Testing instrument
Latest KOKUSAI KEISOKUKI KABUSHIKI KAISHA Patents:
The broken lines depict either (i) enlargement areas that form no part of the claimed design, or (ii) parts of the testing device that form no part of the claimed design.
Claims
The ornamental design for a testing instrument, as shown and described.
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Type: Grant
Filed: Dec 28, 2018
Date of Patent: Sep 1, 2020
Assignee: KOKUSAI KEISOKUKI KABUSHIKI KAISHA (Tokyo)
Inventors: Sigeru Matsumoto (Tokyo), Hiroshi Miyashita (Tokyo), Kazuhiro Murauchi (Tokyo), Shuichi Tokita (Kanagawa)
Primary Examiner: Antoine Duval Davis
Application Number: 29/675,077