Clamp-on current probe
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Description
FIG. 1 is a perspective view of the clamp-on current probe according to our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a bottom plan view thereof;
FIG. 6 is a left side elevational view thereof, as seen from the left side of FIG. 2; and,
FIG. 7 is a right side elevational view thereof.
Referenced Cited
Patent History
Patent number: D401874
Type: Grant
Filed: Oct 16, 1996
Date of Patent: Dec 1, 1998
Assignee: Societe Chauvin Arnoux (Paris)
Inventors: Daniel Arnoux (Paris), Axel Arnoux (Paris)
Primary Examiner: Antoine Duval Davis
Attorney: John L. Welch, Esq.
Application Number: 0/61,105
Type: Grant
Filed: Oct 16, 1996
Date of Patent: Dec 1, 1998
Assignee: Societe Chauvin Arnoux (Paris)
Inventors: Daniel Arnoux (Paris), Axel Arnoux (Paris)
Primary Examiner: Antoine Duval Davis
Attorney: John L. Welch, Esq.
Application Number: 0/61,105
Classifications