Semiconductor memory device having a test mode setting circuit

Mar 30, 1993 - Mitsubishi Denki Kabushiki Kaisha

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Randomly accessible visual information recording medium and recording method, and reproducing device and reproducing method
RANDOMLY ACCESSIBLE VISUAL INFORMATION RECORDING MEDIUM AND RECORDING METHOD, AND REPRODUCING DEVICE AND REPRODUCING METHOD
Randomly accessible visual information recording medium and recording method, and reproducing device and reproducing method
RANDOMLY ACCESSIBLE VISUAL INFORMATION RECORDING MEDIUM AND RECORDING METHOD, AND REPRODUCING DEVICE AND REPRODUCING METHOD
SOLAR CELL PANEL

Claims

Referenced Cited

U.S. Patent Documents

RE34290	June 22, 1993	Tobita
4055754	October 25, 1977	Chesley
4464750	August 7, 1984	Tatematsu
4541090	September 10, 1985	Shiragasawa
4654827	March 31, 1987	Childers
4672582	June 9, 1987	Nishimura et al.
4683382	July 28, 1987	Sakurai et al.
4727517	February 23, 1988	Ueno et al.
4771407	September 13, 1988	Takamae et al.
4802137	January 31, 1989	Okuda et al.
4843257	June 27, 1989	Ohsawa
4860259	August 22, 1989	Tobita
4879690	November 7, 1989	Anami et al.

Foreign Patent Documents

3639169A1	November 1986	DEX
60-103587	June 1985	JPX
60-176121	September 1985	JPX
60-50065	November 1985	JPX
61-26154	June 1986	JPX
62-192998	August 1987	JPX

Patent History

Patent number: RE35645
Type: Grant
Filed: Mar 30, 1993
Date of Patent: Oct 28, 1997
Assignee: Mitsubishi Denki Kabushiki Kaisha (Tokyo)
Inventor: Yoichi Tobita (Itami)
Primary Examiner: Robert W. Beausoliel, Jr.
Assistant Examiner: Phung M. Chung
Law Firm: Lowe, Price, LeBlanc & Becker
Application Number: 8/39,660

Classifications

Current U.S. Class: 371/211; 371/214; Testing (365/201)
International Classification: G11C 2900;