Stress test chamber
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The broken lines depict portions of the stress test chamber in which the design is embodied that are not considered part of the claimed design.
The dash-dot-dash lines represent the boundary of the claim and form no part of the claimed design.
Claims
The ornamental design for a stress test chamber, as shown and described.
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Type: Grant
Filed: Mar 6, 2018
Date of Patent: May 5, 2020
Assignee: ESPEC CORP. (Osaka-Shi, Osaka)
Inventors: Osamu Matsuguma (Osaka), Yasushi Watanabe (Osaka)
Primary Examiner: Anhdao Doan
Application Number: 29/639,350