Probe card case

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Description

FIG. 1 is a front view of a probe card case illustrating our new design;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a right side view thereof;

FIG. 7 is a sectional view taken along line A-A of FIG. 1;

FIG. 8 is a sectional view taken along line B-B of FIG. 1;

FIG. 9 is a sectional view taken along line C-C of FIG. 1;

FIG. 10 is a sectional view taken along line D-D of FIG. 1; and,

FIG. 11 is a reference perspective view thereof.

Claims

The ornamental design for probe card case, as shown and described.

Referenced Cited
U.S. Patent Documents
5608335 March 4, 1997 Tailliet
D436594 January 23, 2001 Ling
6344754 February 5, 2002 Tamai
D485560 January 20, 2004 Dearborn et al.
6788082 September 7, 2004 Hirao
D501664 February 8, 2005 Minamio et al.
6914586 July 5, 2005 Burkhardt
7307440 December 11, 2007 Miller et al.
D608362 January 19, 2010 Barron et al.
D694242 November 26, 2013 Cho
D714789 October 7, 2014 Chen et al.
D717800 November 18, 2014 Akana et al.
D735726 August 4, 2015 Chen
Patent History
Patent number: D751555
Type: Grant
Filed: Sep 3, 2013
Date of Patent: Mar 15, 2016
Assignee: JAPAN ELECTRONIC MATERIALS CORP. (Amagasaki)
Inventors: Chikaomi Mori (Amagasaki), Takashi Amemiya (Nirasaki)
Primary Examiner: Austin Murphy
Application Number: 29/465,883
Classifications
Current U.S. Class: Element Or Attachment (D14/432)