 Bertness et al.
20020050163 May 2, 2002 Makhija et al.
20020074398 June 20, 2002 Lancos et al.
20020116140 August 22, 2002 Rider
20020118111 August 29, 2002 Brown et al.
20020121901 September 5, 2002 Hoffman
20020128985 September 12, 2002 Greenwald
20020130665 September 19, 2002 Bertness et al.
20020171428 November 21, 2002 Bertness
20020176010 November 28, 2002 Wallach et al.
20030006779 January 9, 2003 H. Youval
20030009270 January 9, 2003 Breed
20030017753 January 23, 2003 Palmisano et al.
20030025481 February 6, 2003 Bertness
20030036909 February 20, 2003 Kato
20030040873 February 27, 2003 Lesesky et al.
20030060953 March 27, 2003 Chen
20030078743 April 24, 2003 Bertness et al.
20030088375 May 8, 2003 Bertness et al.
20030124417 July 3, 2003 Bertness et al.
20030128011 July 10, 2003 Bertness et al.
20030128036 July 10, 2003 Henningson et al.
20030137277 July 24, 2003 Mori et al.
20030169018 September 11, 2003 Berels et al.
20030169019 September 11, 2003 Oosaki
20030171111 September 11, 2003 Clark
20030177417 September 18, 2003 Malhotra et al.
20030184262 October 2, 2003 Makhija
20030184306 October 2, 2003 Bertness et al.
20030187556 October 2, 2003 Suzuki
20030194672 October 16, 2003 Roberts et al.
20030197512 October 23, 2003 Miller et al.
20030212311 November 13, 2003 Nova et al.
20030214395 November 20, 2003 Flowerday et al.
20030236656 December 25, 2003 Dougherty
20040000590 January 1, 2004 Raichle et al.
20040000891 January 1, 2004 Raichle et al.
20040000893 January 1, 2004 Raichle et al.
20040000913 January 1, 2004 Raichle et al.
20040000915 January 1, 2004 Raichle et al.
20040002824 January 1, 2004 Raichle et al.
20040002825 January 1, 2004 Raichle et al.
20040002836 January 1, 2004 Raichle et al.
20040032264 February 19, 2004 Schoch
20040036443 February 26, 2004 Bertness
20040044452 March 4, 2004 Bauer et al.
20040044454 March 4, 2004 Ross et al.
20040049361 March 11, 2004 Hamdan et al.
20040051532 March 18, 2004 Smith et al.
20040051533 March 18, 2004 Namaky
20040051534 March 18, 2004 Kobayashi et al.
20040054503 March 18, 2004 Namaky
20040064225 April 1, 2004 Jammu et al.
20040088087 May 6, 2004 Fukushima et al.
20040113588 June 17, 2004 Mikuriya et al.
20040145342 July 29, 2004 Lyon
20040164706 August 26, 2004 Osborne
20040172177 September 2, 2004 Nagai et al.
20040178185 September 16, 2004 Yoshikawa et al.
20040189309 September 30, 2004 Bertness et al.
20040199343 October 7, 2004 Cardinal et al.
20040207367 October 21, 2004 Taniguchi et al.
20040227523 November 18, 2004 Namaky
20040239332 December 2, 2004 Mackel et al.
20040251876 December 16, 2004 Bertness et al.
20050007068 January 13, 2005 Johnson et al.
20050009122 January 13, 2005 Whelan et al.
20050017726 January 27, 2005 Koran et al.
20050017952 January 27, 2005 Hsi
20050021294 January 27, 2005 Trsar et al.
20050025299 February 3, 2005 Tischer et al.
20050043868 February 24, 2005 Mitcham
20050057256 March 17, 2005 Bertness
20050060070 March 17, 2005 Kapolka et al.
20050073314 April 7, 2005 Bertness et al.
20050076381 April 7, 2005 Gross
20050096809 May 5, 2005 Skeen et al.
20050102073 May 12, 2005 Ingram
20050128083 June 16, 2005 Puzio et al.
20050128902 June 16, 2005 Tsai
20050134282 June 23, 2005 Averbuch
20050143882 June 30, 2005 Umezawa
20050159847 July 21, 2005 Shah et al.
20050162172 July 28, 2005 Bertness
20050168226 August 4, 2005 Quint et al.
