Sample rack
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Description
The broken lines are included for the purpose of illustrating unclaimed portions of the sample rack that form no part of the claimed design.
Claims
We claim the ornamental design for a sample rack, as shown and described.
Patent History
Patent number: D674507
Type: Grant
Filed: Oct 30, 2008
Date of Patent: Jan 15, 2013
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Kouichi Suzuki (Hitachinaka), Nobuo Suzuki (Hitachinaka), Seiji Nomura (Tokai), Takeshi Setomaru (Hitachinaka)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Mark Cavanna
Application Number: 29/309,872
Type: Grant
Filed: Oct 30, 2008
Date of Patent: Jan 15, 2013
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Kouichi Suzuki (Hitachinaka), Nobuo Suzuki (Hitachinaka), Seiji Nomura (Tokai), Takeshi Setomaru (Hitachinaka)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Mark Cavanna
Application Number: 29/309,872
Classifications