Tip for integrated circuit test pin
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The features shown in broken line depict environmental subject matter only and form no part of the claimed design.
Claims
The ornamental design for a tip for integrated circuit test pin, as shown and described.
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Type: Grant
Filed: Jul 12, 2019
Date of Patent: Feb 1, 2022
Assignee: JOHNSTECH INTERNATIONAL CORPORATION (Minneapolis, MN)
Inventor: John Nelson (Brooklyn Park, MN)
Primary Examiner: Antoine Duval Davis
Application Number: 29/697,992