Socket for electronic device testing apparatus

- ADVANTEST CORPORATION
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Description

FIG. 1 is a front view of a socket for electronic testing apparatus showing our new design;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a top perspective view thereof;

FIG. 8 is a bottom perspective view thereof;

FIG. 9 is a cross-sectional view taken along line 9-9 of FIG. 3;

FIG. 10 is a cross-sectional view taken along line 10-10 of FIG. 3;

FIG. 11 is an enlarged portion view taken along line 11-11 of FIG. 9; and,

FIG. 12 is an enlarged portion view taken along line 12-12 of FIG. 10.

The even dashed broken lines shown in the drawings represent portions of the socket for an electronic testing apparatus, that form no part of the claimed design.

The dashed-dot line shown on the top and bottom of the socket for an electronic testing apparatus represents the boundary line between the claimed and unclaimed surface areas.

The outer boarder of the center broken line circles in FIG. 8 that form no part of the claimed design, show the step in FIGS. 11 and 12.

Claims

The ornamental design for a socket for an electronic device testing apparatus, as shown and described.

Referenced Cited
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Other references
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Patent History
Patent number: D819581
Type: Grant
Filed: Apr 21, 2017
Date of Patent: Jun 5, 2018
Assignee: ADVANTEST CORPORATION (Tokyo)
Inventors: Takeshi Okushi (Tokyo), Mitsunori Aizawa (Tokyo), Masanori Nagashima (Saitama), Takashi Kawashima (Tokyo)
Primary Examiner: Elizabeth J Oswecki
Application Number: 29/601,371