Stress test chamber

- ESPEC CORP.
Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a partially enlarged perspective view of a stress test chamber;

FIG. 2 is a front view thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a top view thereof;

FIG. 6 is a partially enlarged front view thereof;

FIG. 7 is a partially enlarged left side view thereof;

FIG. 8 is a partially enlarged right side view thereof;

FIG. 9 is a partially enlarged top view thereof; and,

FIG. 10 is enlarged cross-sectional view taken along line 10-10 in FIG. 2 thereof.

The broken lines depict portions of the stress test chamber in which the design is embodied that are not considered part of the claimed design.

The dash-dot-dash lines represent the boundary of the claim and form no part of the claimed design.

Claims

The ornamental design for a stress test chamber, as shown and described.

Referenced Cited
U.S. Patent Documents
D202486 October 1965 Salvia
D234640 March 1975 Zagara
D247308 February 21, 1978 Truette
D264123 April 27, 1982 Brendgord
4592896 June 3, 1986 Runnells
D297361 August 23, 1988 Yamamoto
D297564 September 6, 1988 Yamamoto
D328352 July 28, 1992 Futatsuka
6360621 March 26, 2002 Eldred
D681845 May 7, 2013 Matsuguma
D734181 July 14, 2015 Matsuguma
20140150574 June 5, 2014 Matsuguma
20150090053 April 2, 2015 Matsuguma
Foreign Patent Documents
D1007442 April 1998 JP
D1007442-1 June 1999 JP
Patent History
Patent number: D883514
Type: Grant
Filed: Mar 6, 2018
Date of Patent: May 5, 2020
Assignee: ESPEC CORP. (Osaka-Shi, Osaka)
Inventors: Osamu Matsuguma (Osaka), Yasushi Watanabe (Osaka)
Primary Examiner: Anhdao Doan
Application Number: 29/639,350