Probe for electromyograph
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Description
The broken lines depict parts of the probe that form no part of the claimed design.
Claims
The ornamental design for a probe for electromyograph, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
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Patent History
Patent number: D962455
Type: Grant
Filed: Sep 22, 2020
Date of Patent: Aug 30, 2022
Assignee: SOFKEN CO., LTD. (Shiroi)
Inventors: Takeo Komamura (Shiroi), Kenzo Komamura (Shiroi)
Primary Examiner: Wan Laymon
Application Number: 29/751,501
Type: Grant
Filed: Sep 22, 2020
Date of Patent: Aug 30, 2022
Assignee: SOFKEN CO., LTD. (Shiroi)
Inventors: Takeo Komamura (Shiroi), Kenzo Komamura (Shiroi)
Primary Examiner: Wan Laymon
Application Number: 29/751,501
Classifications