Aperture plate of vacuum chamber for an electron microscope

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Description

FIG. 1 is a top perspective view of an aperture plate of vacuum chamber for an electron microscope showing my new design;

FIG. 2 is a bottom perspective view thereof;

FIG. 3 is a front elevational view thereof, the rear, left and right side elevational views being mirror images thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof; and,

FIG. 6 is a perspective view of the aperture plate of vacuum chamber for an electron microscope in a condition of use.

The broken lines showing of the aperture plate of vacuum chamber for an electron microscope is for the purpose of illustration portions of the article and forms no part of the claimed design.

Claims

The ornamental design for an aperture plate of vacuum chamber for an electron microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
D692475 October 29, 2013 Hasuda
D723084 February 24, 2015 Awazu
D745591 December 15, 2015 Oh
D810174 February 13, 2018 Clark
D882843 April 28, 2020 Kaiser
D899486 October 20, 2020 Tamura
D900194 October 27, 2020 Tamura
D900197 October 27, 2020 Tamura
D915488 April 6, 2021 Shimasaki
D918285 May 4, 2021 Nagaoka
20200350300 November 5, 2020 Jang
Patent History
Patent number: D959531
Type: Grant
Filed: Dec 10, 2020
Date of Patent: Aug 2, 2022
Assignee: CHAINSEM TECHNOLOGY CORPORATION (Taoyuan)
Inventor: Chen-Chin Chiu (Taoyuan)
Primary Examiner: Richard Kearney
Assistant Examiner: Benjamin M Weeks
Application Number: 29/761,610
Classifications
Current U.S. Class: Element Or Attachment (D16/136)