Surveying instrument

- TOPCON CORPORATION
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Description

FIG. 1 is a front view of the surveying instrument showing our new design;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a perspective view thereof;

FIG. 8 is a perspective view thereof;

FIG. 9 is an enlarged view of a display screen of the surveying instrument in FIG. 1;

FIG. 10 is a front view of another embodiment thereof;

FIG. 11 is a rear view thereof;

FIG. 12 is a top plan view thereof;

FIG. 13 is a bottom view thereof;

FIG. 14 is a right side view thereof;

FIG. 15 is a left side view thereof;

FIG. 16 is a perspective view thereof;

FIG. 17 is a perspective view thereof; and,

FIG. 18 is an enlarged view of a display screen of the surveying instrument in FIG. 10.

The broken line showing is for the purpose of illustrating environmental structure and forms no part of the claimed the design.

Claims

The ornamental design for a surveying instrument, as shown and described.

Referenced Cited
U.S. Patent Documents
D431199 September 26, 2000 Bennett
D447066 August 28, 2001 Takayama
D780130 February 28, 2017 Kashimoto
D781730 March 21, 2017 Ishii
Patent History
Patent number: D795720
Type: Grant
Filed: Mar 14, 2016
Date of Patent: Aug 29, 2017
Assignee: TOPCON CORPORATION (Tokyo)
Inventors: Mitsuo Ishii (Tokyo), Kazuhiro Morita (Tokyo)
Primary Examiner: Antoine D Davis
Application Number: 29/557,953