Anatomical probe attachment
Latest Sensor Devices, Inc. Patents:
Description
FIG. 1 is a top view of an anatomical probe attachment showing a new design in accordance with our invention;
FIG. 2 is a side view thereof;
FIG. 3 is a bottom view thereof; and,
FIG. 4 is an end view thereof, the opposite side being a mirror image thereof.
Referenced Cited
U.S. Patent Documents
D143424 | February 1946 | McFadden |
D336517 | June 15, 1993 | McKeown |
D353457 | December 13, 1994 | Nicholas et al. |
D371200 | June 25, 1996 | Maurer et al. |
3734094 | May 1973 | Calinog |
4090518 | May 23, 1978 | Elam |
4574807 | March 11, 1986 | Hewson et al. |
4640298 | February 3, 1987 | Pless et al. |
4967759 | November 6, 1990 | Teves |
4981470 | January 1, 1991 | Bombeck |
5005573 | April 9, 1991 | Buchanan |
5125905 | June 30, 1992 | Wright et al. |
5325746 | July 5, 1994 | Anderson |
5357954 | October 25, 1994 | Shigezawa et al. |
5364351 | November 15, 1994 | Heinzelman et al. |
Patent History
Patent number: D387862
Type: Grant
Filed: Oct 20, 1995
Date of Patent: Dec 16, 1997
Assignee: Sensor Devices, Inc. (Waukesha, WI)
Inventors: Louis M. Mainiero (Delafield, WI), John L. Atlee, III (Hartland, WI)
Primary Examiner: Louis S. Zarfas
Assistant Examiner: Frank Martinez
Law Firm: Snell & Wilmer L.L.P.
Application Number: 0/46,670
Type: Grant
Filed: Oct 20, 1995
Date of Patent: Dec 16, 1997
Assignee: Sensor Devices, Inc. (Waukesha, WI)
Inventors: Louis M. Mainiero (Delafield, WI), John L. Atlee, III (Hartland, WI)
Primary Examiner: Louis S. Zarfas
Assistant Examiner: Frank Martinez
Law Firm: Snell & Wilmer L.L.P.
Application Number: 0/46,670
Classifications