Testing instrument

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Description

FIG. 1 is a front elevational view of the testing device of the design;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a left-side elevational view thereof;

FIG. 6 is a right-side elevational view thereof;

FIG. 7 is a front, right-side, top perspective view thereof;

FIG. 8 is rear, left-side, top perspective view thereof;

FIG. 9 is an enlargement of area 9 in FIG. 1;

FIG. 10 is an enlargement of area 10 in FIG. 2;

FIG. 11 is an enlargement of area 11 in FIG. 3;

FIG. 12 is an enlarged left-side elevational view thereof;

FIG. 13 is a right-side elevational view thereof;

FIG. 14 is an enlargement of area 14 in FIG. 7; and,

FIG. 15 is an enlargement of area 15 in FIG. 8.

The broken lines depict either (i) enlargement areas that form no part of the claimed design, or (ii) parts of the testing device that form no part of the claimed design.

Claims

The ornamental design for a testing instrument, as shown and described.

Referenced Cited
U.S. Patent Documents
9927347 March 27, 2018 LoPresti
Foreign Patent Documents
2002-116119 April 2002 JP
4150351 September 2008 JP
4198610 December 2008 JP
5243166 July 2013 JP
2014-20807 February 2014 JP
5999977 September 2016 JP
6076620 February 2017 JP
Patent History
Patent number: D894766
Type: Grant
Filed: Dec 28, 2018
Date of Patent: Sep 1, 2020
Assignee: KOKUSAI KEISOKUKI KABUSHIKI KAISHA (Tokyo)
Inventors: Sigeru Matsumoto (Tokyo), Hiroshi Miyashita (Tokyo), Kazuhiro Murauchi (Tokyo), Shuichi Tokita (Kanagawa)
Primary Examiner: Antoine Duval Davis
Application Number: 29/675,077
Classifications
Current U.S. Class: Specific Gravity (8) (D10/84)