Diagnostic circuit test device

- Power Probe TEK, LLC
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Description

FIG. 1 is a top, front, right side perspective view of the diagnostic circuit test device of the present invention;

FIG. 2 is a left side elevation view, the right side elevation view being a mirror image;

FIG. 3 is a front elevation view;

FIG. 4 is a rear elevation view;

FIG. 5 is a top plan view; and,

FIG. 6 is a bottom plan view.

The broken lines of the bottom surface shown in the drawings views are included for the purpose of illustrating environmental structure and form no part of the claimed invention.

Claims

The ornamental design for an diagnostic circuit test device, as shown and described.

Referenced Cited
U.S. Patent Documents
D343801 February 1, 1994 Burns
D345117 March 15, 1994 Pacetti
D584648 January 13, 2009 Sekiguchi
Patent History
Patent number: D753002
Type: Grant
Filed: Jan 14, 2015
Date of Patent: Apr 5, 2016
Assignee: Power Probe TEK, LLC (Brea, CA)
Inventor: Wayne Russell (Ontario, CA)
Primary Examiner: Antoine D Davis
Application Number: 29/514,629
Classifications
Current U.S. Class: Provided With Handle, Or Hand-held (D10/78)