Coating thickness measurement gauge

- DeFelsko Corporation
Description

FIG. 1 is a front elevational view of a coating thickness measurement gauge showing my new design;

FIG. 2 is a rear elevational view;

FIG. 3 is a right side elevational view;

FIG. 4 is a left side elevational view;

FIG. 5 is a top plan view; and,

FIG. 6 is a bottom plan view thereof.

Referenced Cited
U.S. Patent Documents
D254778 April 22, 1980 Kitada et al.
D292493 October 27, 1987 King
D316825 May 14, 1991 Becker
2384529 September 1945 Breitenstein
2651846 September 1953 Rodge
4226620 October 7, 1980 Rothwarf et al.
5097423 March 17, 1992 Badinger
Patent History
Patent number: D331201
Type: Grant
Filed: Oct 26, 1990
Date of Patent: Nov 24, 1992
Assignee: DeFelsko Corporation (Ogdensburg, NY)
Inventor: Frank J. Koch (Ogdensburg, NY)
Primary Examiner: Donald P. Walsh
Assistant Examiner: Antoine D. Davis
Law Firm: Burns, Doane, Swecker & Mathis
Application Number: 7/604,426