Probe pin
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Description
The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design. The dot-dash broken lines in the figures show boundaries of the claimed design.
Claims
The ornamental design for a probe pin, as shown and described.
Referenced Cited
Patent History
Patent number: D792255
Type: Grant
Filed: May 4, 2016
Date of Patent: Jul 18, 2017
Assignee: OMRON Corporation (Kyoto-shi)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama), Makoto Kondo (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/563,347
Type: Grant
Filed: May 4, 2016
Date of Patent: Jul 18, 2017
Assignee: OMRON Corporation (Kyoto-shi)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama), Makoto Kondo (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/563,347
Classifications