Measurement instrument housing
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The ornamental design disclosed in this application is for a measurement instrument housing having a rectangular protrusion extending from a portion of a curved rear surface.
FIG. 1 is a perspective view of a measurement instrument housing;
FIG. 2 is a front elevation view of the measurement instrument housing;
FIG. 3 is a top plan view of the measurement instrument housing;
FIG. 4 is a bottom plan view of the measurement instrument housing;
FIG. 5 is a left side elevation view of the measurement instrument housing;
FIG. 6 is a right side elevation view of the measurement instrument housing; and,
FIG. 7 is a rear elevation view of the measurement instrument housing.
Claims
The ornamental design of a measurement instrument housing, as shown and described.
Type: Grant
Filed: Dec 20, 2001
Date of Patent: Mar 25, 2003
Assignee: Tektronix, Inc. (Beaverton, OR)
Inventors: Jerry L. Wrisley (Beaverton, OR), James H. Mc Grath, Jr. (Aloha, OR), Kevin C. Ayers (Beaverton, OR)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: William K. Bucher
Application Number: 29/152,697