Electronic measurement instrument

- Tektronix, Inc.
Description

FIG. 1 is a front elevation view of an electronic measurement instrument showing our new design;

FIG. 2 is a bottom side elevation view thereof;

FIG. 3 is a back side elevation view thereof;

FIG. 4 is a top side elevation view thereof;

FIG. 5 is a left side elevation view thereof; and,

FIG. 6 is a right side elevation view thereof.

The broken line showings are for illustrative purposes only and forms no part of the claimed design.

Referenced Cited
U.S. Patent Documents
D293556 January 5, 1988 Klojcnik
D300306 March 21, 1989 Arnoux et al.
D311345 October 16, 1990 Brown
D323893 February 11, 1992 Arioka
D332833 January 26, 1993 Lauks et al.
D345112 March 15, 1994 Krishnamurthy et al.
D352251 November 8, 1994 Ketterer et al.
4034291 July 5, 1977 Allen et al.
5237327 August 17, 1993 Saitoh et al.
Other references
  • Tek View by Tektronix, TekView, vol. 10, No. 2, "Focus on TekTools" article is 12 pages total. Mar. 1994.
Patent History
Patent number: D366432
Type: Grant
Filed: Mar 3, 1995
Date of Patent: Jan 23, 1996
Assignee: Tektronix, Inc. (Wilsonville, OR)
Inventors: Jerry L. Wrisley (Beaverton, OR), Keith W. Kirkwood (Portland, OR), David T. Rosette (Tigard, OR)
Primary Examiner: Antoine Duval Davis
Attorneys: William K. Bucher, Boulden G. Griffith
Application Number: 0/35,666