Specimen analyzer
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Description
The broken lines in the drawing views are included for the purpose of illustrating portions of the specimen analyzer that form no part of the claimed design.
Claims
I claim the ornamental design for a specimen analyzer, as shown and described.
Referenced Cited
U.S. Patent Documents
4039286 | August 2, 1977 | Keller et al. |
D280662 | September 17, 1985 | Bartfay et al. |
D328794 | August 18, 1992 | Frenkel et al. |
D404140 | January 12, 1999 | Meguro |
D482796 | November 25, 2003 | Oyama et al. |
D588276 | March 10, 2009 | Isozaki et al. |
7678331 | March 16, 2010 | Shanafelter |
D637098 | May 3, 2011 | Oonuma et al. |
20090269841 | October 29, 2009 | Wojciechowski et al. |
20090325299 | December 31, 2009 | Hamada et al. |
20100210019 | August 19, 2010 | Kurono et al. |
Patent History
Patent number: D657067
Type: Grant
Filed: Dec 28, 2010
Date of Patent: Apr 3, 2012
Assignee: Sysmex Corporation (Kobe)
Inventor: Fumie Shibata (Tokyo)
Primary Examiner: Anhdao Doan
Attorney: Brinks Hofer Gilson & Lione
Application Number: 29/382,021
Type: Grant
Filed: Dec 28, 2010
Date of Patent: Apr 3, 2012
Assignee: Sysmex Corporation (Kobe)
Inventor: Fumie Shibata (Tokyo)
Primary Examiner: Anhdao Doan
Attorney: Brinks Hofer Gilson & Lione
Application Number: 29/382,021
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)