Multimeter
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Description
FIG. 1 is a perspective view of an alternative embodiment of a multimeter showing our new design;
FIG. 2 is a front elevational view of the alternative embodiment thereof;
FIG. 3 is a first side view of the alternative embodiment thereof;
FIG. 4 is a rear view of the alternative embodiment thereof;
FIG. 5 is a bottom view of the alternative embodiment thereof; and,
FIG. 6 is a top view of the alternative embodiment thereof.
The broken line showing is for illustrative purposes only and forms no part of the claimed design.
Referenced Cited
U.S. Patent Documents
D280299 | August 27, 1985 | Nelson |
D282532 | February 11, 1986 | Brown |
D313563 | January 8, 1991 | Mieczkowski et al. |
D314715 | February 19, 1991 | Nelson et al. |
D332227 | January 5, 1993 | Kaneko |
D355138 | February 7, 1995 | Hoofnagle et al. |
D358348 | May 16, 1995 | Burgess |
D359006 | June 6, 1995 | McCain et al. |
D374631 | October 15, 1996 | Whittaker |
D381280 | July 22, 1997 | Tomiyama et al. |
Patent History
Patent number: D396818
Type: Grant
Filed: May 22, 1997
Date of Patent: Aug 11, 1998
Assignee: Wavetek Corporation (San Diego, CA)
Inventor: Christopher Anzalone (Foothill Ranch, CA)
Primary Examiner: Antoine Duval Davis
Law Firm: Baker & McKenzie
Application Number: 0/71,169
Type: Grant
Filed: May 22, 1997
Date of Patent: Aug 11, 1998
Assignee: Wavetek Corporation (San Diego, CA)
Inventor: Christopher Anzalone (Foothill Ranch, CA)
Primary Examiner: Antoine Duval Davis
Law Firm: Baker & McKenzie
Application Number: 0/71,169
Classifications