Probe for testing device under test
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The broken lines depict portions of the probe and form no part of the claimed design. The dash-dot-dash lines depict boundaries between claimed portion and unclaimed portion of the probe and form no part of the claimed design.
Claims
The ornamental design for a probe for testing a device under test, as shown and described.
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Type: Grant
Filed: May 28, 2021
Date of Patent: Apr 18, 2023
Assignee: MPI CORPORATION (Chu-pei)
Inventors: Tzu-Yang Chen (Chu-pei), Che-Wei Lin (Chu-pei), Chen-Rui Wu (Chu-pei)
Primary Examiner: Antoine Duval Davis
Application Number: 29/786,073