Measurement instrument housing

- Tektronix, Inc.
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Description

The ornamental design disclosed in this application is for a measurement instrument housing having a rectangular protrusion extending from a portion of a curved rear surface.

FIG. 1 is a perspective view of a measurement instrument housing;

FIG. 2 is a front elevation view of the measurement instrument housing;

FIG. 3 is a top plan view of the measurement instrument housing;

FIG. 4 is a bottom plan view of the measurement instrument housing;

FIG. 5 is a left side elevation view of the measurement instrument housing;

FIG. 6 is a right side elevation view of the measurement instrument housing; and,

FIG. 7 is a rear elevation view of the measurement instrument housing.

Claims

The ornamental design of a measurement instrument housing, as shown and described.

Referenced Cited
U.S. Patent Documents
4972138 November 20, 1990 Bush
4977514 December 11, 1990 Bush
5003248 March 26, 1991 Johnson
5247287 September 21, 1993 Jonker et al.
D413823 September 14, 1999 Dobyns et al.
Patent History
Patent number: D472171
Type: Grant
Filed: Dec 20, 2001
Date of Patent: Mar 25, 2003
Assignee: Tektronix, Inc. (Beaverton, OR)
Inventors: Jerry L. Wrisley (Beaverton, OR), James H. Mc Grath, Jr. (Aloha, OR), Kevin C. Ayers (Beaverton, OR)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: William K. Bucher
Application Number: 29/152,697
Classifications
Current U.S. Class: Oscilloscope Or Oscillograph (D10/76)
International Classification: 1004;