20050173142 August 11, 2005 Cutler et al.
20050182536 August 18, 2005 Doyle et al.
20050212521 September 29, 2005 Bertness et al.
20050213874 September 29, 2005 Kline
20050218902 October 6, 2005 Restaino et al.
20050231205 October 20, 2005 Bertness et al.
20050254106 November 17, 2005 Silverbrook et al.
20050256617 November 17, 2005 Cawthorne et al.
20050258241 November 24, 2005 McNutt et al.
20060012330 January 19, 2006 Okumura et al.
20060017447 January 26, 2006 Bertness
20060030980 February 9, 2006 St. Denis
20060043976 March 2, 2006 Gervais
20060089767 April 27, 2006 Sowa
20060095230 May 4, 2006 Grier et al.
20060152224 July 13, 2006 Kim et al.
20060161313 July 20, 2006 Rogers et al.
20060161390 July 20, 2006 Namaky et al.
20060217914 September 28, 2006 Bertness
20060244457 November 2, 2006 Henningson et al.
20060282323 December 14, 2006 Walker et al.
20070024460 February 1, 2007 Clark
20070026916 February 1, 2007 Juds et al.
20070046261 March 1, 2007 Porebski
20070088472 April 19, 2007 Ganzhorn et al.
20070108942 May 17, 2007 Johnson et al.
20070159177 July 12, 2007 Bertness et al.
20070182576 August 9, 2007 Proska et al.
20070194791 August 23, 2007 Huang
20070194793 August 23, 2007 Bertness
20070205983 September 6, 2007 Naimo
20070259256 November 8, 2007 Le Canut et al.
20080036421 February 14, 2008 Seo et al.
20080059014 March 6, 2008 Nasr et al.
20080086246 April 10, 2008 Bolt et al.
20080094068 April 24, 2008 Scott
20080169818 July 17, 2008 Lesesky et al.
20080303528 December 11, 2008 Kim
20080303529 December 11, 2008 Nakamura et al.
20080315830 December 25, 2008 Bertness
20090006476 January 1, 2009 Andreasen et al.
20090024266 January 22, 2009 Bertness
20090085571 April 2, 2009 Bertness
20090146800 June 11, 2009 Grimlund et al.
20090198372 August 6, 2009 Hammerslag
20090247020 October 1, 2009 Gathman et al.
20090276115 November 5, 2009 Chen
20100023198 January 28, 2010 Hamilton
20100145780 June 10, 2010 Nishikawa et al.
20100314950 December 16, 2010 Rutkowski et al.
20110004427 January 6, 2011 Gorbold et al.
20110215767 September 8, 2011 Johnson et al.
20110273181 November 10, 2011 Park et al.
20120046824 February 23, 2012 Ruther et al.
20120074904 March 29, 2012 Rutkowski et al.
20120256494 October 11, 2012 Kesler
20130158782 June 20, 2013 Bertness et al.
20130311124 November 21, 2013 Van Bremen
20140002094 January 2, 2014 Champlin
Foreign Patent Documents
2470964 January 2002 CN
201063352 May 2008 CN
29 26 716 January 1981 DE
196 38 324 September 1996 DE
10 2008 036 595 February 2010 DE
0 022 450 January 1981 EP
0 391 694 April 1990 EP
0 476 405 September 1991 EP
0 637 754 February 1995 EP
0 772 056 May 1997 EP
0 982 159 March 2000 EP
1 810 869 November 2004 EP
1 807 710 July 2007 EP
1 807 710 January 2010 EP
2 749 397 December 1997 FR
154 016 November 1920 GB
2 029 586 March 1980 GB
2 088 159 June 1982 GB
2 246 916 October 1990 GB
2 275 783 July 1994 GB
2 387 235 October 2003 GB
59-17892 January 1984 JP
59-17893 January 1984 JP
59017894 January 1984 JP
59215674 December 1984 JP
60225078 November 1985 JP
62-180284 August 1987 JP
63027776 February 1988 JP
03274479 December 1991 JP
03282276 December 1991 JP
4-8636 January 1992 JP
04095788 March 1992 JP
04131779 May 1992 JP
04372536 December 1992 JP
05211724 August 1993 JP
5216550 August 1993 JP
7-128414 May 1995 JP
09061505 March 1997 JP
