Microscope

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Description

FIG. 1 is a perspective view of a microscope showing our new design;

FIG. 2 is a second perspective view of FIG. 1 showing the telescoping nature of the eyepiece;

FIG. 3 is a top plan view of FIG. 1;

FIG. 4 is a bottom plan view of FIG. 1;

FIG. 5 is a right side elevational view of FIG. 1;

FIG. 6 is a left side elevational view of FIG. 1;

FIG. 7 is a first end elevational view of FIG. 1; and,

FIG. 8 is a second end elevational view of FIG. 1.

The dotted lines are intended to show features that are environmental only and form no part of the claimed design. All surface lines are merely intended to illustrate the contour of the surfaces represented.

Claims

The ornamental design for a microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
D311924 November 6, 1990 Loyd et al.
D331934 December 22, 1992 Tak
D349295 August 2, 1994 Weidemann
D349907 August 23, 1994 Allmendinger
D371786 July 16, 1996 Maeyama
D418853 January 11, 2000 Kubota
D433430 November 7, 2000 Meinzer
D523886 June 27, 2006 Wen et al.
D528143 September 12, 2006 Walter et al.
D537459 February 27, 2007 Yip et al.
D539317 March 27, 2007 Tonhofer
7221402 May 22, 2007 Cheng
Patent History
Patent number: D564553
Type: Grant
Filed: Aug 10, 2006
Date of Patent: Mar 18, 2008
Assignee: Leading Extreme Optimist Industries, Ltd. (Chai Wan)
Inventors: Gin Fai Yip (North Point), Bryan Yip (Kowloon)
Primary Examiner: Paula A. Greene
Attorney: Carmody & Torrance LLP
Application Number: 29/264,470
Classifications
Current U.S. Class: Microscope (D16/131)