Probe pin
Latest Kabushiki Kaisha Nihon Micronics Patents:
- Electrical connecting device
- Optical probe, optical probe array, optical probe card, and method of manufacturing optical probe
- Measurement system and measurement method
- Inspection apparatus having a contactor for inspecting electrical characteristics of an object, a contactor tip position adjusting unit, and a position adjusting method therefor
- Connecting device for inspection
The broken lines shown in the figures represent portions of the probe pin that form no part of the claimed design. The line-dot broken lines indicate boundary lines between the claimed portions and the disclaimed portions, and are for illustration only and form no part of the claimed design.
Claims
The ornamental design for a probe pin, as shown and described.
5127916 | July 7, 1992 | Spencer |
D496728 | September 28, 2004 | Holsinger |
D611596 | March 9, 2010 | Kousai |
D627064 | November 9, 2010 | Appelbaum |
D696796 | December 31, 2013 | Macura |
D710495 | August 5, 2014 | Wu |
9069012 | June 30, 2015 | Yano |
D752213 | March 22, 2016 | Paul |
D755965 | May 10, 2016 | Kawahara |
D765602 | September 6, 2016 | Nasu |
D766187 | September 13, 2016 | Nasu |
D766188 | September 13, 2016 | Nasu |
D770985 | November 8, 2016 | Nasu |
D770986 | November 8, 2016 | Nasu |
D776552 | January 17, 2017 | Teranishi |
D777916 | January 31, 2017 | Kuroda |
D791311 | July 4, 2017 | Yantz |
20160118738 | April 28, 2016 | Nasu |
20160146884 | May 26, 2016 | Nasu |
20160146885 | May 26, 2016 | Ando |
20170082656 | March 23, 2017 | Chen |
20170097376 | April 6, 2017 | Chou |
20170192036 | July 6, 2017 | Tsai |
20180340960 | November 29, 2018 | Yamamoto et al. |
Type: Grant
Filed: Aug 30, 2017
Date of Patent: May 7, 2019
Assignee: Kabushiki Kaisha Nihon Micronics (Musashino-shi, Tokyo)
Inventor: Mika Nasu (Tokyo)
Primary Examiner: Cathron C Brooks
Assistant Examiner: Samantha Q Lawrence
Application Number: 29/615,737