10056744 February 1998 JP
10232273 September 1998 JP
11103503 April 1999 JP
11-150809 June 1999 JP
11-271409 October 1999 JP
2001057711 February 2001 JP
2003-346909 December 2003 JP
2006331976 December 2006 JP
2009-244166 October 2009 JP
2089015 August 1997 RU
WO 93/22666 November 1993 WO
WO 94/05069 March 1994 WO
WO 96/01456 January 1996 WO
WO 96/06747 March 1996 WO
WO 96/28846 September 1996 WO
WO 97/01103 January 1997 WO
WO 97/44652 November 1997 WO
WO 98/04910 February 1998 WO
WO 98/21132 May 1998 WO
WO 98/58270 December 1998 WO
WO 99/23738 May 1999 WO
WO 99/56121 November 1999 WO
WO 00/16083 March 2000 WO
WO 00/62049 October 2000 WO
WO 00/67359 November 2000 WO
WO 01/59443 February 2001 WO
WO 01/16614 March 2001 WO
WO 01/16615 March 2001 WO
WO 01/51947 July 2001 WO
WO 03/047064 June 2003 WO
WO 03/076960 September 2003 WO
WO 2004/047215 June 2004 WO
WO 2010/007681 January 2010 WO
WO 2011/153419 December 2011 WO
Other references
  • Search Report and Written Opinion from PCT Application No. PCT/US2011/026608, dated Aug. 29, 2011, 9 pgs.
  • Search Report and Written Opinion from PCT Application No. PCT/US2011/038279, dated Sep. 16, 2011. 12 pgs.
  • “Electrochemical Impedance Spectroscopy in Battery Development and Testing”, Batteries International, Apr. 1997, pp. 59 and 62-63.
  • “Battery Impedance”, by E. Willihnganz et al., Electrical Engineering, Sep. 1959, pp. 922-925.
  • “Determining the End of Battery Life”, by S. DeBardelaben, IEEE, 1986, pp. 365-368.
  • “A Look at the Impedance of a Cell”, by S. Debardelaben, IEEE, 1988, pp. 394-397.
  • “The Impedance of Electrical Storage Cells”, by N. A. Hampson et al., Journal of Applied Electrochemistry,1980, pp. 3-11.
  • “A Package for Impedance/Admittance Data Analysis”, by B. Boukamp, Solid State Ionics, 1986, pp. 136-140.
  • “Precision of Impedance Spectroscopy Estimates of Bulk, Reaction Rate, and Diffusion Parameters”, by J. Macdonald et al., J. Electroanal, Chem., 1991, pp. 1-11.
  • Internal Resistance: Harbinger of Capacity Loss in Starved Electrolyte Sealed Lead Acid Batteries, by Vaccaro, F. J. et al., AT&T Bell Laboratories, 1987 IEEE, Ch. 2477, pp. 128, 131.
  • IEEE Recommended Practice for Maintenance, Testings, and Replacement of Large Lead Storage Batteries for Generating Stations and Substations, The Institute of Electrical and Electronics Engineers, Inc., ANSI/IEEE Std. 450-1987, Mar. 9, 1987, pp. 7-15.
  • “Field and Laboratory Studies to Assess the State of Health of Valve-Regulated Lead Acid Batteries: Part I Conductance/Capacity Correlation Studies”, by D. Feder et al., IEEE , Aug. 1992, pp. 218-233.
  • “JIS Japanese Industrial Standard-Lead Acid Batteries for Automobiles”, Japanese Standards Association UDC, 621.355.2:629.113.006, Nov. 1995.
  • “Performance of Dry Cells”, by C. Hambuechen, Preprint of Am. Electrochem. Soc., Apr. 18-20, 1912, paper No. 19, pp. 1-5.
  • “A Bridge for Measuring Storage Battery Resistance”, by E. Willihncanz, The Electrochemical Society, preprint 79-20, Apr. 1941, pp. 253-258.
  • National Semiconductor Corporation, “High Q Notch Filter”, Mar. 1969, Linear Brief 5, Mar. 1969.
  • Burr-Brown Corporation, “Design a 60 Hz Notch Filter with the UAF42”, Jan. 1994, AB-071, 1994.
  • National Semiconductor Corporation, “LMF90-4th-Order Elliptic Notch Filter”, Dec. 1994, RRD-B30M115, Dec. 1994.
