Probe pin

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Description

FIG. 1 is a perspective view of a probe pin, showing the claimed design;

FIG. 2 is a front view of the probe pin;

FIG. 3 is a rear view of the probe pin;

FIG. 4 is a left side view of the probe pin;

FIG. 5 is a right side view of the probe pin;

FIG. 6 is a top plan view of the probe pin;

FIG. 7 is a bottom plan view of the probe pin;

FIG. 8 is an enlarged left side view of the probe pin; and,

FIG. 9 is an enlarged view of the section of the probe pin as indicated in FIG. 2.

The broken lines shown in the figures represent portions of the probe pin that form no part of the claimed design. The line-dot broken lines indicate boundary lines between the claimed portions and the disclaimed portions, and are for illustration only and form no part of the claimed design.

Claims

The ornamental design for a probe pin, as shown and described.

Referenced Cited
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Patent History
Patent number: D847757
Type: Grant
Filed: Aug 30, 2017
Date of Patent: May 7, 2019
Assignee: Kabushiki Kaisha Nihon Micronics (Musashino-shi, Tokyo)
Inventor: Mika Nasu (Tokyo)
Primary Examiner: Cathron C Brooks
Assistant Examiner: Samantha Q Lawrence
Application Number: 29/615,737
Classifications
Current U.S. Class: Element Or Attachment (D13/154)