Probe pin
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Description
The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design. The dot-dash broken lines in the figures show boundaries of the claimed design.
Claims
The ornamental design for a probe pin, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
3193765 | July 1965 | Bevins |
5447450 | September 5, 1995 | Woodward |
- U.S. Appl. No. 29/563,349, filed May 4, 2016; Teranishi et al.
- U.S. Appl. No. 29/563,351, filed May 4, 2016; Teranishi et al.
Patent History
Patent number: D794480
Type: Grant
Filed: May 4, 2016
Date of Patent: Aug 15, 2017
Assignee: OMRON Corporation (Kyoto-shi)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama), Makoto Kondo (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/563,354
Type: Grant
Filed: May 4, 2016
Date of Patent: Aug 15, 2017
Assignee: OMRON Corporation (Kyoto-shi)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama), Makoto Kondo (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/563,354
Classifications
Current U.S. Class:
Element Or Attachment (4) (D10/80)