Switch
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Description
The dashed broken lines in the figures show portions of the switch that form no part of the claimed design.
Claims
The ornamental design for a switch, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
D214450 | June 1969 | Clarke |
3767022 | October 1973 | Olson |
4230922 | October 28, 1980 | Habecker |
7235754 | June 26, 2007 | Rochon |
D692395 | October 29, 2013 | Takahashi |
8916784 | December 23, 2014 | Chuang |
D743917 | November 24, 2015 | Muramoto |
D761211 | July 12, 2016 | Muramoto |
10796860 | October 6, 2020 | Iliev |
11349282 | May 31, 2022 | Park |
20130256104 | October 3, 2013 | Fujita |
20150041294 | February 12, 2015 | Lee |
20220328264 | October 13, 2022 | Fujita |
- Panasonic, Date: Jan. 2021, [online], [site visited Nov. 17, 2022]. Available from internet, URL: https://na.industrial.panasonic.com/products/electromechanical/switches/lineup/seal-type-snap-action-switches/series/142441 (Year: 2021).
- E-Weekly, Date: Oct. 11, 2022, [online], [site visited Nov. 17, 2022]. Available from internet, URL: https://www.electronicsweekly.com/news/products/emech-enclosures/bent-lead-actuator-adds-flexibility-to-tiny-sealed-switches-2022-10/ (Year: 2022).
Patent History
Patent number: D980171
Type: Grant
Filed: Sep 6, 2021
Date of Patent: Mar 7, 2023
Assignee: OMRON Corporation (Kyoto)
Inventors: Hiroyuki Fujita (Okayama), Kenji Shinohara (Nagaokakyo), Hiroto Yonehara (Okayama)
Primary Examiner: Shawn T Gingrich
Assistant Examiner: Bryan N. Melvin
Application Number: 29/806,695
Type: Grant
Filed: Sep 6, 2021
Date of Patent: Mar 7, 2023
Assignee: OMRON Corporation (Kyoto)
Inventors: Hiroyuki Fujita (Okayama), Kenji Shinohara (Nagaokakyo), Hiroto Yonehara (Okayama)
Primary Examiner: Shawn T Gingrich
Assistant Examiner: Bryan N. Melvin
Application Number: 29/806,695
Classifications