  • “Alligator Clips with Wire Penetrators” J.S. Popper, Inc. product information, downloaded from http://www.jspopper.com/, prior to Oct. 1, 2002.
  • “#12 LM78S40 Simple Switcher DC to DC Converter”, ITM e-Catalog, downloaded from http://www.pcbcafe.com, prior to Oct. 1, 2002.
  • “Simple DC-DC Converts Allows Use of Single Battery”, Electronix Express, downloaded from http://www.elexp.com/tdc-dc.htm, prior to Oct. 1, 2002.
  • “DC-DC Converter Basics”, Power Designers, downloaded from http://www.powederdesigners.com/InforWeb.designcenter/articles/DC-DC/converter.shtm, prior to Oct. 1, 2002.
  • “Notification of Transmittal of the International Search Report or the Declaration”, PCT/US02/29461, filed Sep. 17, 2002 and mailed Jan. 3, 2003.
  • “Notification of Transmittal of the International Search Report or the Declaration”, PCT/US03/07546, filed Mar. 13, 2003 and mailed Jul. 4, 2001.
  • “Notification of Transmittal of the International Search Report or the Declaration”, PCT/US03/06577, filed Mar. 5, 2003 and mailed Aug. 24, 2003.
  • “Notification of Transmittal of the International Search Report or the Declaration”, PCT/US03/07837, filed Mar. 14, 2003 and mailed Jul. 4, 2003.
  • “Improved Impedance Spectroscopy Technique for Status Determination of Production Li/SO2 Batteries” Terrill Atwater et al., pp. 10-113, (1992).
  • “Notification of Transmittal of the International Search Report or the Declaration”, PCT/US03/41561; Search Report completed Apr. 13, 2004, mailed May 6, 2004.
  • “Notification of Transmittal of the International Search Report or the Declaration”, PCT/US03/27696, filed Sep. 4, 2003 and mailed Apr. 15, 2004.
  • “Programming Training Course, 62-000 Series Smart Engine Analyzer”, Testproducts Division, Kalamazoo, Michigan, pp. 1-207, (1984).
  • “Operators Manual, Modular Computer Analyzer Model MCA 3000”, Sun Electric Corporation, Crystal Lake, Illinois, pp. 1-1-14-13, (1991).
  • Supplementary European Search Report Communication for Appl. No. 99917402.2; Sep. 7, 2004.
  • “Dynamic modelling of lead/acid batteries using impedance spectroscopy for parameter identification”, Journal of Power Sources, pp. 69-84, (1997).
  • Notification of Transmittal of the International Search Report for PCT/US03/30707, filed Sep. 30, 2003 and mailed Nov. 24, 2004.
  • “A review of impedance measurements for determination of the state-of-charge or state-of-health of secondary batteries”, Journal of Power Sources, pp. 59-69, (1998).
  • “Search Report Under Section 17” for Great Britain Application No. GB0421447.4, date of search Jan. 27, 2005, date of document Jan. 28, 2005.
  • “Results of Discrete Frequency Immittance Spectroscopy (DFIS) Measurements of Lead Acid Batteries”, by K.S. Champlin et al., Proceedings of 23rd International Teleco Conference (INTELEC), published Oct. 2001, IEE, pp. 433-440.
  • “Examination Report” from the UK Patent Office for App. No. 0417678.0; Jan. 24, 2005.
  • Wikipedia Online Encyclopedia, INDUCTANCE, 2005, http://en.wikipedia.org/wiki/inductance, pp. 1-5, mutual Inductance, pp. 3,4.
  • “Professional. BCS System Analyzer Battery-Charger-Starting”, pp. 2-8, (2001).
  • Young Illustrated Encyclopedia Dictionary of Electronics, 1981, Parker Publishing Company, Inc., pp. 318-319.
  • “DSP Applications in Hybrid Electric Vehicle Powertrain”, Miller et al., Proceedings of the American Control Conference, Sand Diego, CA, Jun. 1999; 2 ppg.
  • “Notification of Transmittal of the International Search Report and the Written Opinion of the International Searching Authority, or the Declaration” for PCT/US2008/008702 filed Jul. 2008; 15 pages.
