Aperture plate of vacuum chamber for an electron microscope
The broken lines showing of the aperture plate of vacuum chamber for an electron microscope is for the purpose of illustration portions of the article and forms no part of the claimed design.
Claims
The ornamental design for an aperture plate of vacuum chamber for an electron microscope, as shown and described.
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Type: Grant
Filed: Dec 10, 2020
Date of Patent: Aug 2, 2022
Assignee: CHAINSEM TECHNOLOGY CORPORATION (Taoyuan)
Inventor: Chen-Chin Chiu (Taoyuan)
Primary Examiner: Richard Kearney
Assistant Examiner: Benjamin M Weeks
Application Number: 29/761,610