Analysis system
- Cepheid
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Description
The portions shown in broken lines form no part of the claimed design.
Claims
The ornamental design for an analysis system, as shown and described.
Referenced Cited
Patent History
Patent number: D690023
Type: Grant
Filed: Feb 3, 2012
Date of Patent: Sep 17, 2013
Assignee: Cepheid (Sunnyvale, CA)
Inventors: Ron Chang (Sunnyvale, CA), Steven M. Montgomery (Sunnyvale, CA), Gregory E. Mote (Sunnyvale, CA)
Primary Examiner: Anhdao Doan
Application Number: 29/412,457
Type: Grant
Filed: Feb 3, 2012
Date of Patent: Sep 17, 2013
Assignee: Cepheid (Sunnyvale, CA)
Inventors: Ron Chang (Sunnyvale, CA), Steven M. Montgomery (Sunnyvale, CA), Gregory E. Mote (Sunnyvale, CA)
Primary Examiner: Anhdao Doan
Application Number: 29/412,457
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)