Sample rack

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Description

FIG. 1 is a front, top and left side perspective view of a sample rack showing our new design;

FIG. 2 is a rear, bottom and left side perspective view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a left side elevational view thereof;

FIG. 8 is a right side elevational view thereof; and,

FIG. 9 is an enlarged view of the portion shown in BOX 9 in FIG. 5 thereof.

The broken lines are included for the purpose of illustrating unclaimed portions of the sample rack that form no part of the claimed design.

Claims

We claim the ornamental design for a sample rack, as shown and described.

Patent History
Patent number: D674507
Type: Grant
Filed: Oct 30, 2008
Date of Patent: Jan 15, 2013
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Kouichi Suzuki (Hitachinaka), Nobuo Suzuki (Hitachinaka), Seiji Nomura (Tokai), Takeshi Setomaru (Hitachinaka)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Mark Cavanna
Application Number: 29/309,872