Specimen cutting apparatus

- Seiko Instruments Inc.
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Description

FIG. 1 is a perspective view of the top, front and right side of a specimen cutting apparatus showing our new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a right side view thereof; and,

FIG. 8 is a perspective reference view with the lid in open condition thereof.

The broken lines shown in the interior of specimen cutting apparatus in FIG. 8 are included for the purpose of illustrating portions of the specimen cutting apparatus that form no part of the claimed design.

Claims

The ornamental design for a specimen cutting apparatus, as shown and described.

Referenced Cited
U.S. Patent Documents
D245352 August 9, 1977 Moran
D319307 August 20, 1991 Sakagami et al.
D320073 September 17, 1991 Sakagami et al.
D320443 October 1, 1991 Yokoyama et al.
D333007 February 2, 1993 LaBarbera
D338962 August 31, 1993 Ikegami et al.
D346027 April 12, 1994 Kobayashi
D349861 August 23, 1994 Kanewske et al.
D369564 May 7, 1996 Whitby et al.
D404816 January 26, 1999 Tsuan
D410080 May 18, 1999 Heidsiek et al.
D512155 November 29, 2005 Matsumoto
Patent History
Patent number: D598567
Type: Grant
Filed: Nov 18, 2008
Date of Patent: Aug 18, 2009
Assignee: Seiko Instruments Inc. (Chiba)
Inventors: Masabumi Tsukuda (Chiba), Takeshi Kobayashi (Chiba)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Mark Cavanna
Attorney: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
Application Number: 29/328,091
Classifications
Current U.S. Class: Work Station Or Surface (68) (D24/234)