  • “A Microprocessor-Based Control System for a Near-Term Electric Vehicle”, Bimal K. Bose; IEEE Transactions on Industry Applications, vol. IA-17, No. 6, Nov./Dec. 1981; 0093-9994/81/1100-0626$00.75 © 1981 IEEE, 6 pages.
  • U.S. Appl. No. 60/387,912, filed Jun. 13, 2002 which is related to U.S. Pat. No. 7,089,127.
  • “Conductance Testing Compared to Traditional Methods of Evaluating the Capacity of Valve-Regulated Lead-Acid Batteries and Predicting State-of-Health”, by D. Feder et al., May 1992, pp. 1-8; (13 total pgs.).
  • “Field and Laboratory Studies to Assess the State of Health of Valve-Regulated Lead Acid Batteries: Part I—Conductance/Capacity Correlation Studies”, by D. Feder at al., Oct. 1992, pp. 1-15; (19 total pgs.).
  • “Field Application of Conductance Measurements Use to Ascertain Cell/Battery and Inter-Cell Connection State-of-Health in Electric Power Utility Applications”, by M. Hlavac et al., Apr. 1993, pp. 1-14; (19 total pgs.).
  • “Conductance Testing of Standby Batteries in Signaling and Communications Applications for the Purpose of Evaluating Battery State-of-Health”, by S. McShane, Apr. 1993, pp. 1-9; (14 total pgs.).
  • “Condutance Monitoring of Recombination Lead Acid Batteries”, by B. Jones, May 1993, pp. 1-6; (11 total pgs.).
  • “Evaluating the State-of-Health of Lead Acid Flooded and Valve-Regulated Batteries: A Comparison of Conductance Testing vs. Traditional Methods”, by M. Hlavac et al., Jun. 1993, pp. 1-15; (20 total pgs.).
  • “Updated State of Conductance/Capacity Correlation Studies to Determine the State-of-Health of Automotive SLI and Standby Lead Acid Batteries”, by D. Feder et al., Sep. 1993, pp. 1-17; (22 total pgs.).
  • “Field and Laboratory Studies to Access the State-of-Health of Valve-Regulated Lead-Acid Battery Technologies Using Conductance Testing Part II—Further Conductance/Capacity Correlation Studies”, by M. Hlavac et al., Sep. 1993, pp. 1-9; (14 total pgs.).
  • “Field Experience of Testing VRLA Batteries by Measuring Conductance”, by M.W. Kniveton, May 1994, pp. 1-4; (9 total pgs.).
  • “Reducing the Cost of Maintaining VRLA Batteries in Telecom Applications”, by M.W. Kniveton, Sep. 1994, pp. 1-5; (10 total pgs.).
  • “Analysis and Interpretation of Conductance Measurements used to Access the State-of-Health of Valve Regulated Lead Acid Batteries Part III: Analytical Techniques”, by M. Hlavac, Nov. 1994, 9 pgs; (13 total pgs.).
  • “Testing 24 Volt Aircraft Batteries Using Midtronics Conductance Technology”, by M. Hlavac et al., Jan. 1995, 9 pgs; (13 total pgs.).
  • “VRLA Battery Monitoring Using Conductance Technology Part IV: On-Line State-of-Health Monitoring and Thermal Runaway Detection/Prevention”, by M. Hlavac et al., Oct. 1995, 9 pgs; (13 total pgs.).
  • “VRLA Battery Conductance Monitoring Part V: Strategies for VRLA Battery Testing and Monitoring in Telecom Operating Environments”, by M. Hlavac et al., Oct. 1996, 9 pgs; (13 total pgs.).
  • “Midpoint Conductance Technology Used in Telecommunication Stationary Standby Battery Applications Part VI: Considerations for Deployment of Midpoint Conductance in Telecommunications Power Applications”, by M. Troy et al., Oct. 1997, 9 pgs; (13 total pgs.).
  • “Impedance/Conductance Measurements as an Aid to Determining Replacement Strategies”, M. Kniveton, Sep. 1998, pp. 297-301; (9 total pgs.).
  • “A Fundamentally New Approach to Battery Performance Analysis Using DFRA™/DTIS™ Technology”, by K. Champlin et al., Sep. 2000, 8 pgs; (12 total pgs.).
  • “Battery State of Health Monitoring, Combining Conductance Technology With Other Measurement Parameters for Real-Time Battery Performance Analysis”, by D. Cox et la., Mar. 2000, 6 pgs; (10 total pgs.).
