Multi-channel spectrometer

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Description

FIG. 1 is a front view of the first embodiment of a multi-channel spectrometer;

FIG. 2 is a rear view of the multi-channel spectrometer depicted in FIG. 1;

FIG. 3 is a left side view of the multi-channel spectrometer depicted in FIG. 1;

FIG. 4 is a right side view of the multi-channel spectrometer depicted in FIG. 1;

FIG. 5 is a top view of the multi-channel spectrometer depicted in FIG. 1;

FIG. 6 is a bottom view of the multi-channel spectrometer depicted in FIG. 1;

FIG. 7 is a perspective view of the multi-channel spectrometer depicted in FIG. 1;

FIG. 8 is a reference view in use state of the multi-channel spectrometer depicted in FIG. 1 with an arm open;

FIG. 9 is another reference view in use state of the multi-channel spectrometer depicted in FIG. 1 with a tube rack;

FIG. 10 is a front view of the second embodiment of a multi-channel spectrometer;

FIG. 11 is a rear view of the multi-channel spectrometer depicted in FIG. 10;

FIG. 12 is a left side view of the multi-channel spectrometer depicted in FIG. 10;

FIG. 13 is a right side view of the multi-channel spectrometer depicted in FIG. 10;

FIG. 14 is a top view of the multi-channel spectrometer depicted in FIG. 10;

FIG. 15 is a bottom view of the multi-channel spectrometer depicted in FIG. 10;

FIG. 16 is a perspective view of the multi-channel spectrometer depicted in FIG. 10; and,

FIG. 17 is a reference view in use state the multi-channel spectrometer depicted in FIG. 10 with an arm open.

Claims

The ornamental design for a multi-channel spectrometer, as shown and described.

Referenced Cited
U.S. Patent Documents
6414311 July 2, 2002 Wood
D841500 February 26, 2019 Kang
D864772 October 29, 2019 Jablonski
10866138 December 15, 2020 Kamikake
D999078 September 19, 2023 Andreas
Patent History
Patent number: D1019440
Type: Grant
Filed: Mar 16, 2022
Date of Patent: Mar 26, 2024
Assignee: THERMO FISHER SCIENTIFIC (SHANGHAI) INSTRUMENTS CO., LTD. (Shanghai)
Inventors: Michael Jablonski (Madison, WI), Gang Shao (Shanghai)
Primary Examiner: Antoine Duval Davis
Application Number: 29/830,960