  • Examination Report under section 18(3) for corresponding Great Britain Application No. GB1000773.0, dated Feb. 6, 2012, 2 pages.
  • Communication from GB1216105.5, dated Sep. 21, 2012.
  • Notification of Transmittal of the International Search Report and Written Opinion from PCT/US2011/039043, dated Jul. 26, 2012.
  • Notification of Transmittal of the International Search Report and Written Opinion from PCT/US2011/053886, dated Jul. 27, 2012.
  • “Field Evaluation of Honda's EV PLUS Battery Packs”, by A. Paryani, IEEE AES Systems Magazine, Nov. 2000, pp. 21-24.
  • Office Actions from corresponding U.S. Appl. No. 12/261,336, dated 5/35/11 and Nov. 2, 2010.
  • Office Actions from corresponding U.S. Appl. No. 11/641,594 dated Mar. 22, 2013; Dec. 10, 2012; Sep. 6, 2011; Oct. 29, 2010; May 24, 2010; Mar. 5, 2010; Sep. 15, 2009; Jun. 1, 2009; Dec. 11, 2008; Aug. 25, 2008; and Feb. 28, 2008.
  • Office Actions from corresponding U.S. Appl. No. 10/656,526 dated Mar. 10, 2006; Sep. 22, 2005; Apr. 4, 2005; and Oct. 5, 2004.
  • Search Report from PCT/US2011/047354, dated Nov. 11, 2011.
  • Written Opinion from PCT/US2011/047354, dated Nov. 11, 2011.
  • First Office Action (Notification of Reasons for Rejections) dated Dec. 3, 2013 in related Japanese patent application No. 2013-513370, 9 pgs. Including English Translation.
  • Official Action dated Jan. 22, 2014 in Korean patent application No. 10-2012-7033020, 2 pgs including English Translation.
  • Official Action dated Feb. 20, 2014 in Korean patent application No. 10-2013-7004814, 6 pgs including English Translation.
  • First Office Action for Chinese Patent Application No. 201180011597.4, dated May 6, 2014, 20 pages.
  • Office Action from Korean Application No. 10/2012-7033020, dated Jul. 29, 2014.
  • Office Action for Chinese Patent Application No. 201180038844.X, dated Jul. 1, 2014.
  • Office Action for Chinese Patent Application No. 201180030045.8, dated Jul. 21, 2014.
  • Office Action for German Patent Application No. 1120111030643 dated Aug. 28, 2014.
  • Office Action from Japanese Patent Application No. 2013-513370, dated Aug. 5, 2014.
  • Office Action from Japanese Patent Application No. 2013-531839, dated Jul. 8, 2014.
  • Office Action for German Patent Application No. 103 32 625.1, dated Nov. 7, 2014, 14 pages.
  • Office Action from Chinese Patent Application No. 201180038844.X, dated Dec. 8, 2014.
  • Office Action from CN Application No. 201180011597.4, dated Jan. 6, 2015.
  • Office Action for Chinese Patent Application no. 201180030045.8, dated Mar. 24, 2015.
  • Office Action for Japanese Patent Application No. 2013-531839, dated Mar. 31, 2015.
  • Notification of Transmittal of the International Search Report and Written Opinion from PCT/US2014/069661, dated Mar. 26, 2015.
  • Office Action for Chinese Patent Application No. 201180038844.X, dated Jun. 8, 2015.
  • Office Action from Chinese Patent Application No. 201180011597.4 dated Jun. 3, 2015.
  • European Search Report from European Application No. EP 15151426.2, dated Jun. 1, 2015.
Patent History
Patent number: 9255955
Type: Grant
Filed: May 2, 2011
Date of Patent: Feb 9, 2016
Patent Publication Number: 20110265025
Assignee: Midtronics, Inc. (Willowbrook, IL)
Inventor: Kevin I. Bertness (Batavia, IL)
Primary Examiner: Jermele M Hollington
Assistant Examiner: Christopher McAndrew
Application Number: 13/098,661
Classifications
Current U.S. Class: Pivoted Straightedge And Sliding Nonpivoted (33/472)
International Classification: G01N 27/416 (20060101); G01R 31/00 (20060101); G01R 31/02 (20060101);